Method for conducting sensor array-based rapid materials characterization

• US 6,438,497 B1
• Filed: 12/11/1998
• Issued: 08/20/2002
• Est. Priority Date: 12/11/1998
• Status: Expired due to Fees

• Current Assignee: Freeslate Inc. (Unchained Labs Inc.)
• Original Assignee: Symyx Technologies Incorporated (Dassault Systemes SA)
• Inventors: Bennett, James, Mansky, Paul
• Primary Examiner(s): WACHSMAN, HAL D
• Application Number:
  US09/210,086
• Time in Patent Office: 1,348 Days
• Field of Search: 702/22-24, 702/27, 702/28, 702/56, 702/30-32, 702/33-36, 702/40, 702/57, 702/64, 702/65, 702/81-84, 702/99, 702/104, 702/113-119, 702/124, 702/126, 702/130, 702/136, 702/132-134, 702/138, 702/183, 702/184, 702/189, 702/FOR.170, 702/FOR.171, 702/FOR.134, 702/FOR.135, 702/FOR.137, 702/FOR.142, 702/FOR.143, 702/FOR-115, 702/FOR-123, 702/FOR-103, 700/109, 700/110, 700/117-121, 700/123, 700/266, 700/269, 700/275, 700/278, 700/299-301, 422/70, 422/89, 422/68.1, 422/88, 422/98, 422/50, 422/83, 422/90, 422/82.01, 422/82.12, 422/82.13, 422/82.05, 422/82.02, 422/82.03, 422/82.06, 422/61, 422/62, 422/67, 422/69, 422/81, 422/82.04, 422/76, 422/77, 422/51, 422/82.11, 324/663, 324/685, 324/687, 324/688, 324/425, 324/234, 324/236, 324/717, 324/693, 324/259-261, 324/207.2, 324/251, 324/262, 324/263, 324/117.H, 436/149, 436/150, 436/806, 436/151, 436/157, 436/43, 435/287.1, 435/287.9, 435/288.7, 338/34, 338/307, 338/334, 338/32.R, 338/32.H, 438/14, 438/16-18, 438/7, 438/10, 438/11, 374/45, 374/50, 374/56, 374/142, 374/31, 374/32, 374/117, 374/10, 374/11, 427/2.13, 427/8, 427/10, 210/656, 210/662, 210/198.2, 210/198.3, 257/252-254, 216/84-87, 205/775, 205/776.5, 205/787, 205/782.5, 73/310.5, 73/310.6, 73/615.2, 73/232.2, 73/233.9, 73/615.3, 735/79, 73/234, 73/234.1, 73/233.6, 73/240.6, 73/230.5, 73/616.2, 735/84, 738/63, 738/630.1, 738/631.1, 738/631.2, 738/632.1, 738/66, 73D/IG.3, 204/400, 204/401, 204/403, 204/406-410, 204/416, 204/298.11, 432/37, 219/497
• US Class Current: 702/22
• CPC Class Codes: B01J 19/0046 Sequential or parallel reactions, e.g. for the synthesis of polypeptides or polynucleotides; Apparatus and devices for combinatorial chemistry or for making molecular arrays synthesis methods per se C40B50/00
• CPC Class Codes: B01J 2219/00605 the compounds being directly bound or immobilised to solid supports
• CPC Class Codes: B01J 2219/00612 the surface being inorganic
• CPC Class Codes: B01J 2219/00621 by physical means, e.g. trenches, raised areas
• CPC Class Codes: B01J 2219/00637 by coating it with another layer
• CPC Class Codes: B01J 2219/00653 the compounds being bound to electrodes embedded in or on the solid supports
• CPC Class Codes: B01J 2219/00659 Two-dimensional arrays
• CPC Class Codes: B01J 2219/00707 separated from the reactor apparatus
• CPC Class Codes: B01J 2219/00745 Inorganic compounds
• CPC Class Codes: B01J 2219/00747 Catalysts
• CPC Class Codes: C40B 30/08 by measuring catalytic activity
• CPC Class Codes: C40B 40/18 Libraries containing only inorganic compounds or inorganic materials
• CPC Class Codes: G01N 25/005 by investigating specific heat
• CPC Class Codes: G01N 25/18 by investigating thermal conductivity by calorimetry G01N25/20; by measuring change of resistance of an electrically-heated body G01N27/18

Abstract

A method for characterizing one or more material properties for each of five (5) or more samples, comprising the steps of depositing five or more samples on a substrate having 5 or more sensors arranged in a sensor array, wherein each sensor supports at least one sample of five or more samples and characterizes at least one material property of the sample supported thereby and measures at least one material property of the five or more samples at a rate of at least one sample every 2 minutes.

Claims

1. A method for characterizing one or more material properties for each of 5 or more samples, comprising the steps of:

depositing said 5 or more samples on a substrate having 5 or more sensors arranged in a sensor array, wherein each sample is supported by one of said 5 or more sensors and each sensor of said 5 or more sensors characterize at least one material property of said 5 or more samples; and

measuring at least one material property of said 5, or more samples at a rate of at least 1 sample every 2 minutes, wherein said measuring step includes the steps of;

electronically transmitting an input signal comprising a combination of a linear ramp signal and a modulated alternating current (AC) signal superimposed on the linear ramp signal to at least one sensor of said 5 or more sensors for inputting power into at least one sample supported by said at least one sensor of said 5 or more sensors; and

monitoring an output signal corresponding to the temperature change of each of said 5 or more samples in response to the input signal, wherein said monitoring step includes monitoring a modulation amplitude in said output signal and an average value of said output signal;

wherein at least one sensor in the sensor array has a heater portion and a thermometer portion, said combined linear ramp signal and modulated AC signal is transmitted from an electronic circuitry through said heater portion, a direct current (DC) signal is transmitted from said electronic circuitry through said thermometer portion, and wherein the modulation amplitude in the output signal is determinative of the heat capacity of each of said 5 or more samples and the average value of the output signal corresponds with an average temperature of each said 5 or more samples.

