Interferometer spectrometer with reduced alignment sensitivity

• US 6,504,614 B1
• Filed: 10/08/1999
• Issued: 01/07/2003
• Est. Priority Date: 10/08/1999
• Status: Expired due to Fees

• Current Assignee: Rio Grande Medical Technologies Incorporated
• Original Assignee: Rio Grande Medical Technologies Incorporated
• Inventors: Messerschmidt, Robert G., Abbink, Russell E.
• Primary Examiner(s): Font, Frank G.
• Assistant Examiner(s): NATIVIDAD, PHILIP SANA
• Application Number:
  US09/415,600
• Time in Patent Office: 1,187 Days
• Field of Search: 356/455, 356/451, 356/456
• US Class Current: 356/455
• CPC Class Codes: G01J 3/453 by correlation of the amplitudes

Abstract

An interferometer spectrometer that has reduced alignment sensitivity is described herein. Parallelism of an output ray pair formed by a single input ray is not affected by variations in relative alignment of the components. In comparison to other compensated interferometer designs, lateral separation errors in the output ray pair due to optical component misalignment are reduced. The reduced alignment sensitivity may be accomplished by utilizing simple planar components that are common to both light paths. The reduced alignment sensitivity and simplicity in design provides a more compact and more robust interferometer, with reduced manufacturing costs associated therewith. An elliptical field of view light source that utilizes an array of collimator lenses is also described. The light source provides a more compact design than a single circular collimator lens of the same area, and is suitable for single channel or multi-channel use.

Claims

1. An interferometer spectrometer, comprising:

a beam splitter for splitting an input ray into a first ray and a second ray having a first path and a second path, the first ray and the second ray exiting the beam splitter in parallel;

a means for redirecting the first and second rays back toward the beam splitter to define a first path length and a second path length, respectively, the first ray and the second ray striking the redirecting means in parallel; and

a means for generating a difference between the first and second path lengths,

wherein the first ray and the second ray optically interact with the beam splitter, the redirecting means, and the means for generating a path length difference.

2. An interferometer spectrometer as in claim 1, wherein the beam splitter combines the redirected first and second rays into an output ray pair, and wherein the rays forming the output ray pair are parallel.

3. An interferometer spectrometer as in claim 2, wherein translational and rotational changes in relative position between the beam splitter, the redirecting means, and the means for generating a path length difference do not result in a lack of parallelism between the rays forming the output ray pair.

4. An interferometer spectrometer as in claim 3, wherein translational changes in relative position between the beam splitter, the redirecting means, and the means for generating a path length difference do not result in a lateral separation of the rays forming the output ray pair.

5. An interferometer spectrometer as in claim 4, wherein there is no lateral separation of the rays forming the output ray pair when the first and second rays strike the redirecting means at normal incidence.

6. An interferometer spectrometer as in claim 1, wherein the beam splitter has flat and parallel leading and trailing surfaces with homogenous refractive material disposed therebetween.

7. An interferometer spectrometer as in claim 6, further comprising a compensator disposed between the beam splitter and the redirecting means for equalizing the optical path lengths of the first and second paths, the compensator having flat and parallel leading and trailing surfaces with homogenous refractive material disposed therebetween.

8. An interferometer spectrometer, as in claim 6, wherein the beam splitter and the compensator form an angle of intersection, and wherein the angle of intersection is greater than zero degrees.

9. An interferometer spectrometer as in claim 6, wherein the path length difference generating means comprises rotation of the beam splitter, the redirecting means, or the compensator.

10. An interferometer spectrometer as in claim 9, wherein the path length difference generating means comprises rotation of the beam splitter.

11. An interferometer spectrometer as in claim 9, wherein the path length difference generating means comprises rotation of the redirecting means.

12. An interferometer spectrometer as in claim 9, wherein the path length difference generating means comprises rotation of the compensator.

13. An interferometer spectrometer as in claim 1, further comprising a scanner plate of refractive material having parallel sides.

14. An interferometer spectrometer as in claim 13, wherein the path length difference generating means comprises rotation of the scanner plate.

15. An interferometer spectrometer, as in claim 1, wherein the rays forming the output ray pair produce an elliptical angular subtense within the allowable field of view.

16. An interferometer spectrometer, as in claim 1, wherein the rays forming the output ray pair have a maximum vertical angular subtense different from a maximum horizontal angular subtense within the allowable field of view.

17. An optical system, comprising:

an interferometer spectrometer as in claim 1;

a light source generating the input ray, the light source optically connected the interferometer;

a means for introducing one or more test samples into the input ray, the introducing means disposed between the light source and the interferometer; and

a light collector for receiving the output ray pair, the light collector optically connected the interferometer.

