High sensitivity deflection sensing device
First Claim
1. In an atomic force microscope containing an optical beam deflection sensing device, having a light source providing an incident beam, a lens for focusing the incident beam to a spot on a selected reflective object and an optical detector for receiving the beam when reflected from the reflective object, said detector generating a signal against background noise, the improvement whereby the sensitivity of the optical beam deflection sensing device is increased, comprising providing at least one of the following features:
- (a) a plurality of movable, removable, or interchangeable lenses in the path of the incident beam for adjusting the size of the incident beam spot, whereby to produce different size focused spots for a selected reflective object;
(b) control means in the path of the incident beam for adjusting the power, size or shape of the incident beam spot including a mask inserted in the path of the incident beam having adjacent regions through which the beam is transmitted, said adjacent regions having either different optical transmission characteristics or different shapes;
(c) means for viewing the spot and the reflective object, means for moving the reflective object, and spot position control means based on imaging the reflective object and the spot through the viewing means for moving the incident beam spot with movement of the reflective object whereby to maintain the position of the spot on the reflective object; and
(d) control means for increasing the signal to noise ratio of the optical detector, in which the optical detector has an array of three or more segments generating signals with gains adjusted based on evaluation of one or more segment signals, and summing means for adding the signals from said three or more segments to detect a change of position or shape of the spot as the reflected beam traverses said three or more segments.
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Accused Products
Abstract
A high sensitivity beam deflection sensing optical device, such as an atomic force microscope, including one or more of the following: specified means in the path of the incident beam for adjusting the size and/or power of the incident beam spot, means for moving the incident beam spot with movement of the object whereby to maintain the position of the spot on the object, and means for increasing the signal to noise ratio of the optical detector in which adjusted gains are applied to different segments of the optical detector.
62 Citations
29 Claims
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1. In an atomic force microscope containing an optical beam deflection sensing device, having a light source providing an incident beam, a lens for focusing the incident beam to a spot on a selected reflective object and an optical detector for receiving the beam when reflected from the reflective object, said detector generating a signal against background noise, the improvement whereby the sensitivity of the optical beam deflection sensing device is increased, comprising providing at least one of the following features:
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(a) a plurality of movable, removable, or interchangeable lenses in the path of the incident beam for adjusting the size of the incident beam spot, whereby to produce different size focused spots for a selected reflective object;
(b) control means in the path of the incident beam for adjusting the power, size or shape of the incident beam spot including a mask inserted in the path of the incident beam having adjacent regions through which the beam is transmitted, said adjacent regions having either different optical transmission characteristics or different shapes;
(c) means for viewing the spot and the reflective object, means for moving the reflective object, and spot position control means based on imaging the reflective object and the spot through the viewing means for moving the incident beam spot with movement of the reflective object whereby to maintain the position of the spot on the reflective object; and
(d) control means for increasing the signal to noise ratio of the optical detector, in which the optical detector has an array of three or more segments generating signals with gains adjusted based on evaluation of one or more segment signals, and summing means for adding the signals from said three or more segments to detect a change of position or shape of the spot as the reflected beam traverses said three or more segments. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. In an optical beam deflection sensing device, having a light source providing an incident beam, a lens for focusing the incident beam to a spot on a reflective object and an optical detector for receiving the beam when reflected from the reflective object, said detector generating a signal against background noise, the improvement whereby the sensitivity of the optical device is increased, comprising providing control means in the path of the incident beam for adjusting the power or shape of the incident beam spot including a mask inserted in the path of the incident beam having adjacent regions through which the beam is transmitted, said adjacent regions having either different optical transmission characteristics or different shapes, said reflective object comprising a cantilever disposed in a predetermined plane and means for forming an image plane, with respect to the plane of the cantilever, in the path of the incident beam, said mask being inserted in said image plane whereby to produce a desired spot shape.
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10. In an optical beam deflection sensing device, having a light source providing tin incident beam, a lens for focusing the incident beam to a spot on a reflective object and an optical detector for receiving the beam when reflected from the reflective object, said detector generating a signal against background noise, the improvement whereby the sensitivity of the optical device is increased, comprising providing control means in the path of the incident beam for adjusting the power or shape of the incident beam spot including a mask inserted in the path of the incident beam having adjacent regions through which the beam is transmitted, said adjacent regions having either different optical transmission characteristics or different shapes, said mask being patterned whereby to produce a desired spot irradiance distribution on the cantilever.
