Methods and structures for electronic probing arrays

• US 6,499,216 B1
• Filed: 09/24/1999
• Issued: 12/31/2002
• Est. Priority Date: 07/07/1994
• Status: Expired due to Fees

• Current Assignee: Tessera, Inc. (Adeia Inc.)
• Original Assignee: Tessera, Inc. (Adeia Inc.)
• Inventors: Fjelstad, Joseph
• Primary Examiner(s): Arbes, Carl J.
• Application Number:
  US09/405,029
• Time in Patent Office: 1,194 Days
• Field of Search: 298/92, 298/94, 298/74, 298/84, 174/261, 324/754, 324/761, 439/66, 438/106, 438/118, 438/127
• US Class Current: 29/842
• CPC Class Codes: G01R 1/06727 Cantilever beams
• CPC Class Codes: G01R 1/07342 the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
• CPC Class Codes: G01R 3/00 Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments , e.g. of probe tips
• CPC Class Codes: H05K 2201/0311 Metallic part with specific elastic properties, e.g. bent piece of metal as electrical contact
• CPC Class Codes: H05K 3/205 using a pattern electroplated or electroformed on a metallic carrier
• CPC Class Codes: H05K 3/4084 by deforming at least one of the conductive layers
• CPC Class Codes: Y10T 29/49147 Assembling terminal to base
• CPC Class Codes: Y10T 29/49204 Contact or terminal manufacturing
• CPC Class Codes: Y10T 29/49316 Impeller making

Abstract

A probe card for testing an electrical element such as a semiconductor wafer or a printed wiring board includes a substrate with circuitry thereon, an encapsulant layer overlying the substrate and a multiplicity of leads extending upwardly from the substrate through the encapsulant layer to terminals, the terminals projecting above the encapsulant layer. The probe card can be engaged with the electronic element so that the tips of the leads bear on the contact pads of the electronic element, and so that the leads and encapsulant layer deform to accommodate irregularities in the electronic element or probe card. The card can be made by providing the substrate, a sacrificial layer and leads extending between the sacrificial layer and substrate, moving the substrate and sacrificial layer away from one another to deform the leads and injecting a curable material around the leads to form the encapsulant layer.

Claims

1. A method of making a probe card comprising the steps of:

(a) providing a sacrificial layer, a substrate having electrical circuits thereon and a plurality of elongated leads, each said lead having a first end connected to said sacrificial layer, and a second end attached to said substrate and connected to the circuits thereon, the first ends of at least some of said leads being physically connected to the first ends of others of said leads by said sacrificial layer;

(b) moving said substrate and said sacrificial layer away from one another so as to bend the second ends of said leads away from said sacrificial layer while leaving the first ends of said leads in position on said sacrificial layer; and

(c) injecting a flowable material around said leads and curing said flowable material to form a dielectric encapsulant layer surrounding said leads; and

(d) at least partially removing said sacrificial layer so as to leave terminals at said first ends of said leads movable with respect to said substrate.

2. A method as claimed in claim 1 wherein said providing step includes the step of providing said sacrificial layer with said leads thereon, juxtaposing the sacrificial layer with said substrate and bonding said second ends of said leads with contacts on said substrate.

3. A method as claimed in claim 1 wherein said providing includes the step of providing said sacrificial layer with electrically conductive terminals at a bottom surface of said sacrificial layer at said first ends of said leads, said sacrificial layer protecting said terminals from said flowable material during said step of injecting said flowable material.

4. A method as claimed in claim 3 wherein said step of providing said sacrificial layer with said terminals includes the step of forming said terminals on said sacrificial layer.

5. A method as claimed in claim 4 wherein said sacrificial layer has cavities in said bottom surface, said step of forming said terminals including the step of placing electrically conductive material into said cavities so as to form terminals projecting upwardly from said bottom surface, whereby said terminals will project above said encapsulant layer when said sacrificial layer is removed.

6. A method as claimed in claim 5 wherein said cavities include sharp features and wherein said electrically conductive material deposited in said cavities forms sharp features on said terminals.

7. A method as claimed in claim 4 or claim 5 or claim 6 wherein said sacrificial layer is formed from a polymeric material.

8. A method as claimed in claim 1 wherein said sacrificial layer is electrically conductive and wherein said step of dissolving said sacrificial layer includes the step of leaving portions of said sacrificial layer attached to said first ends of said leads so that said portions of said sacrificial layer form terminals at said first ends of said leads.

9. A method as claimed in claim 1 wherein said step of providing said elongated leads includes providing polymeric layers and conductive strips in said leads.

10. A method as claimed in claim 9 wherein said step of providing said polymeric layers and conductive strips includes providing a polymeric sheet on said sacrificial layer and forming channels in said polymeric sheet so that each channel partially surrounds an elongated portion of said polymeric sheet, said elongated portions of said polymeric sheet constituting said polymeric layers of said leads.

11. A method as claimed in claim 1 further comprising the step of forming channels in said encapsulant layer so as to subdivide said encapsulant layer into portions, different portions of said encapsulant layer surrounding different ones of said leads.