Monitoring and control system and method for sensing of a vessel and other properties of a cooktop

• US 6,452,136 B1
• Filed: 12/13/2000
• Issued: 09/17/2002
• Est. Priority Date: 12/13/2000
• Status: Expired due to Fees

• Current Assignee: General Electric Company
• Original Assignee: General Electric Company
• Inventors: Berkcan, Ertugrul, Saulnier, Emilie Thorbjorg
• Primary Examiner(s): PASCHALL, MARK H
• Application Number:
  US09/734,873
• Publication Number:
  US 20020070211A1
• Time in Patent Office: 643 Days
• Field of Search: 219/446.1, 219/445.1, 219/448.4, 219/460.1, 219/518, 219/497, 219/494, 250/338.1, 250/338.3, 250/339.06, 250/339.11, 250/341.7
• US Class Current: 219/502
• CPC Class Codes: H05B 2213/05 Heating plates with pan detection means
• CPC Class Codes: H05B 3/746 Protection, e.g. overheat cutoff, hot plate indicator

Abstract

An apparatus that determines properties of a cooktop is provided. The cooktop includes a cooktop surface and a vessel that is selectively placed on the cooktop surface. The apparatus comprises a radiation sensor positioned below the cooktop surface. The radiation sensor senses at least a portion of, at least one of reflected radiation and ambient radiation that are provided above the cooktop surface and that pass through the cooktop surface. The radiation sensor also generates a detected radiation signal based on the sensed radiation. A processor is connected to the radiation sensor, and the processor determines properties of the cooktop from analyzing the detected radiation signal.

Claims

1. A method for determining properties of a cooktop having a cooktop surface and a vessel selectively placed on the cooktop surface, the method comprising the steps of:

providing radiation to an area above the cooktop surface;

directing at least a portion of the provided radiation toward the cooktop surface;

detecting a portion of the directed radiation passing through the cooktop surface; and

determining properties of the cooktop from the detected radiation.

2. The method of claim 1 wherein the properties of the cooktop are selected from the group consisting of:

absence of the vessel from the cooktop surface, presence of the vessel on the cooktop surface, removal of the vessel from the cooktop surface, placement of a vessel on the cooktop surface and determination of a size of the vessel on the cooktop surface.

3. The method of claim 1 wherein the step of providing radiation to an area above the cooktop surface provides radiation at a predetermined frequency.

4. The method of claim 1 wherein the step of providing radiation to an area above the cooktop surface modulates the radiation.

5. The method of claim 1 wherein the step of providing radiation above the cooktop surface comprises:

generating radiation at a position below the cooktop surface; and

transmitting the generated radiation through the cooktop surface to a position above the cooktop surface.

6. The method of claim 5 wherein the step of transmitting comprises:

splitting the generated radiation into at least a first beam of radiation and a second beam of radiation; and

the step of transmitting comprising the steps of;

directing the first beam of radiation through and above the cooktop surface; and

directing the second beam of radiation to a reference detector generating a reference radiation signal.

7. The method of claim 6 wherein the step of determining properties of the cooktop comprises comparing a detected radiation signal generated from the detected radiation with the reference radiation signal.

8. The method of claim 1 wherein the step of directing the radiation toward the cooktop surface comprises reflecting at least a portion of the provided radiation toward the cooktop surface using a reflective member.

9. The method of claim 1 wherein the radiation comprises infrared radiation.

10. The method of claim 1 wherein the radiation comprises a wavelength ranging from about 700 microns to about 1100 microns.

12. The method of claim 10 wherein the properties of the cooktop are selected from the group consisting of:

absence of the vessel from the cooktop surface, presence of the vessel on the cooktop surface, removal of the vessel from the cooktop surface, placement of the vessel on the cooktop surface and determination of a size of the vessel on the cooktop surface.

11. A method for detecting properties of a cooktop having a cooktop surface and a vessel selectively placed on the cooktop surface, the method comprising the steps of:

generating radiation at a position below the cooktop surface;

transmitting the generated radiation through the cooktop surface to a position above the cooktop surface;

reflecting at least a portion of the transmitted radiation toward the cooktop surface using a reflective member;

detecting a portion of the reflected radiation passing through the cooktop surface; and

determining properties of the cooktop from the detected radiation.

13. The method of claim 11 wherein the step of transmitting comprises transmitting the generated radiation through the cooktop surface at a predetermined frequency.

14. The method of claim 11 wherein the step of transmitting comprises transmitting the generated radiation through the cooktop via modulating the radiation.

15. The method of claim 11 further comprising the steps of:

focusing the reflected radiation passing through the cooktop surface using a radiation collector; and

directing the focused radiation to a radiation detector.

16. The method of claim 11 further comprising filtering the reflected radiation passing through the cooktop surface.

17. The method of claim 11 further comprising the steps of:

splitting the generated radiation into at least a first beam of radiation and a second beam of radiation; and

the step of transmitting comprising the steps of;

directing the first beam of radiation through and above the cooktop surface; and

directing the second beam of radiation to a reference detector generating a reference radiation signal.