18. An interferometer spectrometer, comprising:

a beam splitter for splitting an input ray into a first ray and a second ray having a first path and a second path, the beam splitter having flat and parallel leading and trailing surfaces with homogenous refractive material disposed therebetween;

a flat end mirror terminating the first path and the second path to define a first path length and a second path length, respectively, wherein the end mirror reflects the first and second rays back to the beam splitter to combine the rays into an output ray pair, wherein the rays forming the output ray pair are parallel;

a compensator disposed between the beam splitter and the end mirror for equalizing the optical path lengths of the first and second paths, the compensator having flat and parallel leading and trailing surfaces with homogenous refractive material disposed therebetween; and

a means for generating a difference between the first and second path lengths to create an interference pattern in the output ray pair, wherein the path length difference generating means is common to both the first and second paths.

19. An interferometer spectrometer as in claim 18, wherein translational and rotational changes in relative position between the beam splitter, the compensator and the end mirror do not result in a lack of parallelism between the rays forming the output ray pair.

20. An interferometer spectrometer as in claim 18, wherein there is no lateral separation of the rays forming the output ray pair when the first and second rays strike the end mirror at normal incidence.

21. An interferometer spectrometer as in claim 18, wherein translational changes in relative position between the beam splitter, the compensator and the end mirror do not result in a lateral separation of the rays forming the output ray pair.

22. An interferometer spectrometer as in claim 18, wherein the input ray is provided by a light source, and wherein the light source produces an elliptical angular subtense.

23. An interferometer spectrometer as in claim 22, wherein the light source includes a collimator lens having an array of transmitting optical fibers disposed adjacent an array of receiving optical fibers.

24. An interferometer spectrometer as in claim 23, wherein the lenses are arranged in parallel.

25. An interferometer spectrometer as in claim 22, wherein a single channel is utilized.

26. An interferometer spectrometer as in claim 22, wherein multiple channels are utilized.

27. An interferometer spectrometer, comprising:

a beam splitter for splitting an input ray into a first ray and a second ray having a first path and a second path, the beam splitter comprising a plate having flat and parallel surfaces;

a flat end mirror terminating the first path and the second path to define a first path length and a second path length, respectively, wherein the end mirror reflects the first and second rays back to the beam splitter to combine the rays into an output ray pair, wherein the rays forming the output ray pair are parallel;

a compensator disposed between the beam splitter and the end mirror for equalizing the optical path lengths of the first and second paths, the compensator comprising a plate having flat and parallel surfaces; and

a means for generating a difference between the first and second path lengths to create an interference pattern in the output ray pair, wherein the path length difference generating means is common to both the first and second paths;

wherein translational changes in relative position between the beam splitter, the compensator and the end mirror do not result in a lack of parallelism or a lateral separation between the rays forming the output ray pair.

28. An interferometer spectrometer, comprising:

a beam splitter for splitting an input ray into a first ray and a second ray having a first path and a second path, respectively;

an end mirror terminating the first path and the second path to define a first path length and a second path length, respectively, wherein the end mirror reflects the first and second rays back to the beam splitter along the first and second paths, respectively, to combine the rays into an output ray pair;

a compensator disposed between the beam splitter and the end mirror for equalizing the optical path lengths of the first and second paths; and

a means for generating a difference between the first and second path lengths to create an interference pattern in the output ray pair, the path length difference generating means disposed in the first and second paths such that the first and second rays pass therethrough.

29. An interferometer spectrometer as in claim 28, wherein translational and rotational changes in relative position between the beam splitter, the compensator and the end mirror do not result in a lack of parallelism between the rays forming the output ray pair.

30. An interferometer spectrometer as in claim 29, wherein translational changes in relative position between the beam splitter, the compensator and the end mirror do not result in a lateral separation of the rays forming the output ray pair.

31. An interferometer spectrometer as in claim 28, wherein translational changes in relative position between the beam splitter, the compensator and the end mirror do not result in a lateral separation of the rays forming the output ray pair.

32. An interferometer spectrometer as in claim 28, further comprising a scanner plate of refractive material having parallel sides.

33. An interferometer spectrometer as in claim 32, wherein the scanner plate is disposed in both of the first and second paths.

34. An interferometer spectrometer as in claim 33, wherein the first and second paths intersect at an intersection point, and wherein the scanner plate is disposed at the intersection point.

35. An interferometer spectrometer as in claim 34, further comprising:

an intersection mirror for causing the first and second paths to intersect at the intersection point, the intersection mirror disposed between the beam splitter and the end mirror.

36. An interferometer spectrometer as in claim 28, wherein the path length difference generating means comprises rotation of the beam splitter.

37. An interferometer spectrometer as in claim 28, wherein the path length difference generating means comprises rotation of the compensator.

38. An interferometer spectrometer as in claim 32, wherein the path length difference generating means comprises rotation the scanner.

39. An interferometer spectrometer as in claim 28, wherein the input ray is provided by a light source, and wherein the light source produces an elliptical angular subtense.

40. An interferometer spectrometer as in claim 39, wherein the light source includes a collimator lens having an array of transmitting fibers disposed adjacent an array of receiving fibers.

