Apparatus and methods for spectroscopic measurements

• US 6,466,316 B2
• Filed: 01/19/2001
• Issued: 10/15/2002
• Est. Priority Date: 07/27/1998
• Status: Expired due to Fees

• Current Assignee: Molecular Devices
• Original Assignee: LJL Biosystems, Inc. (Molecular Devices)
• Inventors: Owicki, John C, Modlin, Douglas N., Petersen, Jon F.
• Primary Examiner(s): Evans, F. L.
• Assistant Examiner(s): LAUCHMAN, LAYLA G
• Application Number:
  US09/765,869
• Publication Number:
  US 20010007496A1
• Time in Patent Office: 634 Days
• Field of Search: 356/318, 356/317, 356/417, 356/73, 250/458.1, 250/459.1, 250/461.1, 422/82.08, 436/172
• US Class Current: 356/318
• CPC Class Codes: B82Y 15/00 Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
• CPC Class Codes: G01N 21/253 for batch operation, i.e. multisample apparatus analytical automats G01N35/00
• CPC Class Codes: G01N 21/55 Specular reflectivity

Abstract

Apparatus and methods for measuring light transmitted from a sample. The apparatus may include a stage, a light source, and a detector. The stage may be configured to hold a microplate having a plurality of sample wells. The apparatus may be configured to take measurements of one or more of absorbance, scattering, reflectance and luminescence. The apparatus may permit simultaneous measurements of two or more of these properties.

Claims

1. A method of measuring absorbance of a sample, comprising:

directing incident light from a light source to a measurement region;

sequentially positioning each of a series of samples in the measurement region so that the incident light passes through each of the samples in a first direction, and for each of the samples;

reflecting the incident light back through the sample in a second direction generally opposed to the first direction;

receiving the reflected light; and

computing a quantity related to the absorbance of the sample based on the amount of reflected light received.

2. The method of claim 1 further comprising the step of placing the samples in a corresponding series of sample wells in a sample plate.

3. The method of claim 2, wherein the sample wells in the sample plate have a surface that scatters light.

4. The method of claim 1 further comprising, for each of the samples, measuring luminescence of the sample while the sample is positioned in the measurement region.

5. The method of claim 1 further comprising separating light transmitted from the sample into a luminescence component and a reflected component.

6. A method for performing a spectroscopic assay, wherein a plurality of samples are automatically and sequentially placed into a measurement region, comprising for each sample:

directing light from a light source onto the sample from a first side;

detecting a first fraction of the incident light that passes through the sample to a second side without absorbance or scattering; and

simultaneously detecting a second fraction of light transmitted from the sample on the first side generally opposite the direction of the incident light.

7. The method of claim 6, wherein the second fraction of light is luminescence light.

8. The method of claim 6, wherein the second fraction of light is scattered light.

9. The method of claim 6, wherein one of the samples is a blank for calibration.

10. The method of claim 9, wherein the blank sample is opaque.

11. The method of claim 10 further comprising the step of detecting the first fraction with the blank and using the detected value to compensate for background absorbance signal in subsequent samples.

12. The method of claim 6 further comprising passing the incident light through a first polarizer.

13. The method of claim 12 further comprising:

passing the second fraction of light through a second polarizer; and

orienting the second polarizer to reduce an undesired contribution to the signal.

14. The method of claim 13, wherein the second polarizer is oriented generally transverse to the first polarizer.

15. The method of claim 13, wherein the second polarizer is oriented generally parallel to the first polarizer.

16. A method of measuring luminescence, comprising:

providing a sample plate including a plurality of sample wells containing a corresponding plurality of samples;

positioning a first sample well for measurement;

illuminating the first sample well with incident light of a first wavelength, where light is transmitted from the sample as a result of illumination with incident light, the transmitted light including light at the first wavelength and light at a luminescence wavelength shifted from the first wavelength;

filtering at least part of the transmitted light from the sample to extract light at the luminescence wavelength;

detecting the extracted luminescence light; and

measuring transmitted light at the first wavelength.

17. The method of claim 16, wherein the steps of measuring and detecting are conducted simultaneously.

18. The method of claim 16, wherein the step of measuring is configured to detect scattered incident light.

19. The method of claim 16 further comprising the step of computing a quantity related to absorbance of the sample based on the measured transmitted light at the first wavelength.

20. The method of claim 19 further comprising utilizing the computed quantity related to absorbance to correct the detected luminescence to a level that would be detected without absorbance.

21. The method of claim 16, wherein the step of illuminating includes the substep of polarizing the incident light.

22. The method of claim 21, wherein the step of measuring includes the substep of passing the transmitted light through a polarizer prior to measuring.

23. The method of claim 16, wherein the sample wells in the sample plate have a surface that scatters incident light.

24. The method of claim 16 further comprising the step of placing a blank in one of the sample wells for use in calibrating the measurement obtained in step of measuring.

25. An apparatus for measuring absorbance, comprising:

a light source;

a sensor positioned to measure a quantity proportional to the amount of light output by the light source;

a system for directing light from the light source to a measurement region;

a stage configured to hold a plate containing a plurality of sample wells adapted to hold samples, the stage further being configured to place a selected one of the samples in the sample wells into the measurement region;

a reflector disposed to reflect light that has passed through a sample back through the sample as second time;

a detector configured to receive reflected light emitted from a sample well in the measurement region;

a processor adapted to compute an output based on the amount of reflected light received by the detector and based on the amount of light output by the light source.

26. A system for measuring absorbance, comprising:

a light source;

a stage configured to hold a plate containing a plurality of sample wells adapted to hold samples, the stage further being configured to place a selected one of the samples in the sample wells into a measurement region;

a detector; and

an optical system adapted to direct light in a path from the light source through the sample at least twice and then to the detector, wherein the majority of the light reaching the detector has passed at least twice through the sample.

27. The system of claim 26, wherein the optical system includes a reflective surface disposed on a bottom of the sample wells.

28. A system for measuring absorbance, comprising:

a light source;

a sample holder adapted to hold a sample in a measurement position, the sample holder having an open top and a reflective interior surface;

an optical system configured to deliver light from the light source to the open top into the sample; and

a detector positioned to receive primarily light reflected off the reflective interior surface.

29. The system of claim 28, wherein the sample holder is opaque to light from the light source.

30. The system of claim 28, wherein the sample holder is transparent to light from the light source with a scattering interior surface.

31. The system of claim 28 further including a filter disposed between the sample and the detector to block luminescence light preferentially to light from the light source.

32. The system of claim 28, wherein the optical system includes a polarizer disposed between the light source and the sample and a polarizer disposed between the sample and the detector.

33. An instrument for detecting light, comprising

a stage for holding a sample plate with a plurality of sample wells;

an upper optical head having an optical axis perpendicular to the stage configured for epi-style light detection from a sample contained in a selected one of the sample wells in the sample plate on the stage; and

a lower optical head including a light detector configured for trans-style light detection through a bottom of the selected sample well, wherein the light detection in the lower optical head is positioned directly along the optical axis below the stage.

34. The instrument of claim 33 wherein the light detector is a photodiode.