Fault detection in digital system

• US 6,457,145 B1
• Filed: 07/16/1999
• Issued: 09/24/2002
• Est. Priority Date: 07/16/1998
• Status: Expired due to Term

• Current Assignee: Telefonaktiebolaget LM Ericsson
• Original Assignee: Telefonaktiebolaget LM Ericsson
• Inventors: Halvarsson, Dan Olov, Jonsson, Tomas, Holmberg, Per Anders
• Primary Examiner(s): LE, DIEU MINH T
• Application Number:
  US09/354,988
• Time in Patent Office: 1,166 Days
• Field of Search: 714/45, 714/30, 714/48, 714/732, 714/733
• US Class Current: 714/45
• CPC Class Codes: G06F 11/27 Built-in tests

Abstract

For fault testing in a digital system, a processor unit is made available from other activities and the logical units to be tested are set to a predetermined state. An output response analyze is activated and the processor unit generates a set of stimuli, influencing the appropriate logical units. The output response analyzer collects responses to the stimuli at different nodes in the digital system and creates signatures from them. The signals are verified and if a fault is noticed, this error is noticed. The present state of the processor and other logical units are stored in a storage device prior to the test and recovered after the testing is finished. This fault testing can be performed both at chip and board levels, and on systems with several units.

Claims

1. A digital system unit with fault detection, comprising

a processor unit for use in the normal operation of said digital system unit,

an output response analyser connected to a number of nodes in said digital system unit,

said processor unit comprising

means for ensuring availability of said processor unit for performing of a fault detection process,

means for setting logic units to be tested to a predetermined state,

means for activating said output response analyser and

means for executing a stimuli generation in said processor unit,

said output response analyser comprising

means for collecting stimuli responses from said nodes,

means for creating signatures of said collected stimuli responses,

said digital system unit further comprising

means for verifying said signatures for fault and

means for error signaling.

2. A digital system unit according to claim 1, further comprising storage means for storing of processor state.

3. A digital system unit according to claim 1, wherein said verifying means and error signaling means are comprised in said processor unit.

4. A digital system unit according to claim 1, wherein said verifying means and error signaling means are comprised in said output response analyser.

5. A digital system unit according to claim 1, wherein said digital system unit is an electronics board.

6. A digital system unit according to claim 1, wherein said digital system unit is an electronics chip.

7. A digital system unit according to claim 1, wherein said output response analyser comprises a multiple-input signature register.

8. A digital system with fault detection comprising a number of replaceable plugin units, at least one of said replaceable plugin units comprising a processor unit for use in the normal operation of said replaceable plugin unit, an output response analyser connected to a number of nodes in said respective replaceable plugin unit, said processor unit comprising

means for ensuring availability of said processor unit for performing of a fault detection process,

means for setting logic units to be tested to a predetermined state,

means for activating said output response analyser and

means for executing a stimuli generation in said processor unit,

said output response analyser comprising

means for collecting stimuli responses from said nodes,

means for creating signatures of said collected stimuli responses,

said replaceable plugin unit further comprising

means for verifying said signatures for fault and

means for error signaling.

9. A digital system according to claim 8, wherein at least one of said nodes is an input or output terminal for said replaceable plugin unit.

10. A method for fault detection in a digital system comprising a processor unit for use in the normal operation of said digital system, an output response analyser connected to a number of nodes in said digital system, said method comprises the steps of:

making said processor unit available from other ongoing activities for performing of a fault detection process;

setting logical units to be tested to a predetermined state;

activating said output response analyser;

executing a stimuli generation in said processor unit;

collecting, in said output response analyser, stimuli responses from said nodes;

creating signatures of said collected stimuli responses in said output response analyser;

verifying said signatures for faults; and

if any fault is detected in said signatures, error signaling.

11. A method for fault detection according to claim 10, comprising the further steps of:

storing the present state of said processor unit in a storage means, prior to said step of setting logical units to be tested to a predetermined state; and

restoring the processor state from said stored state, after said signature creating step; and

restart said other ongoing activities in said processor unit.

12. A method for fault detection according to claim 10, wherein the signature creating step comprises the step of compressing said output response into signature by using cyclic redundancy checking.

13. A method for fault detection according to claim 10, wherein said verifying and error signaling steps are performed by said processor unit.

14. A method for fault detection according to claim 10, wherein said verifying and error signaling steps are performed by said output response analyser.

15. A method for fault detection according to claim 14, wherein said verifying step comprises the step of comparing said signature with a checksum stored at each replaceable plugin unit.

16. A method for fault detection according to claim 10, wherein said executing step consists of executing a limited stimuli generation in said processor involving only a part of said nodes.

17. A method for fault detection according to claim 10, wherein said executing and collecting steps takes place during more than one clock cycle.

18. A method for fault detection according to claim 17, wherein said collecting step comprises the step of adding signatures of subsequent clock cycles.

19. A method for fault detection according to claim 10, wherein said executing and collecting steps take place at different replaceable plugin units, thereby testing faults in communication between said replaceable plugin units.