Particle measurement apparatus and method

• US 6,456,055 B2
• Filed: 03/14/2001
• Issued: 09/24/2002
• Est. Priority Date: 03/14/2000
• Status: Expired due to Fees

• Current Assignee: Sysmex Corporation
• Original Assignee: Sysmex Corporation
• Inventors: Ueno, Kunio, Shinabe, Seiya
• Primary Examiner(s): ODA, CHRISTINE K
• Application Number:
  US09/805,208
• Publication Number:
  US 20010050562A1
• Time in Patent Office: 559 Days
• Field of Search: 356/335, 356/336, 73/10.2, 324/71.4, 324/615, 324/76.51
• US Class Current: 324/71.4
• CPC Class Codes: G01N 15/12 by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
• CPC Class Codes: G01N 15/132 Circuits
• CPC Class Codes: G01N 15/1459 the analysis being performed on a sample stream
• CPC Class Codes: G01N 2015/1029 Particle size
• CPC Class Codes: G01N 2015/1493 Particle size

Abstract

A particle measurement apparatus includes: a particle signal detector for detecting a particle signal; a false signal generator for generating a false signal corresponding to the particle signal; a selector for selecting the particle signal or the false signal, a non-linear amplifier; a first calculator for receiving the signal selected by the selector through the non-linear amplifier to calculate a characteristic parameter; a second calculator for receiving the signal selected by the selector not through the non-linear amplifier to calculate the characteristic parameter; a comparator for including the characteristic parameters calculated by the first and second calculators respectively when the selector selects the false signal; a memory for storing a comparison result of the comparator; and a compensator for compensating the characteristic parameter calculated by the first calculator on the basis of the comparison result when the selector selects the particle signal.

Claims

1. A particle measurement apparatus comprising:

a particle signal detecting section for detecting a particle signal with respect to a plurality of particles, the particle signal representing characteristics of each particle;

a false signal generating section for generating a false signal corresponding to the particle signal;

a selecting section for selecting the particle signal or the false signal,

a non-linear amplifier;

a first calculating section for receiving the signal selected by the selecting section through the non-linear amplifier to calculate a characteristic parameter;

a second calculating section for receiving the signal selected by the selection section not through the non-linear amplifier to calculate the characteristic parameter;

a comparison section for comparing the characteristic parameters calculated by the first and second calculating sections respectively when the selecting section selects the false signal;

a storage section for storing a comparison result of the comparison section; and

a compensating section for compensating the characteristic parameter calculated by the first calculating section on the basis of the comparison result when the selection section selects the particle signal.

2. The particle measurement apparatus of claim 1, wherein the particle signal detecting section comprises an electric measurement particle detector.

3. The particle measurement apparatus of claim 1, wherein the non-linear amplifier comprises a logarithmic amplifier.

4. The particle measurement apparatus of claim 1, wherein the false signal generating section comprises a pulse generating circuit and a gain variable amplifier.

5. The particle measurement apparatus of claim 1, wherein the selecting section comprises an analog switch.

6. The particle measurement apparatus of claim 1, wherein the second calculating section calculates the characteristic parameter using a mathematical non-linear function.

7. The particle measurement apparatus of claim 1, wherein the characteristics parameter comprises a pulse height and pulse width or a particle volume and particle diameter calculated on the basis thereof.

8. The particle measurement apparatus of claim 1, wherein the storage section comprises a ROM.

9. The particle measurement apparatus of claim 1, wherein the comparison result is stored as a correction curve on rectangular coordinates.

10. The particle measurement apparatus of claim 1, further comprising a first A/D converter for beforehand converting the signal input to the first calculating section into a digital signal and a second A/D converter for beforehand converting the signal input to the second calculating section into a digital signal.

13. The method of claim 11 which is carried out by the apparatus of claim 1.

11. A method of measuring particles, comprising the steps of:

making a preparation for measurement by sucking a sample liquid containing particles to introduce the same into a particle signal detector;

generating a false signal corresponding to a particle signal which really represents characteristics of a plurality of particles;

calculating a first characteristic parameter by receiving the false signal through a non-linear amplifier;

calculating a second characteristic parameter by receiving the false signal not through the non-linear amplifier;

comparing the first characteristic parameter with the second characteristic parameter;

storing a comparison result;

detecting a particle signal by the particle detector;

calculating a third characteristic parameter by receiving the detected particle signal through the non-linear amplifier; and

correcting the third characteristic parameter on the basis of the comparison result.

12. The method of claim 11, wherein the steps from the false signal generating step to the storing step are carried out along with the measurement preparations step.