Apparatus and method for detecting defects in a multi-channel scan driver

• US 6,492,802 B1
• Filed: 07/14/2000
• Issued: 12/10/2002
• Est. Priority Date: 07/14/2000
• Status: Expired due to Term

• Current Assignee: GE Medical Systems Global Technology Company LLC (GE Healthcare Technologies, Inc.)
• Original Assignee: GE Medical Technology Services, Inc. (General Electric Company)
• Inventors: Bielski, Scott A.
• Primary Examiner(s): KARLSEN, ERNEST F
• Application Number:
  US09/616,869
• Time in Patent Office: 879 Days
• Field of Search: 324/765, 324/158.1, 324/537, 324/770, 714/726, 714/724
• US Class Current: 324/537
• CPC Class Codes: G01R 31/2829 Testing of circuits in sensor or actuator systems testing of apparatus for measuring electric or magnetic variables G01R35/00; testing of indicating or recording apparatus G01D; in airbag systems B60R21/0173; checking gas analysers G01N33/007; monitoring or fail-safe circuits for electromagnets H01F7/1844
• CPC Class Codes: H04N 17/002 for television cameras

Abstract

A technique is described for detecting defects such as short circuits in a device such as a discrete pixel detector used in a digital x-ray system. The technique employs test circuits associated with each row driver of the detector. The test circuits are enabled by a test enable input signal, and the row driver sequentially enables the rows of the detector, along with the individual test circuits. In a test sequence, output signals from the row test circuits are monitored to identify whether a defect, such as a short circuit, is likely to exist in the row or row driver. The test circuitry adds only minimal area and complexity to the row driver function, providing a high degree of test coverage at a low cost, with minimal likelihood of test circuitry-induced failures.

Claims

1. A test circuit for a discrete picture element detector, the detector including row and column electrodes coupled to drive circuitry for sampling signals generated at locations of the detector, the test circuit comprising:

at least two row test circuit modules for enabling rows of the detector;

a first test enable input configured to apply a first test enable signal and coupled to a bias generator circuit, the bias generator circuit coupled to a positive bias and ground and configured to produce a second test enable signal;

a second test enable input configured to receive the second test enable signal and coupled to the test circuit modules for enabling test sequences for corresponding rows; and

a comparison module coupled to the test circuit modules and to the first test enable input to compare output signals generated by the test circuit modules during the test sequences to reference signals.

2. The test circuit of claim 1, wherein each of the test circuit modules includes a set of solid state devices coupled to row driver circuitry for a respective row of the detector.

3. The test circuit of claim 2, wherein the set of solid state devices are coupled between high and low sides of a bias supply bus.

4. The test circuit of claim 1, wherein the second test enable signal is a negative logic signal.

5. The test circuit of claim 1, wherein the test circuit modules and the test enable are disposed on a common support with row driver circuitry.

6. A row control device for controlling operation of a plurality of rows of a discrete picture element detector, the device comprising:

row driver circuitry having a plurality of row driver modules configured to be coupled to a plurality of row electrodes for respective rows of the detector, and to apply enable signals for sampling signals generated at locations on the detector; and

row test circuitry disposed on a common device with the row driver circuitry, the row test circuitry including a row test module for each row output of the row driver module, a first test enable input configured to apply a first test enable signal and coupled to a bias generator circuit, the bias generator circuit coupled to a positive bias and ground and configured to produce a second test enable signal, a second test enable input configured to receive the second test enable signal and coupled to the test circuit modules for enabling test sequences for corresponding rows, and at least one comparison module coupled to the test module and to the test enable to compare signals generated during the test sequences to reference signals.

7. The device of claim 6, wherein the test enable is coupled to a plurality of test modules for enabling tests of a corresponding plurality of rows of the detector.

8. The device of claim 6, wherein the device includes at least two sets of row driver circuitry and respective row test circuitry.

9. The device of claim 6, wherein each test module includes a plurality of solid state devices coupled between high and low sides of a bias supply bus.

