Refractomer and method for qualitative and quantitative measurements

• US 6,462,809 B1
• Filed: 11/12/1999
• Issued: 10/08/2002
• Est. Priority Date: 11/13/1998
• Status: Expired due to Fees

• Current Assignee: Reichert, Inc. (Ametek Incorporated)
• Original Assignee: Leica Microsystems Incorporated (Danaher Corporation)
• Inventors: Ryan, Thomas E., Byrne, Michael J.
• Primary Examiner(s): Font, Frank G.
• Assistant Examiner(s): STAFIRA, MICHAEL PATRICK
• Application Number:
  US09/439,876
• Time in Patent Office: 1,061 Days
• Field of Search: 356/128, 356/135, 356/136, 356/445, 385/12, 385/129, 385/130, 385/131
• US Class Current: 356/128
• CPC Class Codes: B82Y 30/00 Nanotechnology for materials or surface science, e.g. nanocomposites
• CPC Class Codes: G01N 21/05 Flow-through cuvettes G01N21/09 takes precedence; handling fluid samples G01N1/10
• CPC Class Codes: G01N 21/43 by measuring critical angle
• CPC Class Codes: G01N 33/54373 involving physiochemical end-point determination, e.g. wave-guides, FETS, gratings
• CPC Class Codes: G01N 33/544 the carrier being organic
• CPC Class Codes: G01N 33/551 the carrier being inorganic
• CPC Class Codes: Y02A 90/10 Information and communication technologies [ICT] supporting adaptation to climate change, e.g. for weather forecasting or climate simulation

Abstract

A sensor apparatus and associated method for sensing and monitoring specific binding of analyte to an immobilized binding layer are disclosed. The apparatus preferably comprises an automatic critical angle refractometer having a linear scanned array and an optical system for illuminating a portion of the array, which illumination depends upon the refractive index of the binding layer deposited on an optically transparent element. The apparatus further includes a flow cell for bringing the analyte in contact with the binding layer. The apparatus also includes a computer for receiving and processing refractive index data from the critical angle refractometer during the reaction between the analyte and the layer, which computer may be peripherally connected to the refractometer or enclosed within the refractometer housing. A preferred sensing method of the present invention generally comprises providing a critical angle refractometer generating light impinging upon the immobilized binding layer, contacting the binding layer with a contacting phase, measuring the critical angle of total reflection, which measurements are indicative of the presence or absence of interactions between the analyte and the binding layer.

Claims

1. A method of using critical angle refractometry for sensing presence or absence of an analyte at a binding layer, the method comprising:

providing a first optically transparent element and a second optically transparent element, the first optically transparent element having a higher refractive index than that of the second optically transparent element, the second element having the binding layer;

providing a contacting phase;

allowing the contacting phase to contact the binding layer of the second optically transparent element;

passing light through the first and the second optically transparent elements to cause the light to impinge upon an interface between the second optically transparent element and the binding layer; and

detecting a location of a boundary between a light area and a dark area on a sensing element, the location of the boundary being indicative of the presence or absence of the ligands at the binding layer.

2. The method of claim 1 further comprising providing a test assembly designed to house the second optically transparent element and the contacting phase contacting the binding layer, the test assembly being disposed to allow the light to impinge upon the interface between the second optically transparent material and the binding layer.

3. A method of using critical angle refractometry for sensing presence or absence of an analyte at a binding layer of a first optically transparent material, the method comprising:

providing the first optically transparent material of a higher optical density than that of the binding layer;

contacting the binding layer with a contacting phase;

passing light along an optical path through the first optically transparent material to cause the light to impinge upon an interface between the binding layer and the first optically transparent material;

sensing a boundary between a light area and a dark area on a sensing element disposed along the optical path; and

utilizing the location of the boundary to determine the presence or absence of the analyte at the binding layer.

4. The method of claim 3, wherein the light area is formed by a first portion of the light reflected from the interface and illuminating the sensing element, the dark area is formed as a result of a second portion of the light transmitted into the contacting phase and not illuminating the sensing element.

5. The method of claim 3, further comprising passing light through a second optically transparent material before passing light through the first optically transparent material.

6. A method of sensing presence or absence of an analyte at a binding layer, the method comprising:

providing an interface between the binding layer and an optically transparent element, the interface being located along an optical path, the binding layer and the optically transparent element having different optical densities sufficient to totally internally reflect light impinging on the interface;

contacting the binding layer with a contacting phase;

illuminating the interface with the light propagating along the optical path, so that a portion of the light totally internally reflected from the interface propagates between the interface and a sensing element disposed along the optical path and illuminates the sensing element to form a light area thereon; and

detecting a location of a boundary between the light area and a dark area on the sensing element, the location of the boundary being indicative of the presence or absence of the analyte at the binding layer.

7. The method of claim 6, further comprising passing the light through the optically transparent element before illuminating the interface.

8. The method of claim 7, further comprising passing the light through an optically transparent material before passing the light through the optically transparent element.

9. The method of claim 6, wherein the analyte changes the optical density of the binding layer by binding to immobilized ligands in the binding layer.

