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Methods and apparatus for statistical process control of test

  • US 6,442,499 B1
  • Filed: 07/10/2001
  • Issued: 08/27/2002
  • Est. Priority Date: 03/29/2000
  • Status: Expired due to Fees
First Claim
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1. A method of testing a component, comprising the steps of:

  • testing the component using an initial wait period to generate a baseline datum;

    testing the component using a candidate wait period to generate a wait time optimization (WTO) datum;

    comparing the baseline datum and the WTO datum to a control limit to determine whether the test is out of control, wherein the control limit is based on at least one of the baseline datum and the WTO datum; and

    selecting an optimized wait period according to whether the test is out of control.

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