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Testing system for evaluating integrated circuits, a testing system, and a method for testing an integrated circuit

  • US 6,484,279 B2
  • Filed: 01/23/2002
  • Issued: 11/19/2002
  • Est. Priority Date: 01/21/1998
  • Status: Expired due to Fees
First Claim
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1. A testing system for evaluating a circuit under test, the system comprising:

  • a test board having a plurality of receptacles, at least one of which is configured to receive the circuit under test and to supply power thereto;

    test interface circuitry coupled to the receptacles, the test interface circuitry including a transmitter and a receiver; and

    an interrogator unit having a radio communication range extending to the test interface circuitry, the interrogator unit being configured to send commands via radio communication through the receiver to the test interface circuitry to exercise the circuit under test and to receive responses to the commands from the transmitter via radio communication.

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