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Semiconductor physical quantity sensor

  • US 6,494,096 B2
  • Filed: 03/09/2001
  • Issued: 12/17/2002
  • Est. Priority Date: 03/16/2000
  • Status: Active Grant
First Claim
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1. A semiconductor physical quantity sensor comprising:

  • a supporting substrate;

    a movable portion supported on the supporting substrate and having a weight portion movable in a displacement direction, and first movable electrodes and second movable electrodes provided on both sides of the weight portion and protruding from the weight portion perpendicularly to the displacement direction;

    a fixed portion provided on the supporting substrate and electrically divided from the moving portion by a trench, the fixed portion having first fixed electrodes and second fixed electrodes respectively protruding toward the movable portion and extending in parallel with the first movable electrodes and second movable electrodes and defining first detection intervals and second detection intervals at the both sides of the weight portion;

    wherein an applied physical quantity is detected based on changes in capacitances generated between the first movable electrodes and the first fixed electrodes, and between the second movable electrodes and the second fixed electrodes when the first movable electrodes and the second movable electrodes move responsive to the applied physical quantity;

    wherein an electrostatic attracting force generated between the first movable electrodes and the first fixed electrodes acts in a direction opposite to that in which an electrostatic attracting force generated between the second movable electrodes and the second fixed electrodes acts;

    wherein the first movable electrodes or the first fixed electrodes have protrusions protruding in parallel with the displacement direction from opposing side faces of the first movable electrodes or the first fixed electrodes, and facing in the displacement direction of the movable portion to define the first detection intervals interposed therebetween.

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