10. The device of claim 6, wherein the second test enable signal is a negative logic signal.

11. The device of claim 9, wherein one of the solid state devices of each test module is coupled to a driver output line of a respective row driver circuit.

12. A discrete picture element detector system for a digital x-ray system, the detector system comprising:

a detector panel including rows and columns of electrodes and detection circuitry at row and column crossings for generating signals in response to receipt of radiation during an x-ray examination;

column driver circuitry coupled to the column electrodes for sampling the signals;

row driver circuitry coupled to the row electrodes for enabling sampling of the signals; and

driver test circuitry coupled to the row driver circuitry, the test circuitry including a plurality of row test modules for enabling rows of the detector, a first test enable input configured to apply a first test enable signal and coupled to a bias generator circuit, the bias generator circuit coupled to a positive bias and ground and configured to produce a second test enable signal, a second test enable input configured to receive the second test enable signal and coupled to the test circuit modules for enabling test sequences for corresponding rows, and a comparison module coupled to the test modules and to the test enable to compare signals generated during the test sequences to reference signals.

13. The detector system of claim 12, wherein row driver circuitry for a series of rows of the detector are provided on a common circuit module with respective driver test circuitry.

14. The detector system of claim 13, comprising a plurality of circuit modules, each circuit module including row driver circuitry and driver test circuitry for a portion of the rows of the detector panel.

15. The detector system of claim 12, wherein the driver test circuitry includes an individual test module for each row of the detector panel.

16. The detector system of claim 12, wherein each test module includes a plurality of solid state devices coupled between high and low sides of a supply bus.

17. The detector system of claim 16, wherein each second test enable signal is coupled to a plurality of test modules and to the low side of the supply bus.

18. The detector system of claim 16, wherein one of the solid state devices of each test module is coupled to a driver output line of a respective row driver circuit.

19. A test circuit comprising:

a first test enable input;

a first bias circuit coupled to the first test enable input, the first test enable input configured to apply a first test enable signal, and the first bias circuit configured to produce a second test enable signal;

a second bias circuit coupled to the first test enable input, the first test enable input configured to apply a first test enable signal, and the second bias circuit configured to produce a third test enable signal;

a first test module coupled to the second test enable signal and configured to test for shorts in a plurality of row electrodes of a detector, the shorts being one of a short from a first row to a second row, a short from a first row to ground and a short from a first row to a negative bias supply; and

a second test module coupled to the third test enable signal and configured to test for shorts in a plurality of row electrodes of a detector, the shorts being one of a short from a first row to a second row, a short from a first row to ground, and a short from a first row to a positive bias supply.

20. The test circuit of claim 19, wherein the first bias circuit is coupled to a positive bias supply and a negative bias supply.

21. The test circuit of claim 19, wherein the second test enable signal is a positive logic signal.

22. The test circuit of claim 19, wherein the second bias circuit is coupled to a positive bias supply and ground.

23. The test circuit of claim 19, wherein the third test enable signal is a negative logic signal.

24. The test circuit of claim 19, comprising a NAND gate coupled between the first test module and the second test module.

25. A method for detecting defects in a discrete picture element detector system, the detector system including a test circuit as well as a detector panel including rows and columns of electrodes and detection circuitry at row and column crossings for generating signals, column driver circuitry coupled to the column electrodes for sampling the signals, and row driver circuitry coupled to the row electrodes for enabling sampling of the signals, the method comprising the steps of:

pre-enabling a plurality of rows to a positive bias ON-state;

individually and sequentially driving each row to a negative bias OFF-state; and

comparing output signals from a test circuit with a reference signal to determine whether each test enabled row is defective.

26. The method of claim 25, wherein the test sequence for the plurality of rows is pre-enabled by a single test enable signal.

27. The method of claim 25, wherein a row test circuit is provided for each row of the detector.

28. The method of claim 27, wherein each row test circuit is coupled to a respective row driver circuit and is pre-enabled by an output signal.

29. The method of claim 27, wherein each row test circuit includes a plurality of solid state devices coupled between high and low sides of a supply bus.

30. The method of claim 25, wherein the reference signal is a test enable signal applied to the test enable circuit.