Photosensors for testing an integrated circuit
First Claim
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1. A method of testing test circuitry on an integrated circuit, the method comprising:
- providing a first spectral input to the integrated circuit, the first spectral input being converted by a photosensor on the integrated circuit to generate a data signal input used by the test circuitry to generate a result output;
checking the result output to determine whether the test circuitry is functioning properly;
providing a second spectral input to the integrated circuit, the second spectral input used to generate a gating signal input to the test circuitry, the result output being based on the data signal input gated by the gating signal input; and
shifting one or more bits responsive to the gating signal input wherein the shifting of the one or more bits corresponds to boundary scan testing.
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Abstract
An apparatus and method of testing an integrated circuit includes providing a first spectral input to the integrated circuit. A photosensor converts the first spectral input to a gating signal input that is used to gate a result output. The result output is checked to determine whether the integrated circuit is functioning properly. For one embodiment, the result output is used to provide a visual indication whether the integrated circuit is functioning properly. This allows for contactless testing of the integrated circuit, whether the circuit is in die form, wafer form, or packaged form.
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Citations
13 Claims
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1. A method of testing test circuitry on an integrated circuit, the method comprising:
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providing a first spectral input to the integrated circuit, the first spectral input being converted by a photosensor on the integrated circuit to generate a data signal input used by the test circuitry to generate a result output;
checking the result output to determine whether the test circuitry is functioning properly;
providing a second spectral input to the integrated circuit, the second spectral input used to generate a gating signal input to the test circuitry, the result output being based on the data signal input gated by the gating signal input; and
shifting one or more bits responsive to the gating signal input wherein the shifting of the one or more bits corresponds to boundary scan testing. - View Dependent Claims (2, 3)
detecting an indication of the result output via an imaging sensor.
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4. A method of testing a first and second integrated circuit die, the method comprising:
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supplying power to the first integrated circuit die and the second integrated circuit die; and
supplying a first spectral input to a first photosensor on the first integrated circuit die and, concurrently with the first spectral input, supplying a second, spectrally independent input to a second photo sensor on a second integrated circuit die, the first photosensor responding by providing a first diagnostic signal used to test circuitry on the first integrated circuit die, the second photosensor responding by providing a second diagnostic signal used to test circuitry on the second integrated circuit die. - View Dependent Claims (5, 6, 7)
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8. A method of testing test circuitry on an integrated circuit, the method comprising:
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supplying a first spectral input to a first photosensor on the integrated circuit, the first photosensor responding by providing a first diagnostic signal to the test circuitry on the integrated circuit; and
supplying a second spectral input to a second photosensor on the integrated circuit wherein the first spectral input and the second spectral input are at different wavelengths, the second photosensor responding by providing a second diagnostic signal to the test circuitry on the integrated circuit. - View Dependent Claims (9, 10)
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11. A system comprising:
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a first spectral source providing a first wavelength of light to a device, the first spectral source being converted by a photosensor to generate a first data signal input;
a second spectral source providing a second wavelength of light to a device, the second spectral source being converted by a photosensor to generate a second data signal input;
an enclosure to block sources of light other than that provided by the first and second spectral source;
a power connector to provide power to the device having photosensors. - View Dependent Claims (12, 13)
an imaging sensor to detect an indication of the device having photosensors passing a diagnostic test.
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13. The system of claim 11, wherein the first spectral source and the second spectral source are the same illumination device.
Specification