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Self test for storage device

  • US 6,467,054 B1
  • Filed: 02/26/1999
  • Issued: 10/15/2002
  • Est. Priority Date: 03/13/1995
  • Status: Expired due to Term
First Claim
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1. A method of testing a storage device having an industry-standard interface, components and a non-volatile memory, the method comprising:

  • receiving a test command via the industry-standard interface from a host computer;

    the storage device performing a test on one or more of the components according to the test command;

    the storage device identifying the failed component and a corresponding failure checkpoint of the test being performed, if a failure is detected by the storage device; and

    said storage device providing a pass/fail indication to the host and storing results from said test in the non-volatile memory, said results including the failed component identification and the failure checkpoint if a failure was detected.

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