Dual-interferometer method for measuring bending of materials

• US 6,495,819 B1
• Filed: 08/08/2000
• Issued: 12/17/2002
• Est. Priority Date: 08/08/2000
• Status: Active Grant

• Current Assignee: Southwest Research Institute
• Original Assignee: Southwest Research Institute
• Inventors: Cerwin, Stephen A., Chang, David B.
• Primary Examiner(s): Allen, Stephone
• Assistant Examiner(s): HILL, BRADFORD K
• Application Number:
  US09/634,553
• Time in Patent Office: 861 Days
• Field of Search: 250/227.16, 250/227.19, 250/227.27, 356/35.5, 356/477, 356/480, 356/482
• US Class Current: 250/227.19
• CPC Class Codes: G01B 11/161 by interferometric means

Abstract

A method of two interferometric configurations to measure bending of an extended element. The measurement arm of each configuration is a long optical fiber. A first interferometric configuration has a segment of its measurement arm attached to one side of the element. The second interferometric configuration has a segment of its measurement arm attached to one side of the element and another segment of its measurement arm attached to an opposing side of the element. The two configurations are used to obtain two sets of interference fringe measurement values. If one set is subtracted from the other, the result is intensity differential values that indicate only the effects of bending and not of temperature or pressure. Variations of the method can be used for irregularly shaped elements.

Claims

1. A method of using two interferometric configurations to measure bending of an extended structural element, comprising the steps of:

attaching a segment of a first optical fiber along one side of the element, the first optical fiber comprising the measurement arm of a first interferometric configuration, the first interferometric configuration having a reference arm and selected from the group consisting of a Michelson or Mach-Zehnder interferometer;

obtaining a set of interference fringe values from the first interferometric configuration;

attaching a segment of a second optical fiber along one side of the element and another segment of the second optical fiber along the opposing side of the element, the second optical fiber comprising the measurement arm of a second interferometric configuration, the second interferometric configuration having a reference arm and selected from the group consisting of a Michelson or Mach-Zehnder interferometer;

obtaining a set of interference fringe values from the second interferometer configuration;

subtracting the second set of interference fringe values from the first set of interference fringe values; and

calculating bending of the element based on the results of the subtracting step.

2. The method of claim 1, wherein the first interferometric configuration and the second interferometric configuration share at least one element other than their measurement arms.

3. The method of claim 1, wherein the first interferometric configuration and the second interferometric configuration are two different interferometers.

4. The method of claim 3, wherein the two different interferometers are different types of interferometers.

5. The method of claim 1, wherein the first interferometric configuration and the second interferometric configuration share at least one element, and further comprising the step of switching from the first optical fiber to the second optical fiber to perform the step of obtaining interference fringe values from the second interferometric configuration.

6. The method of claim 1, wherein at least one of the attaching steps is performed by embedding the optical fiber in the element.

7. The method of claim 1, wherein the steps are repeated over a period of time, such that bending is continuously monitored during such time.

8. A method of using two interferometric configurations to measure bending of an extended structural element, comprising the steps of:

determining a pair of surfaces of the element, along which the effects of bending are canceled;

attaching a segment of a first optical fiber along a first of the two surfaces, the first optical fiber comprising the measurement arm of a first interferometric configuration;

obtaining a set of interference fringe values from the first interferometric configuration;

attaching a segment of a second optical fiber along the first of the two surfaces and another segment of the second optical fiber along the second of the two surfaces, the second optical fiber comprising the measurement arm of a second interferometric configuration;

obtaining a set of interference fringe values from the second interferometer configuration;

subtracting the second set of interference fringe values from the first set of interference fringe values; and

calculating bending of the element based on the results of the subtracting step.

9. The method of claim 8, wherein the first and the second interferometric configurations each have a reference arm and selected from the group consisting of a Michelson or Mach-Zehnder interferometer.

10. A method of using two interferometric configurations to measure bending of an extended structural element, comprising the steps of:

attaching a segment of a first optical fiber along one side of the element, the first optical fiber comprising the measurement arm of a first interferometric configuration;

obtaining a set of interference fringe values from the first interferometric configuration;

determining a surface of the element along which no length difference occurs due to bending of the element;

attaching a segment of a second optical fiber along the surface determined by the preceding step, the second optical fiber comprising the measurement arm of a second interferometric configuration;

obtaining a set of interference fringe values from the second interferometer configuration;

subtracting the second set of interference fringe values from the first set of interference fringe values; and

calculating bending of the element based on the results of the subtracting step.

11. The method of claim 10, wherein the first and the second interferometric configurations each have a reference arm and selected from the group consisting of a Michelson or Mach-Zehnder interferometer.

12. A method of using two interferometric configurations to measure bending of an extended structural element, comprising the steps of:

attaching a segment of a first optical fiber along one side of the element, the first optical fiber comprising the measurement arm of a first interferometric configuration, the first interferometric configuration having a reference arm and selected from the group consisting of a Michelson or Mach-Zehnder interferometer;

obtaining a set of interference fringe values from the first interferometric configuration;

attaching a segment of a second optical fiber along one side of the element and another segment of the second optical fiber along the opposing side of the element, the second optical fiber comprising the measurement arm of a second interferometric configuration, the second interferometric configuration having a reference arm and selected from the group consisting of a Michelson or Mach-Zehnder interferometer;

obtaining a set of interference fringe values from the second interferometer configuration;

simultaneously solving equations representing the relationship among the interference fringe values and bending, temperature, and pressure; and

calculating bending of the element based on the results of the solving step.