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11. In an optical beam deflection sensing device having a light source providing an incident beam, a lens for focusing the incident beam to a spot on a selected one of one or more reflective objects, and an optical detector for receiving the beam when reflected from the selected reflective object, said detector generating a signal against background noise, the improvement whereby the sensitivity of the optical beam deflection sensing device is increased, comprising providing:
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(a) a plurality of moveable, removable or interchangeable lenses in the path of the incident beam for adjusting the size of the incident beam spot, whereby to produce different size focused spots for respective selected reflective objects; and
(b) means for viewing the spot and the reflective objects and spot position control means based on imaging the reflective object and the spot through the viewing means for moving the incident beam spot with movement of the reflective object whereby to maintain the position of the spot on the respective reflective object; and
(c) control means for increasing the signal to noise ratio of the optical detector, in which the optical detector has an array of three or more segments generating signals with gains adjusted based on evaluation of one or more segment signals, and means for adding the signals from said three or more segments to detect a change of position or shape of the spot as the reflected beam traverses said three or more segments.
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12. A method for improving the sensitivity of an atomic force microscope containing an optical beam deflection sensing device having a light source providing an incident beam, a lens for focusing the incident beam to a spot on a selected one of one or more reflective objects, and an optical detector having an array of three or more segments for receiving the beam when reflected from the selected reflective object, comprising at least one of the following steps:
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(a) modifying the incident beam to adjust the size of the incident beam spot, comprising the step of discretely adjusting the size of the incident beam spot by adjusting or placing one or more lenses in the path of the incident beam whereby to produce different size focused spots for respective selected reflective objects;
(b) adjusting the power, size or shape of the incident beam spot by inserting a mask in the path of the incident beam said mask having adjacent regions through which the beam is transmitted, said adjacent regions having either different optical transmission characteristics or different shapes;
(c) determining the position of the reflective object, determining the position of the incident beam spot, and determining any difference in said positions then, if there is a difference in said positions, moving the incident beam spot whereby to maintain the position of the spot on the selected reflective object; and
(d) evaluating one or more segment signals, weighting and adding the signals from said three or more segments to detect a change of position or shape of the spot as the reflected beam traverses said three or more segments, whereby to increase the signal to noise ratio of the optical detector. - View Dependent Claims (13, 14, 15, 16, 17, 18)
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- 19. A method for improving the sensitivity of an optical beam deflection sensing device having a light source providing an incident beam, a lens for focusing the incident beam to a spot on a selected one of one or more reflective objects, and an optical detector having an array of three or more segments for receiving the beam when reflected from the selected reflective object, comprising adjusting the power, size or shape of the incident beam spot by inserting a mask in the path of the incident beam said mask having adjacent regions through which the beam is transmitted, said adjacent regions having either different optical transmission characteristics or different shapes, said beam deflection sensing device including, as one or more of said reflective objects, a cantilever disposed in a predetermined plane and including means for forming an image plane, with respect to the plane of the cantilever, in the path of the incident beam, comprising the step of inserting said mask in said image plane whereby to produce a desired spot shape.
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21. A method for improving the sensitivity of an optical beam deflection sensing optical device having a light source providing an incident beam, a lens for focusing the incident beam to a spot on selected one of one or more reflective objects, and an optical detector having an array of segments for receiving the beam when reflected from the reflective object, comprising:
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(a) modifying the incident beam to adjust the size of the incident beam spot, comprising the step of discretely adjusting the size of the incident beam spot whereby to produce different size focused spots for respective elected reflective objects;
(b) adjusting the power size or shape of the incident beam spot by inserting a mask in the path of the incident beam, said mask having adjacent regions in direction perpendicular to the incident beam path through which the incident beam is transmitted, said adjacent regions having either different optical transmission characteristics or different shapes;
(c) moving the incident beam spot with movement of the reflective object whereby to maintain the position of the spot on the respective reflective object; and
(d) adjusting the gains of different segments of the optical detector based on an evaluation of one or more segment signals and adding the signals from said one or more segments to detect a change of position or shape of the spot as the reflected beam traverses said three or more segments, whereby to increase the signal to noise ratio of the optical detector.
