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Method for reading semiconductor die information in a parallel test and burn-in system

  • US 6,477,095 B2
  • Filed: 12/28/2000
  • Issued: 11/05/2002
  • Est. Priority Date: 12/28/2000
  • Status: Expired due to Fees
First Claim
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1. A method for determining memory device identification comprising the steps of:

  • invoking a serial output from n identification fuses of a plurality of devices, the serial output for identifying the devices;

    sampling the serial output every nth bit to determine a fuse state for a fuse of each device;

    repeating the sampling for all n fuses to acquire fuse data for all devices; and

    determining a pass/fail string corresponding to the sampled output, the pass/fail string being employed to identify through a parallel test and burn-in system, wherein the sampled output is on an enabled data line also used for a burn-in test wherein other data lines are disabled for avoiding bus contention.

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