Input sub-ranging converter system for sampling semiconductor temperature sensors

• US 6,480,127 B1
• Filed: 01/16/2002
• Issued: 11/12/2002
• Est. Priority Date: 09/27/2001
• Status: Active Grant

• Current Assignee: National Semiconductor Corporation (Texas Instruments, Inc.)
• Original Assignee: National Semiconductor Corporation (Texas Instruments, Inc.)
• Inventors: Aslan, Mehmet
• Primary Examiner(s): Tokar, Michael
• Assistant Examiner(s): Mai, Lam T.
• Application Number:
  US10/051,349
• Time in Patent Office: 300 Days
• Field of Search: 341/118, 341/119, 341/120, 341/136
• US Class Current: 341/119
• CPC Class Codes: G01K 7/01 using semiconducting elements having PN junctions G01K7/02, G01K7/16, G01K7/30 take precedence

Abstract

A converter system for a temperature sensor includes a programmable current source, a digital-to-analog converter, a summer, and an analog-to-digital converter. The temperature sensor provides a measurement voltage in response to application of a bias current. The programmable current source selectively provides two different currents to the temperature sensor such that the temperature sensor provides two measurement voltages during a given temperature measurement. The digital-to-analog converter (DAC) provides an intermediate voltage that corresponds to an approximation of a voltage between the two voltages. A summer is configured to produce an offset measurement in response to the intermediate voltage and the measurement voltage. The analog-to-digital converter (ADC) receives the offset measurement voltage and produces a conversion code. Offsetting the measurement voltage reduces the dynamic range requirements of the ADC such that substantially a full input range of the ADC is utilized.

Claims

1. A method of sampling a response voltage from a temperature sensor that includes a PN junction, the method comprising:

generating an offset voltage in response to a digital code;

applying a first bias current to the temperature sensor such that the PN junction produces a first PN junction voltage, and the temperature sensor produces a first response voltage;

combining the offset voltage and the first response voltage to produce a first signal;

applying a second bias current to the temperature sensor such that the PN junction produces a second PN junction voltage, and the temperature sensor produces a second response voltage, wherein the second bias current is different than the first bias current;

combining the offset voltage with the second response voltage to produce a second signal; and

converting the first and second signals to digital codes using a converter that has an input voltage range, wherein the range of response voltages for the temperature sensor is greater than the input voltage range of the converter.

2. The method of claim 1 wherein the offset voltage is within 72.5 mV of the first response voltage.

3. The method of claim 1 wherein the difference between the offset voltage and the first response voltage is between one and two quantization levels of the device used to generate the offset voltage.

4. The method of claim 1 wherein the digital code is determined by sampling the first response voltage, applying a digital code to a digital-to-analog converter, comparing an output voltage from the digital-to-analog converter to the first response voltage, and changing the digital code until a conversion is achieved.

5. The method of claim 1 wherein the digital code is determined by sampling the first response voltage, sampling the second response voltage, averaging the samples of the first and second response voltages to produce a sample average, and using a value of the sample average as the digital code.

6. The method of claim 1 wherein the first bias current is greater than the second bias current.

7. The method of claim 6 wherein the offset voltage is less than the first response voltage.

8. The method of claim 6 wherein the offset voltage is greater than the second response voltage.

9. The method of claim 6 wherein the offset voltage is less than the second response voltage.

10. The method of claim 6 wherein the offset voltage is greater than the first response voltage.

11. The method of claim 1 wherein the first bias current is an integer multiple of the second bias current.

12. The method of claim 1 further comprising the step of applying a low-pass filter to the first and second response voltages.

13. The method of claim 1 further comprising the step of calculating a temperature value using the digital codes that are associated with the first and second signals.

14. An apparatus for sampling response voltages from a temperature sensor that includes a PN junction, comprising:

a means for generating an offset voltage in response to a digital code;

a means for applying a first bias current that is arranged to apply a first bias current to the PN junction such that the PN junction produces a first PN junction voltage, and the temperature sensor produces a first response voltage;

a means for combining the offset voltage that is arranged to combine the first response voltage with the offset voltage to produce a first signal;

a means for applying a second bias current that is arranged to apply a second bias current to the PN junction such that the PN junction produces a second PN junction voltage, and the temperature sensor produces a second response voltage, wherein the first bias current is different from the second bias current; and

a means for converting that is arranged to convert the first and second signals to digital codes, wherein the means for converting has an input voltage range that is less than a range of response voltages associated with the temperature sensor.

15. The apparatus of claim 14, wherein the difference between the offset voltage and the first response voltage is within at least one quantization levels of the device used to generate the offset voltage.

16. The apparatus of claim 14, further comprising a means for filtering that is arranged to provide low pass filtering to the first and second response voltages.

17. The apparatus of claim 14, further comprising means for calculating a temperature value using the digital codes that are associated with the first and second signals.

18. An apparatus for sampling response voltages from a temperature sensor that includes a PN junction, comprising:

a programmable current source that is configured to provide one of a first and second currents when selected to the temperature sensor such that the response voltage from the temperature sensor corresponds to a first voltage when the first current is selected and the response voltage corresponds to a second voltage when the second current is selected;

a controller that is configured to select the first and second currents;

an intermediate voltage selector that is configured to provide an offset voltage during a measurement mode;

a summer that is configured to receive the response voltage and the offset voltage, and provide an offset response voltage by subtracting the offset voltage from the response voltage; and

an analog-to-digital converter that is configured to convert the offset response voltage into a digital code during a measurement mode, wherein the analog-to-digital converter has an input voltage range that is less than a range of response voltages associated with the temperature sensor.

19. The apparatus of claim 18, the intermediate voltage selector further comprising:

a digital-to-analog converter that is arranged to produce the offset voltage in response to a DAC code that is received from the controller during a pre-measurement mode; and

a comparator that is arranged to compare the offset voltage to the response voltage such that the digital-to-analog converter and the comparator cooperate with the controller to operate as an analog-to-digital converter during the pre-measurement mode.

20. The apparatus of claim 18, further comprising a temperature calculator that is configured to calculate a temperature value from digital codes that are received from the analog-to-digital converter.

21. The apparatus of claim 18, wherein the controller is arranged to selectively activate the programmable current source such that the programmable current source applies a multiplicity of the first and second currents in a sequence during the measurement mode.

22. The apparatus of claim 18, wherein the sequence is one of a random sequence, a pseudo-random sequence, a regular sequence followed by a reverse sequence, and an over-sampling sequence.