Method and apparatus for calibrating positions of a plurality of first light sources on a first part

• US 6,466,325 B1
• Filed: 07/26/2000
• Issued: 10/15/2002
• Est. Priority Date: 07/08/1999
• Status: Expired due to Fees

• Current Assignee: BAE Systems Plc
• Original Assignee: BAE Systems Plc
• Inventors: Gooch, Richard M
• Primary Examiner(s): Font, Frank G.
• Assistant Examiner(s): Punnoose, Roy M.
• Application Number:
  US09/600,998
• Time in Patent Office: 811 Days
• Field of Search: 356/620, 356/622, 356/623, 356/614, 356/601, 356/602
• US Class Current: 356/620
• CPC Class Codes: G01B 11/002 for measuring two or more coordinates
• CPC Class Codes: G01B 21/042 Calibration or calibration artifacts G01B3/30, G01B9/02072 take precedence

Abstract

A method for calibrating position (11) of each light source in a first set of light sources (1) on a first part (2) when the first set (1) are attached thereto, including the steps of measuring first positions (3_i) of each of the light sources in the first set (1), each of said light sources (1) being either an active light source or an illuminable reflecting point, generating a first set of light sources to facet mapping (4), which first set to facet mapping (4) specifies which facet (9_i) of the first part (2) each of the light sources in the first set (1) are located on, estimating a transformation (5) that transforms the first positions (3_i) into a co-ordinate frame of the first part (7), thereby generating estimated positions (6_i) of each of the light sources in the first set (1) on the first part (2), which estimated positions (6_i) are in the co-ordinate frame of the first part (7), calculating (10a) first distances (8_i) from the estimated positions (6_i) to respective facets (9_i) of the first part (2), inputting the first distances (6_i) into a least mean squares (LMS) error function (10b) so as to generate a plurality of errors, and optimising said errors so as to locate the positions (11) of said first set of light sources on the first part.

Claims

1. A method for calibrating positions of a first set of light sources on a first part when the first set of light sources are attached thereto at unknown locations, including the steps of:

measuring first positions of the first set of light sources, each of which light sources is either an active light source or an illuminable reflecting point, and

matching the first positions to a data file geometrically describing the first part.

2. A method according to claim 1, in which matching of the first positions to a data file geometrically describing the first part includes:

generating a first light source to facet mapping, which first light source to facet mapping specifies which facet of the first part the first set of light sources are located on,

estimating a transformation that transforms the first positions into a co-ordinate frame of the first part, thereby generating estimated positions of the first light sources on the first part,

calculating first distances from the estimated positions to respective facets of the first part, and

optimising the first distances so as to locate the positions of said plurality of first light sources on the first part.

3. A method according to claim 1, in which each of the first distances corresponding to each of the plurality of said first set of light sources is given by taking an intersection between a vector normal to the local surface of the corresponding facet and the estimated position, which vector normal is derivable from a first data file containing a geometric definition of the first part.

4. Apparatus according to claim 1, wherein the first data file is a Computer Aided Design (CAD) model of the first part.

5. Apparatus for calibrating positions of a first set of light sources on a first part when the first set of light sources are attached thereto at unknown locations, said apparatus comprising:

measurement means for measuring first positions of the first set of light sources, and

matching means for matching the first positions to a data file geometrically describing the first part.

6. Apparatus according to claim 5, in which the matching means includes:

mapping means for generating a first light source to facet mapping,

transformation means for transforming the first positions onto the first part, a first data file stored on a computer readable disk, which first data file provides a geometric definition of the first part, and

a processor for processing first positions measured by the measurement means and for manipulating the same in conjunction with the mapping means, the transformation means and the first data file, so as to calibrate the positions of the first set of light sources on a first part when said first set of light sources are attached thereto.

7. Apparatus according to claim 5, wherein the measurement means includes:

an end-effector,

at least two imaging devices, each attachable to the end-effector and each configurable to image at least three non-coplanar facets of the first part,

at least two second light sources, each of said second light sources associated with a respective imaging device, and

communication links between the imaging devices and the processor for transmitting output signals indicative of the first positions.

8. Apparatus according to claim 7, wherein each of the imaging devices is a metrology sensor operable to create digitisable images.

9. Apparatus according to claim 8, wherein each of the first set of light sources is a reflective target.

10. Apparatus according to claim 9 wherein there are at least six first light sources positioned on three different facets of the first part.