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Segmented compaction with pruning and critical fault elimination

  • US 6,467,058 B1
  • Filed: 09/03/1999
  • Issued: 10/15/2002
  • Est. Priority Date: 01/20/1999
  • Status: Expired due to Fees
First Claim
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1. A method of generating a vector set, said vector set being used for testing sequential circuits, said method comprising:

  • a) selecting a plurality of fault models;

    b) identifying a fault list each for each of said plurality of fault models;

    c) identifying a vector set each for each of said fault lists;

    d) selecting a tolerance limit each for each of said fault lists, thereby each fault model having an associated fault list, an associated vector set and an associated tolerance limit;

    e) compacting each of said vector set such that the compacted vector set identifies all the faults in the associated fault list or a drop in fault list coverage is within the associated tolerance limit; and

    f) creating a vector set by combining all vector sets compacted in step e.

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