Three dimensional optical scanning

• US 6,507,036 B1
• Filed: 06/01/1999
• Issued: 01/14/2003
• Est. Priority Date: 06/01/1999
• Status: Expired due to Term

• Current Assignee: National Research Council Canada
• Original Assignee: National Research Council Canada
• Inventors: Godin, Guy D.
• Primary Examiner(s): SMITH, ZANDRA V
• Application Number:
  US09/323,019
• Time in Patent Office: 1,323 Days
• Field of Search: 250/559.22, 356/73, 356/326, 356/425, 356/601
• US Class Current: 250/559.22
• CPC Class Codes: G01B 11/24 for measuring contours or curvatures

Abstract

A method of determining the color and profile of a target surface involves scanning the target surface with an incident light beam containing a plurality of component wavelengths, forming a beam of light reflected from the target surface and synchronized with the incident beam; and splitting the reflected beam into separate sub-beams of different wavelengths. The sub-beams are directed onto a sensor array to permit their relative positions to be determined as the incident beam moves over the target surface. A portion of the reflected beam is directed onto a color sensitive photodetector to obtain data representative of the approximate color composition of the reflected beam. The color and profile of the target surface is determined from the relative positions of the sub-beams on said sensor array using the data representative of the approximate wavelength composition to resolve ambiguities in the results. The split portion of the reflected beam can also be sampled at a higher rate than the sensor array to obtain information about the appearance of the surface at a higher resolution than possible with the sensor array alone.

Claims

1. A method of determining the color and profile of a target surface, comprising the steps of:

scanning the target surface with an incident light beam containing a plurality of component wavelengths;

forming a beam of light reflected from said target surface;

passing said reflected beam through a wavelength separator to form one or more separate sub-beams corresponding to the component wavelength or wavelengths of the reflected beam;

directing said one or more sub-beams onto a sensor array located downstream of said wavelength separator;

detecting the positions of said one or more sub-beams on said sensor array as said incident beam moves over the target surface;

directing at least a portion of the reflected beam onto wavelength sensitive photodetector means separate from said sensor array to obtain data representative of the approximate wavelength composition of said reflected beam;

determining the color and profile of the target surface from the relative positions and shapes of peaks produced by said one or more sub-beams on said sensor array; and

using said data representative of the approximate wavelength composition to determine the wavelength identity of said one or more peaks when ambiguities in the wavelength identity of said peaks arise due to the absence of one or more said component wavelengths in the reflected beam.

2. A method as claimed in claim 1, wherein said potion is split off from said reflected beam with the aid of a partly reflecting mirror prior to being formed into one or more sub-beams.

3. A method as claimed in claim 1, wherein said portion is formed by collecting said one or more sub-beams reflected off the surface of said sensor array.

4. A method as claimed in claim 1, wherein said photodetector means comprises a plurality of photodetectors responsive to the respective component wavelengths of said reflected beam, and said portion is split into component wavelengths directed at said respective photodetectors.

5. A method as claimed in claim 1, wherein said reflected beam is autosynchronized with said incident beam.

6. A method as claimed in claim 1, wherein said sensor array is a slanted CCD array.

7. A method of determining the profile of a target surface, comprising the steps of:

scanning the target surface with an incident light beam;

forming a beam of light reflected from said target surface;

directing said reflected beam onto a sensor array to create an intensity profile signal;

sampling said intensity profile signal at a first sampling rate f_c to create a first set of data points representing the intensity distribution on said array in each sampling period;

directing at least a portion of the reflected beam onto photodetector means to obtain an output signal representative of the intensity of said reflected beam;

sampling said output signal at a second sampling rate f_p significantly higher than said first sampling rate f_c to create second data points representative of intensity in each sampling period at said second sampling rate; and

deriving from said first set of data points a third set of data representative of the relative position of said reflected beam on said sensor array as said beam scans said surface while using said second data to provide additional information at a higher resolution about the appearance of the surface within each sampling period at said first sampling rate.

8. A method as claimed in claim 7, wherein said photodetector means is wavelength sensitive and said additional information is the variation in color of the surface over a region whose size is determined by said first sampling rate f_c at a resolution determined by said second sampling rate f_p.

9. A method as claimed in claim 8, wherein said reflected beam is split into component wavelengths prior to striking respective photodetectors constituting said photodetector means.

10. A method as claimed in claim 7, wherein said second sampling rate f_p is an integral multiple of said first sampling rate and synchronous therewith.