2. The method of claim 1, wherein said at least one material property characterized in the measuring step is a thermal property selected from the group comprising of heat capacity, specific heat, thermal conductivity and thermal decomposition.

3. A method for characterizing one or more material properties for each of 5 or more samples, comprising the steps of:

depositing 5 or more samples on a substrate having 5 or more sensors arranged in a sensor array, wherein each sensor supports at least one sample of said 5 or more samples and characterizes at least one material property of said at least one supported sample;

measuring at least one material property of said 5 or more samples at a rate of at least one sample every 2 minutes;

transmitting an input signal electronically to at least one sensor of said 5 or more sensors for inputting power into one sample of said 5 or more samples on said at least one sensor of said 5 or more sensors; and

monitoring an output signal corresponding to the temperature change of each of said 5 or more samples in response to said input signal,

wherein said transmitting step includes transmitting said input signal from electronic circuitry that inputs power to each of said 5 or more samples and wherein said monitoring step monitors the output signal from said each sensor of said 5 or more sensors to detect an increase in a modulation amplitude and monitors the temperature at which the increase of the modulation amplitude occurs, which corresponds to a loss of mass in each of said 5 or more samples.

4. A method for characterizing one or more mechanical properties for each of 5 or more samples, comprising the steps of:

depositing said 5 or more samples on a substrate having 5 or more sensors arranged in a sensor array, wherein each sensor supports at least one sample of said 5 or more samples and characterizes at least one mechanical property of said at least one supported sample, at least one sensor in the sensor array being a mechanical resonator, and said depositing step includes depositing a sample material on the mechanical resonator; and

measuring at least one mechanical property of said 5 or more samples at a rate of at least one sample every 2 minutes, wherein said measuring step includes the steps of;

placing said sensor array in a magnetic field; and

generating a resonance signal in the mechanical resonator;

measuring an amount of damping in the resonance signal,

wherein

said damping amount is determinative of the response of at least one sample of said 5 or more samples to said magnetic field.

5. A method for characterizing one or more electrical transport properties for each of 5 or more samples, comprising the steps of:

depositing said 5 or more samples on a substrate having 5 or more sensors arranged in a sensor array, wherein each sensor supports at least one sample of said 5 or more samples and characterizes at least one electrical transport property of said at least one supported sample;

measuring at least one electrical transport property of said 5 or more samples at a rate of at least one sample every 2 minutes;

heating or cooling one portion of said at least one supported sample;

determining a first temperature at a first portion of said at least one supported sample and a second temperature at a second portion of said at least one supported sample; and

measuring a voltage difference and a temperature difference across said at least one supported sample, wherein the voltage difference and the temperature difference is determinative of the thermopower of said at least one supported sample.

6. A method for characterizing one or more magnetic properties for each of 5 or more samples, comprising the steps of:

depositing the 5 or more samples on a substrate having 5 or more sensors arranged in a sensor array, wherein each sensor supports at least one sample of said 5 or more samples and characterizes at least one magnetic property of said at least one supported sample, at least one sensor in the sensor array being a Hall effect sensor;

measuring at least one material property of said 5 or more samples at a rate of at least one sample every 2 minutes, wherein said measuring step comprises the steps of;

placing the sensor array in a magnetic field;

measuring a response of said at least one Hall effect sensor; and

comparing the response of said at least one Hall effect sensor containing a sample with a reference Hall effect sensor that does not contain a sample deposited thereon.

7. A method for characterizing one or more thermal properties for each of 5 or more samples, comprising the steps of:

providing a substrate having disposed thereon 5 or more sensors forming a sensor array, wherein the sensors in the sensor array are temperature sensors deposited on a top surface of said substrate having predetermined thermal conductivity;

depositing said 5 or more samples on said sensor array forming an array of samples on said sensor array, wherein each sensor of said 5 or more sensors is associated with at least one sample of said array of samples and characterizes at least one thermal property of said associated at least one sample; and

measuring at least one thermal property of said 5 or more samples at a rate of at least 1 sample every 2 minutes, wherein said at least one thermal property characterized in said measuring step is selected from the group consisting of heat capacity, specific heat, thermal conductivity and thermal decompositions, said measuring step further including the steps of;

heating a first portion of said substrate; and

measuring a temperature difference between the first portion and a

second portion of the substrate, wherein said temperature difference corresponds to a heat capacity of each of said 5 or more samples.

8. A method for characterizing one or more material properties for each of 5 or more samples, comprising the steps of:

depositing 5 or more samples on a substrate having 5 or more sensors arranged in a sensor array, wherein each sensor is associated with one of said 5 or more samples and characterizes at least one material property of said one of said 5 or more samples; and

measuring at least one material property of said 5 or more samples at a rate of at least 1 sample every 2 minutes, wherein said at least one material property characterized is a thermal property selected from the group consisting of heat capacity, specific heat, thermal conductivity and thermal decomposition, and wherein the measuring step further comprises the steps of;

transmitting an input signal to at least one sensor for inputting power into the sample on the sensor; and

monitoring an output signal corresponding to the samples temperature change in response to the input signal;

providing a sensor including a first heater portion, a second heater portion and one thermometer portion, wherein a direct current (DC) heating signal is transmitted to said first heater portion and an alternating current (AC) heating signal is transmitted to said second heater portion; and

transmitting a DC signal to said sensor for stimulating said thermometer portion, wherein said DC signal received from said thermometer is indicative of the temperature of each of said 5 or more samples and an AC signal received from the thermometer is indicative of a thermal property of each sample of said 5 or more samples.