Precision endoscopic imaging system
First Claim
1. An imaging system, comprising,a radiation source having a first wavelength emission;
- a first conduit providing a path for radiation between said radiation source and a selected imaging object;
an electromagnetic focussing imaging detector providing an output signal in response to an applied optical image, wherein said magnetically focussed image detector comprises;
a photocathode disposed to receive photons and provide electrons corresponding to the intensity of the received photons, one of a CCD and a CMOS detector disposed a selected distance from said photocathode to receive said electrons, means for urging said electrons toward said one of a CCD and a CMOS detector from said photocathode, and a magnetic field source disposed to provide a magnetic field along said selected distance, wherein said electrons are caused to move in a helical path toward said one of a CCD and a CMOS detector of selected radius change; and
a second conduit for applying said optical image to said focussing imaging detector from said selected imaging object.
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Accused Products
Abstract
An imaging system is disclosed for use in low-light environments or environments where low-levels of such radiation is desirable. Examples of such environments are endoscopy, laparoscopy, mammography and night photography. In the case of radiation that is other than visible light, a radiation converter and method for fabricating same is disclosed. The radiation converter comprises a film of heavy scintillator (e.g. CdWO4) coated on a fiber optical window to efficiently convert the radiation into visible light. The visible light is passed into a signal amplifier employing a focussing electron-bombarded charge-couple device (FEBCCD) or a focussing electron-bombarded complementary metal-oxide semiconductor (FEBCMOS) to amplify the signal. Novel methods of performing three-dimension imaging using this system as well as removing the effects of high-speed movement are also disclosed.
51 Citations
20 Claims
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1. An imaging system, comprising,
a radiation source having a first wavelength emission; -
a first conduit providing a path for radiation between said radiation source and a selected imaging object;
an electromagnetic focussing imaging detector providing an output signal in response to an applied optical image, wherein said magnetically focussed image detector comprises;
a photocathode disposed to receive photons and provide electrons corresponding to the intensity of the received photons, one of a CCD and a CMOS detector disposed a selected distance from said photocathode to receive said electrons, means for urging said electrons toward said one of a CCD and a CMOS detector from said photocathode, and a magnetic field source disposed to provide a magnetic field along said selected distance, wherein said electrons are caused to move in a helical path toward said one of a CCD and a CMOS detector of selected radius change; and
a second conduit for applying said optical image to said focussing imaging detector from said selected imaging object. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16)
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17. A magnetically focussed image detector comprising:
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a photocathode disposed to receive photons and provide electrons corresponding to the intensity of the received photons;
one of a CCD and a CMOS detector disposed a selected distance from said photocathode to receive said electrons;
means for urging said electrons toward said one of a CCD and a CMOS detector from said photocathode; and
a magnetic field source disposed to provide a magnetic field along said selected distance, wherein said electrons are caused to move in a helical path toward said one of a CCD and a CMOS detector of selected radius change. - View Dependent Claims (18)
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19. A reduced ion positive feedback detector comprising:
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one of a CCD and a CMOS detector disposed a selected distance from said means for providing electrons to receive said electrons;
means for providing electrons to said one of said CCD and said CMOS detector along a path according to a selected signal;
a magnetic field source disposed to provide a magnetic field along said selected distance, wherein said electrons are caused to move in a helical path toward said on of said CCD and said CMOS detector of selected radius change.
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20. A method of eliminating positive ion feedback, comprising the steps of:
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applying electrons to one of a CCD and a CMOS detector along a first axis from a source; and
applying a magnetic field along said first axis in vicinity of said one of said CCD and said CMOS detector, wherein ions generated by the impact of said electrons on the one of said CCD and said CMOS detector travel on a path divergent from said source and said first axis.
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Specification