18. The method of claim 17 wherein the step of determining properties of the cooktop comprises comparing a detected radiation signal generated from the detected radiation with the reference radiation signal.

19. The method of claim 11 wherein the radiation comprises infrared radiation.

20. The method of claim 11 wherein the radiation comprises a wavelength ranging from about 700 microns to about 1100 microns.

21. An apparatus for determining properties of a cooktop having a cooktop surface and a vessel selectively placed on the cooktop surface, the apparatus comprising:

a radiation sensor positioned below the cooktop surface for sensing at least a portion of, at least one of reflected radiation and ambient radiation provided above the cooktop surface and passing through the cooktop surface and generating a detected radiation signal based on the sensed radiation; and

a processor connected to the radiation sensor for determining properties of the cooktop from analyzing the detected radiation signal.

22. The apparatus of claim 21 wherein the properties of the cooktop are selected from the group consisting of:

absence of the vessel from the cooktop surface, presence of the vessel on the cooktop surface, removal of the vessel from the cooktop surface, placement of the vessel on the cooktop surface and determination of a size of the vessel on the cooktop surface.

23. The apparatus of claim 21 wherein the radiation sensor comprises:

a radiation collector positioned below the cooktop surface for collecting the at least a portion of, the at least one of the reflected radiation and the ambient radiation;

a transmission path connected to the radiation collector for transmitting the collected radiation;

a concentrator connected to the transmission path for concentrating the transmitted radiation;

a filter connected to the concentrator for filtering the concentrated radiation; and

a detector connected to the filter for detecting the filtered radiation and generating the detected radiation signal from the detected radiation.

24. The apparatus of claim 21 further comprising:

a signal conditioner connected to the radiation sensor for conditioning the detected radiation signal; and

a controller connected to the processor.

25. The apparatus of claim 21 further comprising an indicator connected to the processor for indicating at least one of the properties of the cooktop determined by the processor.

26. The apparatus of claim 21 wherein the cooktop surface comprises a glass ceramic material.

27. The apparatus of claim 21 wherein the radiation comprises infrared radiation.

28. The apparatus of claim 21 wherein the radiation comprises a wavelength ranging from about 700 microns to about 1100 microns.

29. The apparatus of claim 21 wherein the radiation sensor senses the at least a portion of, the at least one of reflected radiation and ambient radiation provided at a predetermined frequency.

30. An apparatus for determining properties of a cooktop having a cooktop surface and a vessel selectively placed on the cooktop surface, the apparatus comprising:

a radiation source positioned below the cooktop surface for generating radiation and transmitting the radiation through the cooktop surface to a position above the cooktop surface;

a reflective surface positioned above the cooktop surface for reflecting at least a portion of the transmitted radiation;

a radiation sensor positioned below the cooktop surface for sensing at least a portion of the reflected radiation passing through the cooktop surface and generating a detected radiation signal in response to the sensed radiation; and

a processor connected to the radiation sensor and receiving the detected radiation signal wherein the processor determines properties of the cooktop from analyzing the detected radiation signal.

31. The apparatus of claim 30 wherein the properties of the cooktop are selected from the group consisting of:

absence of the vessel from the cooktop surface, presence of the vessel on the cooktop surface, removal of the vessel from the cooktop surface, placement of the vessel on the cooktop surface, a determination of a size of the vessel on the cooktop surface.

32. The apparatus of claim 30 wherein the radiation sensor comprises:

a radiation collector positioned below the cooktop surface for collecting the at least a portion of the reflected radiation;

a transmission path connected to the radiation collector for transmitting the collected radiation;

a concentrator connected to the transmission path for concentrating the transmitted radiation;

a filter connected to the concentrator for filtering the concentrated radiation; and

a detector connected to the filter for detecting the filtered radiation and generating the detected radiation signal from the detected radiation.

33. The apparatus of claim 30 further comprising:

a signal conditioner connected to the radiation sensor for conditioning the detected radiation signal; and

a controller connected to the processor and the radiation source.

34. The apparatus of claim 30 further comprising an indicator connected to the processor for indicating at least one of the properties of the cooktop determined by the processor.

35. The apparatus of claim 30 wherein the cooktop surface comprises a glass ceramic material.

36. The apparatus of claim 30 wherein the radiation comprises infrared radiation.

37. The apparatus of claim 30 wherein the radiation comprises a wavelength ranging from about 700 microns to about 1100 microns.

38. The apparatus of claim 30 further comprising a beam splitter connected to the radiation source for splitting the radiation into at least a first beam of radiation and a second beam of radiation.

39. The apparatus of claim 38 further comprising a reference detector connected to the processor wherein the first beam of radiation is transmitted through and above the cooktop surface and the second beam of radiation is transmitted toward the reference detector generating a reference radiation signal in response to radiation transmitted to the reference detector.

40. The apparatus of claim 39 wherein at least one of the properties of the cooktop is determined by the processor comparing the reference radiation signal to the detected radiation signal.

41. The apparatus of claim 40 further comprising:

a transmission path connected to the beam splitter;

a filter connected to the transmission path and the reference detector for filtering the transmitted signal; and

a signal conditioner connected to the reference detector and the processor for conditioning the reference radiation signal.