11. A method as claimed in claim 10, wherein said second sampling rate is about 4 to 10 times said first sampling rate.

12. A method as claimed in claim 7, wherein a third set of data are derived using said additional information to provide information about the intensity distribution of the reflected beam within a sampling period so as to compensate for discontinuities in the reflectance of the surface.

13. An apparatus for determining the color and profile of a target surface, comprising:

a light source for scanning the target surface with an incident light beam containing a plurality of component wavelengths;

a lens for forming a beam of light reflected from said target surface;

a wavelength separator for splitting the reflected beam into a plurality of sub-beams corresponding to the component wavelengths of the reflected beam;

a sensor array located downstream of said sensor array for sensing said sub-beams and permitting the positions of said sub-beams to be detected as said incident beam moves over the target surface; and

a wavelength sensitive photodetector, separate from said sensor array, receiving at least a portion of the reflected beam to obtain data representative of the approximate wavelength composition of said reflected beam;

whereby the color and profile of the target surface can be determined from the positions and shapes of peaks produced by said sub-beams on said sensor array, and said data representative of the approximate wavelength composition can be used to determine the wavelength identity of said sub-beams when ambiguities arise due to the absence of one or more component wavelengths in the reflected beam.

14. An apparatus as claimed in claim 13, further comprising a partly reflecting mirror for directing a portion of said reflected beam onto said photodetector.

15. An apparatus as claimed in claim 13, wherein said photodetector comprises a plurality of photodetectors responsive to the respective component wavelengths of said reflected beam.

16. An apparatus as claimed in claim 13, further comprising a rotating mirror to autosynchronize said reflected beam with said incident beam.

17. An apparatus as claimed in claim 13, wherein said sensor array is a slanted CCD array.

18. An apparatus for determining the profile of a target surface,:

a light source for scanning the target surface with an incident light beam;

a lens for forming a beam of light reflected from said target surface and directing said reflected beam onto a sensor array to create an intensity profile signal;

means for sampling said intensity profile signal at a first sampling rate f_c to create a set of data points representing the intensity distribution on said array in each sampling period;

means for directing at least a portion of the reflected beam onto photodetector means to obtain an output signal representative of the intensity of said reflected beam;

means for sampling said output signal at a second sampling rate f_p significantly higher than said first sampling rate f_c to create second data points representative of intensity in each sampling period at said second sampling rate; and

means for deriving from said first set of data points a third set of data representative of the relative position of said reflected beam on said sensor array as said beam scans said surface while using said second data to provide additional information at a higher resolution about the appearance of the surface within each sampling period at said first sampling rate.

19. An apparatus as claimed in claim 18, wherein said photodetector means is wavelength sensitive and said additional information is the variation in color of the surface over a region whose size is determined by said first sampling rate f_c at a resolution determined by said second sampling rate f_p.

20. An apparatus as claimed in claim 18, wherein said second sampling rate f_p is an integral multiple of said first sampling rate and synchronous therewith.

21. A method of determining the color and profile of a target surface, comprising the steps of:

scanning the target surface with an incident light beam containing a plurality of component wavelengths;

forming a beam of light reflected from said target surface;

forming the reflected beam into one or more separate sub-beams corresponding to the component wavelength or wavelengths of the reflected beam;

directing said one or more sub-beams onto one or more sensor arrays to form one or more intensity profile signals;

sampling said one or more intensity profile signals at a first sampling rate f_c to create a first set of data points representing the intensity distribution on said array in each sampling period;

directing at least a portion of the reflected beam onto wavelength sensitive photodetector means to obtain an output signal representative of the wavelength composition of said reflected beam, and sampling said output signal at a second sampling rate f_p significantly higher than said first sampling rate f_c to create second data points representative of intensity in each sampling period at said second sampling rate;

determining the color and profile of the target surface from the positions and shapes of peaks produced by said one or more sub-beams on said sensor array using said data representative of the approximate wavelength composition to resolve potential ambiguities in the results obtained from said sensor array; and

deriving from said first set of data points a third set of data representative of the position of said one or more sub-beams on said sensor array as said beam scans said surface while using said second data to provide additional information at a higher resolution about the appearance of the surface within each sampling period at said first sampling rate.

22. A method as claimed in claim 21, wherein said sensor array is a slanted CCD array.

23. A method as claimed in claim 22, wherein said reflected beam is auto-synchronized with said incident beam.