41. An interferometer spectrometer as in claim 39, wherein the light source includes a plurality of collimator lenses each having an array of transmitting fibers disposed adjacent an array of receiving fibers.

42. An interferometer spectrometer as in claim 41, wherein the lenses are arranged in parallel.

43. An interferometer spectrometer as in claim 39, wherein a single channel is utilized.

44. An interferometer spectrometer as in claim 39, wherein multiple channels are utilized.

45. An interferometer spectrometer, comprising:

a beam splitter comprising a block of refractive material having parallel first and second surfaces, the second surface having a partially reflective material thereon for splitting an input ray into a first ray and a second ray having a first path and a second path, respectively, the first surface having a reflective material thereon for reflecting the first ray such that the first and second rays exit the beam splitter in parallel;

an end mirror terminating the first path and the second path to define a first path length and a second path length, respectively, wherein the end mirror reflects the first and second rays back to the beam splitter along the first and second paths, respectively, to combine the rays into an output ray pair;

a compensator comprising a plate of refractive material having parallel sides, the compensator disposed between the beam splitter and the end mirror for equalizing the optical path lengths of the first and second paths; and

a means for generating a difference between the first and second path lengths to create an interference pattern in the output ray pair, wherein the path length difference generating means is common to both the first and second paths.

46. An interferometer spectrometer as in claim 45, wherein translational and rotational changes in relative position between the beam splitter, the compensator and the end mirror do not result in a lack of parallelism between the rays forming the output ray pair.

47. An interferometer spectrometer as in claim 46, wherein translational changes in relative position between the beam splitter, the compensator and the end mirror do not result in a lateral separation of the rays forming the output ray pair.

48. An interferometer spectrometer as in claim 45, wherein translational changes in relative position between the beam splitter, the compensator and the end mirror do not result in a lateral separation of the rays forming the output ray pair.

49. An interferometer spectrometer as in claim 45, further comprising a scanner plate of refractive material having parallel sides.

50. An interferometer spectrometer as in claim 49, wherein the first and second paths intersect at an intersection point, and wherein the scanner plate is disposed at the intersection point.

51. An interferometer spectrometer as in claim 50, further comprising:

an intersection mirror for causing the first and second paths to intersect at the intersection point, the intersection mirror disposed between the beam splitter and the end mirror.

52. An interferometer spectrometer as in claim 45, wherein the path length difference generating means comprises rotation of the beam splitter.

53. An interferometer spectrometer as in claim 45, wherein the path length difference generating means comprises rotation of the compensator.

54. An interferometer spectrometer as in claim 49, wherein the path length difference generating means comprises rotation the scanner plate.

55. An interferometer spectrometer, comprising:

a beam splitter comprising a plate of refractive material having parallel leading and trailing surfaces, the trailing surface having a partially reflective material thereon for splitting an input ray into a first ray and a second ray having a first path and a second path, respectively, the leading surface having a reflective material thereon for reflecting the first ray such that the first and second rays exit the beam splitter in parallel;

an end mirror terminating the first path and the second path to define a first path length and a second path length, respectively, wherein the end mirror reflects the first and second rays back to the beam splitter along the first and second paths, respectively, to combine the rays into an output ray pair;

a compensator plate of refractive material having parallel sides for equalizing the amount of refractive material in the first and second paths, the compensator plate disposed between the beam splitter and the end mirror;

an intersection mirror for causing the first and second paths to intersect at an intersection point, the intersection mirror disposed between the compensator and the end mirror; and

a scanner plate of refractive material having parallel sides for generating a difference between the first and second path lengths to create an interference pattern in the output ray pair, the scanner plate disposed at the intersection point.

56. An interferometer spectrometer as in claim 55, wherein translational and rotational changes in relative position between the beam splitter, the compensator and the end mirror do not result in a lack of parallelism between the rays forming the output ray pair.

57. An interferometer spectrometer as in claim 56, wherein translational changes in relative position between the beam splitter, the compensator and the end mirror do not result in a lateral separation of the rays forming the output ray pair.

58. An interferometer spectrometer as in claim 55, wherein translational changes in relative position between the beam splitter, the compensator and the end mirror do not result in a lateral separation of the rays forming the output ray pair.

59. An interferometer spectrometer, comprising:

a light source including an array of collimator lenses defining an elliptical angular subtense;

a beam splitter for splitting the input ray into a first ray and a second ray having a first path and a second path, respectively;

an end mirror terminating the first and second paths to define a first path length and a second path length, respectively;

a compensator disposed between the beam splitter and the end mirror for equalizing the optical path lengths of the first and second paths; and

a means for generating a difference between the first and second path lengths.

60. An interferometer spectrometer as in claim 59, wherein each collimator lens has an array of transmitting fibers disposed adjacent an array of receiving fibers.

61. An interferometer spectrometer as in claim 59, wherein the lenses are arranged in parallel.

62. An interferometer spectrometer as in claim 61, wherein a single channel is utilized.

63. An interferometer spectrometer as in claim 61, wherein multiple channels are utilized.