10. A method of sensing presence or absence of an analyte at a binding layer, the method comprising:

providing a first interface between a first medium and a second medium, a second interface between the second medium and a third medium, and a third interface between the third medium and the binding layer, the first, the second, the third media and the binding layer having optical densities sufficient to cause light propagating through the first, the second and the third interfaces to be totally internally reflected at the third interface and to propagate toward a sensor;

contacting the binding layer with a contacting phase;

passing the light through the first interface and the second interfaces to cause the light to impinge upon the third interface; and

detecting a location of a boundary between a dark area and a light area on the sensor, the location of the boundary being indicative of the presence or absence of the ligands at the binding layer.

11. The method of claim 10, wherein providing the first, the second and the third interfaces comprises providing the first medium, the second medium, the third medium and the binding layer having the optical densities in a descending order from the first medium to the binding layer.

12. A method of sensing presence or absence of an analyte at a binding layer, the method comprising:

providing a light beam generated by a light source;

providing an interface between the binding layer and an optically transparent element, the binding layer and the optically transparent element having optical densities sufficient to cause the light beam impinging upon the interface to be totally internally reflected;

contacting the binding layer with a contacting phase;

illuminating the interface by the light beam impinging upon the interface at a predetermined angle of incidence;

providing a sensor located at a position in which the sensor can sense the light totally internally reflected at the interface; and

sensing the presence or absence of a boundary between a dark area and a light area on the sensor, the presence or absence of the boundary being indicative of the presence or absence of the analyte at the binding layer.

13. The method of claim 12, further comprising passing the light beam through the optically transparent element before illuminating the interface.

14. The method of claim 12, further comprising altering the predetermined angle of incidence to allow the sensor to detect a change between sensing light and not sensing light.

15. A method of sensing an analyte at a binding layer, the method comprising:

providing an optically transparent element having an optical density different from that of the binding layer, the optically transparent element comprising the interface between the binding layer and the optically, transparent element;

providing a light source generating a collimated light beam propagating along an optical path, the optical path comprising the light source, the interface and a sensing element;

contacting the binding layer with a contacting phase;

directing the light beam to the interface to cause the light beam to impinge upon the interface at a predetermined angle of incidence; and

sensing presence or absence of a boundary between a dark area and a light area on the sensing element to determine the absence of the analyte in the contacting phase.

16. A method of using critical angle refractometry for determining presence or absence of an analyte at a binding layer deposited on an optically transparent element, the method comprising:

providing a critical angle refractometer defining an optical path;

the critical angle refractometer comprising a sensing element disposed along the optical path;

directing light along the optical path at an interface between the binding layer and the optically transparent element;

bringing the analyte in contact with the binding layer; and

refractometrically detecting changes in an optical density of the binding layer by sensing the light on the sensing element; and

and relating the changes to the presence or absence of the analyte at the binding layer.

17. The method of claim 16, further comprising repeating refractometrically detecting changes in the optical density of the binding layer to monitor the interaction between the analyte and the binding layer over time.

18. The method of claim 16, wherein bringing the analyte in contact with the binding layer comprises contacting the binding layer with a contacting phase containing the analyte.

19. The method of claim 16, wherein the changes in the optical density are caused by interaction between the analyte and the binding layer.

20. An apparatus for using critical angle refractometry to sense presence or absence of an analyte at a binding layer, the analyte having affinity to the binding layer, the apparatus comprising:

a first optically transparent element and a second optically transparent element, the first optically transparent element having a higher refractive index than that of the second optically transparent element;

the binding layer deposited on the second optically transparent element, the binding layer having a refractive index lower than that of the second optically transparent element;

a contacting phase contacting the binding layer;

a light beam passing through the first and the second optically transparent elements, causing the light to impinge upon an interface between the second optically transparent element and the binding layer; and

a sensor detecting a location of a boundary between a light area and a dark area on the sensor.

21. The apparatus of claim 20, wherein the contacting phase contains the analyte interacting with the binding layer.

22. The apparatus of claim 20, wherein the light area being formed by a portion of the light beam reflected from the interface toward the sensor, the dark area being formed by light refracted into the binding layer.

23. The apparatus of claim 20, further comprising an optically transparent layer disposed between the first optically transparent element and the second optically transparent element.

24. A system for determining presence or absence of an analyte in a contacting phase, the system comprising:

a critical angle refractometer defining an optical path of a light beam impinging upon an interface between an optically transparent element and a binding layer, the binding layer being deposited on the optically transparent element and having affinity to the analyte;

the contacting phase contacting the binding layer; and

a sensor sensing a boundary between light and dark areas on the sensor.

25. The system of claim 24, further comprising a test assembly designed to house the optically transparent element.

26. The system of claim 25, wherein the test assembly comprises means for bringing the contacting phase in contact with the binding layer.

27. The system of claim 24, wherein the contacting phase contains the analyte interacting with the binding layer.

28. A system for detecting presence or absence of an analyte in a contacting phase, the system comprising:

an optically transparent element having a binding layer deposited thereon, the binding layer having affinity to the analyte;

a critical angle refractometer defining an optical path of a collimated light beam impinging upon an interface between the binding layer and the optically transparent element;

the contacting phase contacting the binding layer; and

a sensor disposed along the optical path to detect changes in an optical density of the binding layer by sensing the collimated light beam travelling along the optical path.

29. The system of claim 28, wherein the critical angle refractometer comprises an optically transparent material disposed along the optical path in such a way that the light beam passes through the material before impinging upon the interface between the binding layer and the optically transparent element.

30. The system of claim 28, wherein the light beam impinges upon the interface at a predetermined angle of incidence.