×

Method of testing an evaluation circuit

  • US 6,505,136 B1
  • Filed: 05/17/2000
  • Issued: 01/07/2003
  • Est. Priority Date: 05/19/1999
  • Status: Expired due to Fees
First Claim
Patent Images

1. An evaluation circuit (10) for checking for the presence of a switch or key (13) in a d.c. circuit, comprising:

  • a testing means (14) connected with the switch or key (13) to form a unit (12) having first and second terminals;

    an I/O port (16) connected to-one terminal of the unit (12);

    an input buffer (18) connected to the I/O port (16) for measuring the voltage at the I/O port (16);

    an output buffer (17) controllably connected to the I/O port (16);

    a charging resistor (R1) in series with the testing means (14) and also connected to a d.c. voltage source providing a source voltage (V+); and

    a microcomputer (11) for controlling the operation of the output buffer (17);

    wherein the microcomputer (11) controls the evaluation circuit (10) to determine the presence of the switch or key (13) in the d.c. circuit and the status of the output buffer (17) by performing the following operations. 1) at time 1, determining the voltage at the I/O port (16);

    2) at time 2, controllably connecting the output buffer (17) to the I/O port (16) so as to cause the testing means (14) to be discharged within a discharge time period (tu);

    3) at time 5, determining the voltage at the I/O port (16), where time 5 occurs during the discharge time period (tu);

    4) at time 3, at the end of the discharge time period (tu), controllably disconnecting the output buffer (17) from the I/O port (16) so as to allow the testing means (14) to charge to the source voltage (V+) via the charging resistor (R1); and

    5) at time 4, during a charging time period (tu) following the discharging time period (tu), measuring the voltage at the I/O port (16), where the charging time period (tm) is substantially less than the amount of time necessary for the testing means to become fully charged;

    such that the presence of the switch or key (13) and the status of the output buffer (17) of the evaluation circuit (10) is 40 determined as follows;

    if at time 1 the measured voltage is greater than a predetermined voltage (Ug) less than the source voltage (V+), and at time 4 the measured voltage is less than the predetermined voltage (Ug), then determining that the switch or key (13) is present and that the output buffer (17) is operating normally;

    if the voltage measured at times 1, 5 and 4 are all greater than predetermined voltage (Ug), then determining that at least the output buffer (17) is faulty; and

    if the measured voltage at times 1 and 4 are both greater than the predetermined voltage (Ug) and if the measured voltage at time 5 is less than predetermined voltage (Ug), then determining that the switch or key (13) is not present and that the output buffer (17) is operating normally.

View all claims
  • 2 Assignments
Timeline View
Assignment View
    ×
    ×