Manufacturing process automation system using a file server and its control method

• US 6,473,664 B1
• Filed: 04/27/1999
• Issued: 10/29/2002
• Est. Priority Date: 04/27/1998
• Status: Active Grant

• Current Assignee: Samsung Display Company Limited (Samsung Electronics Co. Ltd.)
• Original Assignee: Samsung Electronics Co. Ltd.
• Inventors: Lee, Sang-Hyun, Byun, Sung-Jun
• Primary Examiner(s): Picard, Leo
• Assistant Examiner(s): CABRERA, ZOILA E
• Application Number:
  US09/299,739
• Time in Patent Office: 1,281 Days
• Field of Search: 700/110, 700/105, 700/113, 700/115, 700/116, 716/4, 702/185
• US Class Current: 700/110
• CPC Class Codes: G05B 19/41865 characterised by job scheduling, process planning, material flow
• CPC Class Codes: G05B 2219/31002 Computer controlled agv conveys workpieces between buffer and cell
• CPC Class Codes: G05B 2219/31344 Element, file server
• CPC Class Codes: G05B 2219/32129 Select program for specified machine from library, file server
• CPC Class Codes: Y02P 90/02 Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
• CPC Class Codes: Y02P 90/60 Electric or hybrid propulsion means for production processes

Abstract

In an automation system, a plurality of machines are connected to a file server via a network and the job result data produced by the machines, are shared by the file server. The job result data processed from a machine (for example, a tester) are stored in the file server. Another machine (for example, a repairer) can execute a job by using the above job result data.

Claims

1. An automation system comprising:

a plurality of machines;

at least one file sever connected to the machines by a network and stores a job result data on jobs executed by the machines such that the machines may share the job result data, wherein the file server stores the job result data corresponding to all the machines and data summarizing the job result data corresponding to each of the machines;

a plurality of machine severs respectively connected to the machines and controls the machine connected thereto; and

a host connected to the machine servers by the network, having job information required for the machines and providing the job information to the machine servers,

wherein the automation system is used in the fabrication of a liquid crystal display.

2. The automation system according to claim 1 further comprising a user interface enabling a user to directly use the job result data stored in the file server.

3. The automation system according to claim 1 further comprising an automatic guided vehicle (AGV) transferring a work piece to each machine.

4. The automation system according to claim 3 further comprising an AGV controller connected to the host via a cable and controlling the AGV to transfer the work piece according to a command from the host.

5. The automation system according to claim 3, wherein the AGV puts a plurality of work pieces in a moving box and transfers the moving box and the moving box has a box identifier.

6. The automation system according to claim 5, wherein the machine comprises:

a work station for processing a job on the work piece;

a plurality of job waiting queue for keeping the work piece before or after processing the job on the work piece; and

a moving robot for transferring the work piece from the job waiting queue to the work station or vice versa.

7. The automation system according to claim 6, wherein the work station

includes a first reader for identifying an identifier of the work piece and

wherein the job waiting queue includes a second reader for identifying the box identifier and a communication device for communicating with the AGV.

8. The automation system according to claim 7, wherein the machine further comprises a work control screen for enabling a user to view the operation and operate the machines.

9. The automation system according to claim 8, wherein the work piece is a wafer and the moving box is a cassette.

10. The automation system according to claim 8, wherein the work piece is a glass and the moving box is a cassette.

11. The automation system according to claim 9, wherein the machines comprise a tester and a repairer.

12. An automation system of a micro electronic device, comprising:

a plurality of machines including a tester for testing a substrate with patterns formed thereon, wherein the tester tests the substrate and produces the test result data, which consists of unprocessed raw data and processed summary data;

at least one file server connected to the machines via a network, storing the job result data on the substrate processed by each machine such that the machines may share the job result data, wherein the file server stores unprocessed raw data corresponding to all the machines and processed summary data corresponding to each of the machines;

a plurality of machine servers including a tester server, wherein each machine server connects to a corresponding machine and controls the machine connected thereto; and

a host with a database connected to the machine servers via a network, providing the machine servers with job information required for the machines retrieved from the database on the key of an identifier of the substrate, wherein the substrate is a glass.

13. The automation system of a micro electronic device according to claim 12, further comprising a user interface enabling a user to directly use the job result data stored in the file server.

14. The automation system of a micro electronic device according to claim 12, further comprising an automatic guided vehicle (AGV) controlled by the host and transferring the substrate to each machine.

15. The automation system of a micro electronic device according to claim 14, further comprising an AGV controller connected to the host through a cable, receives a command from the host and controlling the AGV to transfer the substrate according to a command received from the host.

