Electric device testing apparatus and electric device testing method

• US 6,437,593 B1
• Filed: 02/09/2000
• Issued: 08/20/2002
• Est. Priority Date: 02/22/1999
• Status: Expired due to Fees

• Current Assignee: Advantest Corporation
• Original Assignee: Advantest Corporation
• Inventors: Ito, Akihiko, Kobayashi, Yoshihito
• Primary Examiner(s): Sherry, Michael J.
• Assistant Examiner(s): KOBERT, RUSSELL MARC
• Application Number:
  US09/500,486
• Time in Patent Office: 923 Days
• Field of Search: 324/754, 324/755, 324/757, 324/758, 324/765, 340/870.17
• US Class Current: 324/750.03
• CPC Class Codes: G01R 31/2874 related to temperature

Abstract

An electric device testing apparatus for carrying out a test by pushing a terminal of an IC against a contact portion of a test head, comprising a temperature calculation means for calculating an actual temperature of the IC based on a signal from a temperature sensing element provided on the IC.

Claims

1. An electric device testing apparatus for carrying out a test by pushing a terminal of an electric device to be tested against a contact portion of a test head, comprising:

an applying temperature control means for controlling an applying temperature to the electric device to be tested;

a temperature storing means for storing data related to an actual temperature of the electric device to be tested under a test conditions obtained in advance on an experimental basis; and

an applying temperature sending means for sending data relating to the actual temperature of the electric device to be tested stored in the temperature storing means to the applying temperature control means at the time of sending a test signal;

wherein the applying temperature control means controls an applying temperature to the electric device to be tested based on the data relating to the actual temperature of the electric device to be tested sent from the applying temperature sending means.

2. The electric device testing apparatus as set forth in claim 1, wherein the temperature storing means and the applying temperature sending means are provided to a tester for carrying out the test on the electric device to be tested by sending the test signal to the contact portion.

3. The electric device testing apparatus as set forth in claim 2, wherein the data relating to the actual temperature sent from the applying temperature sending means to the applying temperature control means are included in an operation instruction program to a handler for handling the electric device to be tested from the tester.