Photosensors for testing an integrated circuit

• US 6,448,802 B1
• Filed: 12/21/1998
• Issued: 09/10/2002
• Est. Priority Date: 12/21/1998
• Status: Expired due to Fees

• Current Assignee: Intel Corporation
• Original Assignee: Intel Corporation
• Inventors: Hirt, Ernie R.
• Primary Examiner(s): Sherry, Michael J.
• Assistant Examiner(s): Nguyen, Jimmy
• Application Number:
  US09/218,261
• Time in Patent Office: 1,359 Days
• Field of Search: 324/765, 324/751, 324/752, 324/753, 324/158.1
• US Class Current: 324/762.03
• CPC Class Codes: G01R 31/311 of integrated circuits G01R31/31728 takes precedence

Abstract

An apparatus and method of testing an integrated circuit includes providing a first spectral input to the integrated circuit. A photosensor converts the first spectral input to a gating signal input that is used to gate a result output. The result output is checked to determine whether the integrated circuit is functioning properly. For one embodiment, the result output is used to provide a visual indication whether the integrated circuit is functioning properly. This allows for contactless testing of the integrated circuit, whether the circuit is in die form, wafer form, or packaged form.

Claims

1. A method of testing test circuitry on an integrated circuit, the method comprising:

providing a first spectral input to the integrated circuit, the first spectral input being converted by a photosensor on the integrated circuit to generate a data signal input used by the test circuitry to generate a result output;

checking the result output to determine whether the test circuitry is functioning properly;

providing a second spectral input to the integrated circuit, the second spectral input used to generate a gating signal input to the test circuitry, the result output being based on the data signal input gated by the gating signal input; and

shifting one or more bits responsive to the gating signal input wherein the shifting of the one or more bits corresponds to boundary scan testing.

2. The method of claim 1, wherein the first spectral input is provided via a fiber optic.

3. The method of claim 1 further comprising:

detecting an indication of the result output via an imaging sensor.

4. A method of testing a first and second integrated circuit die, the method comprising:

supplying power to the first integrated circuit die and the second integrated circuit die; and

supplying a first spectral input to a first photosensor on the first integrated circuit die and, concurrently with the first spectral input, supplying a second, spectrally independent input to a second photo sensor on a second integrated circuit die, the first photosensor responding by providing a first diagnostic signal used to test circuitry on the first integrated circuit die, the second photosensor responding by providing a second diagnostic signal used to test circuitry on the second integrated circuit die.

5. The method of claim 4, wherein the first spectral input provided is within a visible light range.

6. The method of claim 4, wherein the first spectral input provided is outside a visible light range.

7. The method of claim 4, wherein the first spectral input is provided via a fiber optic.

8. A method of testing test circuitry on an integrated circuit, the method comprising:

supplying a first spectral input to a first photosensor on the integrated circuit, the first photosensor responding by providing a first diagnostic signal to the test circuitry on the integrated circuit; and

supplying a second spectral input to a second photosensor on the integrated circuit wherein the first spectral input and the second spectral input are at different wavelengths, the second photosensor responding by providing a second diagnostic signal to the test circuitry on the integrated circuit.

9. The method of claim 8, wherein the first spectral input and the second spectral input are at different wavelengths of a visible light range.

10. The method of claim 8, wherein the first spectral input and the second spectral input are provided via fiber optics.

11. A system comprising:

a first spectral source providing a first wavelength of light to a device, the first spectral source being converted by a photosensor to generate a first data signal input;

a second spectral source providing a second wavelength of light to a device, the second spectral source being converted by a photosensor to generate a second data signal input;

an enclosure to block sources of light other than that provided by the first and second spectral source;

a power connector to provide power to the device having photosensors.

12. The system of claim 11 further comprising:

an imaging sensor to detect an indication of the device having photosensors passing a diagnostic test.

13. The system of claim 11, wherein the first spectral source and the second spectral source are the same illumination device.