Coherent x-ray scatter inspection system with sidescatter and energy-resolved detection

• US 6,442,233 B1
• Filed: 08/11/2000
• Issued: 08/27/2002
• Est. Priority Date: 06/18/1998
• Status: Expired due to Term

• Current Assignee: American Science and Engineering Incorporated (OSI Systems Incorporated)
• Original Assignee: American Science and Engineering Incorporated (OSI Systems Incorporated)
• Inventors: Grodzins, Lee, Rothschild, Peter, Adams, William
• Primary Examiner(s): Kim, Robert H.
• Assistant Examiner(s): Ho, Allen C.
• Application Number:
  US09/637,755
• Time in Patent Office: 746 Days
• Field of Search: 378/51, 378/56, 378/57, 378/70, 378/71, 378/73, 378/86, 378/90, 378/207, 378/88
• US Class Current: 378/57
• CPC Class Codes: G01N 23/201 by measuring small-angle scattering
• CPC Class Codes: G01V 5/22 Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
• CPC Class Codes: G01V 5/222 measuring scattered radiation

Abstract

A system and method for inspecting an enclosure. A beam of x-rays is used for scanning the enclosure and for identifying areas of suspect material. The beam is subsequently coherently scattered off suspect materials, during the course of a single pass of the enclosure past the beam, for uniquely discriminating innocuous from contraband substances. One or more energy dispersive detectors measure radiation coherently scattered by an identified volume of suspect material. Absorption effects of the energy distribution of the coherently scattered radiation are compensated by means of a fiducial reference disposed between the interrogated object and the detectors.

Claims

1. An inspection system for inspecting an enclosure, the system comprising:

a. a source for producing a pencil beam of penetrating radiation;

b. a substantially inertia-free scanner for scanning the pencil beam through successive positions with respect to the enclosure;

c. at least one detector for generating a signal based on at least one of penetrating radiation transmitted through the enclosure and penetrating radiation scattered by the enclosure;

d. a processor for identifying positions warranting scrutiny on the basis of the signal from the at least one detector and a set of specified conditions;

e. at least one Bragg detector for determining an energy spectrum as a function of angular distribution of coherent scattering of the pencil beam from an identified volume within the enclosure; and

f. a controller for determining a crystal spacing of the suspected object from the angular distribution of the energy spectrum of the coherent scattering.

2. An inspection system according to claim 1, wherein the beam of penetrating radiation is an x-ray beam.

3. An inspection system according to claim 1, wherein the at least one Bragg detector is a multi-element solid-state detector.

4. An inspection system according to claim 1, wherein the at least one Bragg detector is an energy dispersive detector.

5. An inspection system according to claim 1, further including a fiducial material disposed in the beam posterior to the enclosure with respect to the source for correcting spectral distortions due to wavelength-dependent absorption of the beam of penetrating radiation.

6. An inspection system according to claim 1, further including a fiducial material interposed in the beam between the enclosure and at least one of the at least one detector for correcting spectral distortions due to wavelength-dependent absorption of the beam of penetrating radiation.

7. An inspection system according to claim 1, wherein the scanner comprises:

a. an electron beam deflector for scanning a position of an electron beam with respect to an x-ray emissive anode; and

b. a perforated absorbing shield disposed between the x-ray emissive anode and the enclosure for permitting emission of penetrating radiation at a single emission angle determined by the position of the electron beam.

8. An inspection system according to claim 7, wherein the scanner is configured such that a beam of x-rays is emitted in a direction substantially perpendicular to the anode.

9. An inspection system according to claim 7 wherein the electron beam deflector includes at least one of a magnetic control yoke and an array of electrical deflector plates.

10. An inspection system according to claim 1, further including a translator for positioning the at least one Bragg detector in response to identification by the processor of positions meeting a specified criterion for scrutiny.

15. An inspection system according to claim 1, wherein the at least one Bragg detector is a multi-element solid-state detector.

11. An inspection system for characterizing an object contained within an enclosure, the system comprising:

a. a source for producing a beam of penetrating radiation;

b. a scanner for scanning the beam through successive positions with respect to the enclosure;

c. a set of detectors disposed along a direction substantially parallel to the beam, the set of detectors generating a sidescatter signal based on penetrating radiation sidescattered by the object;

d. a controller for identifying a position of a suspected object based at least in part upon the sidescatter signal;

e. at least one Bragg detector for measuring an energy spectrum of coherent scattering as a function of angular distribution from the position of the suspected object; and

f. a controller for determining a crystal spacing of the suspected object from the angular distribution of the energy spectrum of the coherent scattering.

12. An inspection system according to claim 11, wherein the beam of penetrating radiation has a specified beam profile.

13. An inspection system according to claim 11, wherein the beam of penetrating radiation is a pencil beam.

14. An inspection system according to claim 11, wherein the beam of penetrating radiation is an x-ray beam.

16. An inspection system according to claim 11, wherein the at least one Bragg detector is an energy-dispersive detector.

17. An inspection system according to claim 11, further including a fiducial material disposed in the beam posterior to the enclosure with respect to the source for correcting spectral distortions due to wavelength-dependent absorption of the beam of penetrating radiation.

18. An inspection system according to claim 11, further including a fiducial material interposed in the beam between the enclosure and at least one of the at least one detector for correcting spectral distortions due to wavelength-dependent absorption of the beam of penetrating radiation.

19. An inspection system according to claim 11, wherein the scanner comprises:

a. an electron beam deflector for scanning a position of an electron beam with respect to an x-ray emissive anode; and

b. a perforated absorbing shield disposed between the x-ray emissive anode and the enclosure for permitting emission of penetrating radiation at a single emission angle determined by the position of the electron beam.

20. An inspection system for characterizing an object contained within an enclosure, the system comprising:

a. a source for producing a beam of penetrating radiation,

b. a scanner for scanning the beam through successive positions with respect to the enclosure;

c. a set of detectors disposed along a direction substantially parallel to the beam, the set of detectors generating a sidescatter signal based on penetrating radiation sidescattered by the object;

d. a controller for identifying a position of a suspected object based at least in part upon the sidescatter signal; and

e. a plurality of Bragg detectors disposed along a direction substantially transverse to the beam for measuring an angular distribution of coherently scattered penetrating radiation.

21. An inspection system according to claim 20, wherein the beam of penetrating radiation is monochromatic.

22. An inspection system according to claim 20, wherein at least one of the plurality of Bragg detectors is energy dispersive.

23. A method for inspecting an enclosure, the method comprising:

a. producing a beam of penetrating radiation;

b. scanning the beam through successive positions with respect to the enclosure;

c. detecting with an x-ray detector at least one of penetrating radiation transmitted through the enclosure and penetrating radiation scattered by the enclosure;

d. identifying positions warranting scrutiny of the detected penetrating radiation; and

e. determining an energy spectrum of coherent scattering as a function of angular distribution from an identified volume within the enclosure during the course of a single pass of the enclosure past the beam of penetrating radiation.

24. A method according to claim 23, further including the step of determining an energy spectrum of coherent scattering from a reference material disposed within the beam at a position posterior to the enclosure with respect to the source.

25. A method according to claim 23, further including the step of determining energy spectra of coherent scattering from a plurality of volumes within the enclosure.

26. A method according to claim 25, further including positioning a reference material between each of the plurality of volumes and the x-ray detector.

27. A method according to claim 23, further including:

f. determining the crystal spacing of the suspected object from the energy spectrum of coherent scattering as a function of angular distribution.

28. A method according to claim 27, further including the step of determining a spectrum of coherent scattering from a reference material disposed within the beam at a position posterior to the enclosure with respect to the source.