Semiconductor device simulating apparatus and semiconductor test program debugging apparatus using it
First Claim
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1. A semiconductor device simulating apparatus for simulation operation as if an actual DUT were present, comprising:
- parameter setting unit for setting various parameters to be used for measuring a current value or a voltage value that varies depending on an internal resistance of a DUT;
input unit for inputting a test signal for as would be applicable to said actual DUT; and
simulating unit for simulating and outputting a current value or a voltage value that varies depending on an internal resistance of said actual DUT in accordance with said parameters and said test signal as if said actual DUT were present, without requiring said actual DUT to be present.
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Abstract
Herein disclosed is a semiconductor device simulation apparatus which is set the various parameters to be used for measuring a current value and a voltage value that varies depending on the internal resistance of a DUT, and simulates a current value or a voltage value that varies depending on an internal resistance of a DUT in accordance with various parameters and a prescribed test signal when receiving the test signal. Also disclosed is a semiconductor test program debugging apparatus using such a semiconductor device simulating apparatus.
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Citations
9 Claims
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1. A semiconductor device simulating apparatus for simulation operation as if an actual DUT were present, comprising:
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parameter setting unit for setting various parameters to be used for measuring a current value or a voltage value that varies depending on an internal resistance of a DUT;
input unit for inputting a test signal for as would be applicable to said actual DUT; and
simulating unit for simulating and outputting a current value or a voltage value that varies depending on an internal resistance of said actual DUT in accordance with said parameters and said test signal as if said actual DUT were present, without requiring said actual DUT to be present. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A semiconductor test program debugging apparatus comprising:
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tester emulating unit for setting various parameters to be used for measuring a current value or a voltage value that varies depending on an internal resistance of an actual DUT, and for emulating an operation of a semiconductor test apparatus by generating a simulatory test signal as would be applicable to an actual DUT based on a semiconductor test program;
device simulating unit receiving said parameters and said test signal, for simulating and outputting a current value or a voltage value that varies depending on an internal resistance of said actual DUT in accordance with said parameters and said test signal; and
debugging unit for debugging said semiconductor test program based on an output of said device simulating unit.
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Specification