Current source calibration circuit

• US 6,507,296 B1
• Filed: 08/14/2001
• Issued: 01/14/2003
• Est. Priority Date: 08/14/2001
• Status: Expired due to Term

• Current Assignee: Xilinx, Inc. (Advanced Micro Devices, Inc.)
• Original Assignee: Xilinx, Inc. (Advanced Micro Devices, Inc.)
• Inventors: Lee, Yvette P., Hassoun, Marwan N.
• Primary Examiner(s): JEAN PIERRE, PEGUY
• Application Number:
  US09/930,032
• Time in Patent Office: 518 Days
• Field of Search: 341/144, 341/120, 341/141, 341/118
• US Class Current: 341/120
• CPC Class Codes: H03M 1/1004 without interrupting normal operation, e.g. by providing an additional component for temporarily replacing components to be tested or calibrated H03M1/1009, H03M1/1071 take precedence
• CPC Class Codes: H03M 1/747 with equal currents which are switched by unary decoded digital signals

Abstract

A current source calibration circuit and methodology reduce noise generated by current switching. In one embodiment, the calibration circuit provides a random or pseudo-random clock signal to control a switching of calibration circuit. A clock signal generator has been described that provide a number of clock signals having different phases. In one embodiment, the clock signals are used to select a current source of a DAC for calibration. By using a random clock to select the current source, noise, which is generated by switching a primary current source with a backup current source, is spread out over a wider frequency range.

Claims

1. A current source calibration circuit comprising:

first and second current sources;

a calibration circuit;

a clock generator to provide a clock signal having a sequence of pulses with pseudo-random periods; and

a switching circuit to pseudo-randomly coupling the first and second current sources to the calibration circuit in response to the clock signal.

2. The current source calibration circuit of claim 1 wherein the first and second current sources are provided in a digital-to-analog (DAC) circuit.

3. The current source calibration circuit of claim 1 wherein the clock generator comprises a shift register.

4. A digital-to-analog (DAC) circuit comprising:

a plurality of sub-DACs each comprising at least one current source;

a calibration circuit coupleable to calibrate the current sources; and

a clock generator circuit coupled to the calibration circuit to provide a plurality of clock signals each having a sequence of pulses with pseudo-random periods.

5. The DAC of claim 4 wherein the plurality of clock signals has different phases.

6. The DAC of claim 4 further comprising a plurality of backup current sources.

7. The DAC of claim 4 wherein the clock generator circuit comprises a shift register circuit.

8. A digital-to-analog (DAC) circuit comprising:

a plurality of sub-DACs each comprising,

a primary current source,

a backup current source, and

switching circuitry to couple the primary and backup current sources to calibration circuitry; and

a clock generator circuit coupled to the switching circuitry to provide a plurality of clock signals each having a sequence of pulses with pseudo-random periods.

9. The DAC of claim 8 wherein the plurality of clock signals have different phases.

10. The DAC of claim 8 wherein the switching circuitry comprises a shift register coupled to receive one of the plurality of clock signals.

11. The DAC of claim 8 wherein the clock generator comprises a linear feedback sift register having a plurality of output connections.

12. A method of calibrating a plurality of current sources comprising:

generating a clock signal having a sequence of pulses with pseudo-random periods; and

coupling the plurality of current sources to a calibration circuit in response to the clock signal.

13. The method of claim 12 wherein the clock signal is generated using a shift register circuit.

14. The method of claim 12 wherein the plurality of current sources comprise a primary and a secondary current source.

15. The method of claim 14 wherein coupling the current sources comprises alternately coupling the primary and secondary current sources to the calibration circuit on a transition of the clock signal.

16. A method of calibrating a digital-to-analog (DAC) converter circuit comprising:

generating first and second clock signals each having a sequence of pulses with pseudo-random periods, wherein the first and second clock signals have different phases;

generating switching clock signals from the first and second clock signals; and

coupling current sources of the DAC to a calibration circuit in response to the switching clock signals.

17. The method of claim 16 wherein the DAC comprises first and second sub-DACs each having current sources, wherein the switching clock signals comprise first and second switching clock signals generated from the first and second clock signals, respectively.

18. The method of claim 17 wherein the current sources of the first sub-DAC are coupled to the calibration circuit in response to the first switching clock signals, and the second sub-DAC are coupled to the calibration circuit in response to the second switching clock signals.