16. The automation system of a micro electronic device according to claim 12, wherein the machines further comprise a repairer for repairing the substrate based on the job result data processed by the tester.

17. The automation system of a micro electronic device according to claim 16, wherein the tester tests the substrate and stores test result data to the file server, and the repairer reads the test result data from the file server, utilizes the test result data in repairing the substrate and stores repair result data to the file server.

18. The automation system of a micro electronic device according to claim 17, wherein the tester tests the substrate and produces the test result data, which consist of unprocessed raw data and processed summary data, wherein the raw data are stored in the file server and the summary data are transmitted to the tester server.

19. The automation system of a micro electronic device according to claim 17, wherein the raw data includes coordinate data on defects and defect contents.

20. The automation system of a micro electronic device according to claim 12, further comprising a viewer enabling a user to directly examine the test result on the substrate using the test result data stored in the file server.

21. The automation system of a micro electronic device according to claim 20, wherein the test result data includes coordinate data on defects and the viewer moves according to the coordinate data automatically for the user to examine defect contents.

22. The automation system of a micro electronic device according to claim 12, wherein a TCP/IP method is used to connect the machines and the file server, the file server and the machine servers and the machine servers and the host.

23. The automation system of a micro electronic device according to claim 12, wherein a SECS communication method is used to connect the machines and the machine servers.

24. The automation system of a micro electronic device according to claim 12, wherein the substrate is a wafer.

25. A method for manufacturing a liquid crystal display (LCD) to control an automation system in an assembly line, comprising the steps of:

(a) recognizing a work piece loaded in a first machine;

(b) receiving a job command from a controller to have the first machine execute the work on the work piece;

(c) reading a first job result data produced from the previous machine and necessary for the first machine, from a file server, wherein the file server connects to a plurality of machines including the first machine on line, and stores the job result data produced from the machines;

(d) executing a job on the work piece in the first machine by using the first job result data; and

(e) storing a second job result data and data summarizing the second job result data produced in the first machine to the file server, wherein the work piece is a glass.

26. The method according to claim 25, wherein the previous machine is a tester and the first machine is a repairer.

27. The method according to claim 26, wherein the work piece is a wafer.

28. A method for manufacturing a liquid crystal display (LCD) to control an automation system including a plurality of machines, each performing a job on a substrate, a controller controlling the machines and an automatic guided vehicle (AGV) transferring the substrate to each machine automatically, comprising the steps of:

(a) loading the substrate to a first machine;

(b) executing a job on the substrate in the first machine, and storing a first job result data and data summarizing the first job result data produced by the first machine to a file server wherein the file server is connected to the machines and stores job result data and data summarizing the job result data produced by the machines to enable the machines to share the job result data for sharing the first job result data with the machines;

(c) unloading the substrate from the first machine;

(d) transferring and loading the substrate to a second machine;

(e) reading the first job data from the file server before operation of the second machine, executing a job on the substrate in the second machine by using the first job result data produced from the first machine and storing a second job result data to the file server after operation of the second machine; and

(f) unloading the substrate from the second machine, wherein the substrate is a glass.

29. The method according to claim 28, wherein the steps (a) further comprises the steps of:

(i) transmitting a message for the first machine requesting the substrate to controller;

(ii) finding out the substrate to be processed in the first machine by retrieving an information in a database included in the controller and ordering the AGV to load the substrate to the first machine; and

(iii) reading an identifier of the substrate if the substrate loads to the first machine and informing an end of loading of the controller.

30. The method according to claim 29, wherein the steps (b) further comprises the steps of:

(i) determining if the controller is workable according to the information on the key of the identifier of the substrate, if workable, ordering job start command with the information to the first machine; and

(ii) executing a job on the substrate, storing the first job result data to the file server and informing an end of job of the controller.

31. The method according to claim 30, wherein the steps (c) further comprises the steps of:

(i) reading the first job result data from the file server, processing the first job result data and ordering an unloading of the substrate to the AGV;

(ii) unloading the processed substrate from the first machine; and

(iii) informing an end of unloading of the controller if unloading is over.

32. The method according to claim 31, wherein the steps (d) further comprises the steps of:

(i) informing the second machine of location where the first job result data and a second job result data to be produced for the second machine are stored; and

(ii) executing a job by reading the first job result data from the file server and storing the second job result data to the file server.

33. The method according to claim 32, wherein the first machine is a tester and the second machine is a repairer.

34. The method according to claim 33, wherein the substrate is a wafer.