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22. In an optical beam deflection sensing device, having a light source providing an incident beam, a lens for focusing the incident beam to a spot on a selected reflective object and an optical detector for receiving the beam when reflected from the reflective object, said detector generating a signal against background noise, the improvement whereby the sensitivity of the optical beam deflection sensing device is increased, comprising a confocal viewing system formed of a plurality of movable, removable, or interchangeable lenses comprising an adjustable beam expander or zoom optics in the path of the incident beam for adjusting the size of the incident beam spot and arranged to focus the incident beam on the reflective object, whereby to produce different size focused spots for a selected reflective object, said beam expander or zoom optics being also in the path of said confocal viewing system, and providing at least one of the following features:
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(a) control means in the path of the incident beam for adjusting the power, size or shape of the incident beam spot including a mask inserted in the path of the incident beam having adjacent regions through which the beam is transmitted, said adjacent regions having either different optical transmission characteristics or different shapes;
(b) means for viewing the spot and the reflective object, and spot position control means based on imaging the reflective object and the spot through the viewing means for moving the incident beam spot with movement of the reflective object whereby to maintain the position of the spot on the reflective object; and
(c) control means for increasing the signal to noise ratio of the optical detector, in which the optical detector has an array of three or more segments generating signals with gains adjusted based on evaluation of one or more segment signals, and summing means for adding the signals from said three or more segments to detect a change of position or shape of the spot as the reflected beam traverses said three or more segments. - View Dependent Claims (23)
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- 24. In an atomic force microscope having one or more cantilevers, a light source providing an incident beam, a lens for focusing the incident beam to a spot on a selected cantilever and an optical detector for receiving the beam when reflected from the selected cantilever, said detector generating a signal against background noise, the improvement comprising a confocal viewing system formed of a plurality of movable, removable, or interchangeable lenses comprising an adjustable beam expander or zoom optics in the path of the incident beam for adjusting the size of the incident beam spot and arranged to focus the incident beam on the selected cantilever, whereby to produce different size focused spots for a selected cantilever, said beam expander or zoom optics being also in the path of said confocal viewing system.
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26. A method for improving the sensitivity of an optical beam deflection sensing device having a light source providing an incident beam, a lens for focusing the incident beam to a spot on a selected one of one or more reflective objects, and an optical detector having an array of three or more segments for receiving the beam when reflected from the selected reflective object, comprising:
- adjusting the size of the incident beam spot by adjusting or placing one or more lenses in the path of the incident beam whereby to diverge or converge said beam and then focusing said diverged or converged light beam, and comprising at least one of the following steps;
(a) adjusting the power, size or shape of the incident beam spot by inserting a mask in the path of the incident beam said mask having adjacent regions through which the beam is transmitted, said adjacent regions having either different optical transmission characteristics or different shapes;
(b) moving the incident beam spot with movement of the reflective object whereby to maintain the position of the spot on the selected reflective object; and
(c) evaluating one or more segment signals, weighting and adding the signals from said three or more segments to detect a change of position or shape of the spot as the reflected beam traverses said three or more segments, whereby to increase the signal to noise ratio of the optical detector.
- adjusting the size of the incident beam spot by adjusting or placing one or more lenses in the path of the incident beam whereby to diverge or converge said beam and then focusing said diverged or converged light beam, and comprising at least one of the following steps;
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27. A method for improving the sensitivity of an optical beam deflection sensing device in an atomic force microscope having one or more cantilevers, a light source providing an incident beam, and a lens for focusing the incident beam to a spot on a selected one of said one or more cantilevers, comprising:
- discretely adjusting the size of the incident beam spot by adjusting or placing one or more lenses in the path of the incident beam whereby to diverge or converge said beam, and then focusing said diverged or converged light beam.
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28. In an optical beam deflection sensing device, having a light source providing an incident beam, a lens for focusing the incident beam to a spot on a selected reflective object and an optical detector for receiving the beam when reflected from the reflective object, said detector generating a signal against background noise, the improvement whereby the sensitivity of the optical beam deflection sensing device is increased, comprising providing control means for increasing the signal to noise ratio of the optical detector, in which the optical detector has an array of three or more segments generating signals with gains adjusted based on evaluation of one or more segment signals, and summing means for adding the signals from said three or more segments to detect a change of position or shape of the spot as the reflected beam traverses said three or more segments.
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29. A method for operating an optical beam deflection sensing device having a light source providing an incident beam, a lens for focusing the incident beam to a spot on a selected one of one or more reflective objects, and an optical detector having an array of three or more segments for receiving the beam when reflected from the selected reflective object, the array of segments generating signals, comprising increasing the signal to noise ratio of the device by the steps of applying different gains to signals from different segments, adjusting said gains based on evaluation of one or more segment signals, and adding the adjusted signals from said three or more segments to detect a change of position or shape of the spot as the reflected beam traverses said three or more segments.
Specification