Method and apparatus for testing image sensing circuit arrays

• US 6,489,798 B1
• Filed: 03/30/2000
• Issued: 12/03/2002
• Est. Priority Date: 03/30/2000
• Status: Expired due to Term

• Current Assignee: Harusaki Technologies LLC (Intellectual Ventures LLC)
• Original Assignee: Symagery Microsystems, Inc. (Motorola Solutions, Inc.)
• Inventors: Little, Tom, McDonald, Ron, Chamberlain, George, Scott-Thomas, John
• Primary Examiner(s): Sherry, Michael
• Assistant Examiner(s): PATEL, PARESH H
• Application Number:
  US09/538,905
• Time in Patent Office: 978 Days
• Field of Search: 324/765, 324/770, 324/766, 324/767, 250/208.1, 348/308
• US Class Current: 324/762.01
• CPC Class Codes: H04N 17/002 for television cameras
• CPC Class Codes: H04N 25/76 Addressed sensors, e.g. MOS or CMOS sensors
• CPC Class Codes: H04N 3/155 Control of the image-sensor operation, e.g. image processing within the image-sensor

Abstract

A method and apparatus for testing an image sensor array such as a C-MOS imager which has sensing circuits arranged in rows and columns and wherein the sensing circuits include photosensitive devices is described. A reset voltage is applied to the photosensitive device in each of the sensor circuits such that at least adjacent circuits are reset to different voltage levels. The voltage on each photosensitive device is detected and compared to an expected level to determine if and where any faults may exist in the sensing circuits or lines in the array. A different reset voltage may be applied to each of the sensor circuits, however in one embodiment, a supply with only two voltage levels may be used. One voltage level is applied to every second column to provide a supply voltage to the photosensitive devices and to every second row to generate a reset enable signal for the photosensitive devices. The second voltage level is applied to the remaining columns and rows resulting in different reset voltage levels on adjacent sensing circuits.

Claims

1. Apparatus for testing an image sensor array having sensing circuits arranged in rows and columns wherein the sensing circuits each include a photosensitive device, comprising:

means for resetting the voltage of the photosensitive device in each of the sensor circuits such that at least adjacent sensor circuits are reset to different voltage levels; and

means for sensing the voltage on each of the photosensitive devices to determine if each voltage is at an expected level.

2. Image sensor array testing apparatus as claimed in claim 1 which comprises:

means for comparing the sensed voltages from the photosensitive devices to expected voltage levels to identify faulty components in the sensor array.

3. Image sensor array testing apparatus as claimed in claim 1 which comprises:

means for comparing the sensed voltages from the photosensitive devices to expected voltage levels to determine faulty sensor circuits.

10. A method as claimed in claim 1 wherein step (a) includes:

i. applying common reset voltages to sensor circuits in the columns such that adjacent columns receive different reset voltage amplitudes; and

ii. applying common enable voltage signals to the sensor circuits in the rows such that adjacent rows receive different enable signal amplitudes.

4. Apparatus for testing an image sensor array having sensing circuits arranged in rows and columns comprising:

a first set of conductive lines for providing different reset voltages to adjacent columns of sensing circuits;

a second set of conductive lines for providing different voltage reset enable signals to adjacent rows of sensing circuits;

a third set of conductive lines for providing access signals to rows of sensing circuits for detecting the reset voltages on the sensing circuits; and

a fourth set of lines connected to columns of sensing circuits to receive the detected reset voltages.

5. Image sensor array testing apparatus as claimed in claim 4 which comprises:

comparator means for comparing the detected reset voltages to expected voltage levels to identify faulty components in the sensor array.

6. Image sensor array testing apparatus as claimed in claim 4 which comprises:

means coupled to each of the second set of conductive lines for generating the voltage reset enable signals; and

first voltage supply means coupled to each of the voltage reset enable signal generating means for supplying different voltages to generating means in adjacent rows.

7. Image sensor array testing apparatus as claimed in claim 6 which comprises:

second voltage supply means for supplying a first voltage level V₁ to alternate lines in the first set of conductive lines and a second voltage level V₂ to the remaining lines in the first set of conductive lines; and

wherein;

the first voltage supply means is adapted to supply a third voltage level V₃ to alternate voltage reset signal generating means and a fourth voltage level V₄ to the remaining voltage reset signal generating means.

8. Image sensor array testing apparatus as claimed in claim 6 wherein the first voltage supply means is adapted to supply a first voltage level V₁ to alternate lines in the first set of conductive lines and to alternate voltage reset signal generating means, and a second voltage supply means is adapted to supply a second voltage level V₂ to the remaining lines in the first set of conductive lines and to the remaining voltage reset signal generating means.

9. A method of testing an image sensor array having sensor circuits arranged in rows and columns, comprising the steps of:

a. resetting the voltage of a photosensitive device in each of the sensor circuits such that adjacent sensor circuits are reset to different voltage levels; and

b. sensing the voltage on each of the photosensitive devices to determine if each voltage is at an expected level.

11. A method as claimed in claim 9 wherein step (b) includes:

i. sensing the voltage on the columns of sensor circuits in parallel and the rows of sensor circuits sequentially.

12. A method as claimed in claim 9 and further comprising the step of:

c. comparing the sensed voltage from the photosensitive devices to expected values to determine faulty sensor circuits.

13. A method as claimed in claim 9 and further comprising the step of:

c. comparing the sensed voltage from the photosensitive devices to expected values to determine faulty components in the sensor array.

14. A method of testing an image sensor array having sensor circuits arranged in rows and columns and wherein each sensor circuit includes a photosensitive device, a first switch for applying a reset voltage from a voltage reset line to the photosensitive device under the control of a reset signal, a second switch for sensing the voltage on the photosensitive device under the control of an enable signal and applying it to a data line, the method comprising the steps of:

a. resetting the voltage on the photosensitive device in each of the sensor circuits such that the photosensitive devices in adjacent sensor circuits are reset to different voltage levels; and

b. sensing the voltage on each of the photosensitive devices to determine if each voltage is at an expected level.

15. A method as claimed in claim 14 wherein step (a) includes:

i. applying common reset voltages to sensor circuits in the columns such that adjacent columns receive different reset voltage amplitudes; and

ii. applying common enable voltage signals to the sensor circuits in the rows such that adjacent rows receive different enable signal amplitudes.

16. A method as claimed in claim 14 wherein step (b) includes:

i. sensing the voltage on the columns of sensor circuits in parallel and the rows of sensor circuits sequentially.

17. A method as claimed in claim 14 and further comprising the step of:

c. comparing the sensed voltage from the photosensitive devices to expected values to determine faulty sensor circuits.

18. A method as claimed in claim 14 and further comprising the step of:

c. comparing the sensed voltage from the photosensitive devices to expected values to determine faulty components in the sensor array.