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Condition assessment of nonlinear processes

  • US 6,484,132 B1
  • Filed: 03/07/2000
  • Issued: 11/19/2002
  • Est. Priority Date: 03/07/2000
  • Status: Expired due to Fees
First Claim
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1. A method for monitoring a nonlinear process, the method comprising:

  • acquiring a set of channel data corresponding to at least one sensor for monitoring the process;

    selecting cutsets of data from the set of channel data to form a basecase;

    filtering artifacts from the selected cutsets of data to produce cutsets of artifact-filtered data for the basecase;

    computing from the artifact-filtered data for each cutset in the basecase a set of connected phase space (PS) data comprising at least a first PS state and a second PS state connected to the first PS state;

    computing distribution functions from the connected PS data for at least five cutsets of artifact-filtered data from the basecase;

    computing at least one measure of dissimilarity (V) between a) a distribution function for a first one of the cutsets of artifact-filtered data from the basecase and b) a distribution function for a second one of the cutsets of artifact-filtered data from the basecase;

    repeating the computation of the measure of dissimilarity (V) between distribution functions for non-identical pairings (i,j) of cutsets in the basecase until at least ten values (Vij) are computed for the measure of dissimilarity (V);

    computing an average (V) and a corresponding sample standard deviation (σ

    v) from the at least ten values of dissimilarity (Vij) for the basecase;

    computing a χ

    2 statistic (Σ

    (Vij

    V)2

    2) for the at least one measure of dissimilarity (V) for the cutsets of artifact-filtered data from the basecase;

    identifying any outlier cutsets of artifact-filtered data from the basecase;

    removing the outlier cutsets from the basecase; and

    recomputing the χ

    2 statistic and testing for outlier cutsets until no outlier cutset is identified.

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