Spectroscopic analyzing arrangement

• US 6,507,396 B1
• Filed: 03/28/2001
• Issued: 01/14/2003
• Est. Priority Date: 06/18/1998
• Status: Expired due to Term

• Current Assignee: Herman Hubertus Jacobus Reijnen, Herman Philip Godfried, Willem Kornelis Leendert Van Der Voorden
• Original Assignee: Herman Hubertus Jacobus Reijnen, Herman Philip Godfried, Willem Kornelis Leendert Van Der Voorden
• Inventors: Godfried, Herman Philip, Reijnen, Herman Hubertus Jacobus, Van Der Voorden, Willem Kornelis Leendert
• Primary Examiner(s): Spyrou, Cassandra
• Assistant Examiner(s): ASSAF, FAYEZ G
• Application Number:
  US09/719,902
• Time in Patent Office: 657 Days
• Field of Search: 356/300, 250/339.11
• US Class Current: 356/300
• CPC Class Codes: G01N 21/552 Attenuated total reflection

Abstract

A spectroscopic analyzing arrangement comprises an ATR optical sampling plate with a front sample-contacting face and an opposed rear internally face. An anvil assembly is arranged so that the sample-contacting face can be pressed against the sample to receive spectroscopic information. A reflection barrier between the anvil assembly and the rear face prevents internally reflected light within the sampling plate from picking up spectroscopic information from the anvil assembly, thus enhancing the performance of the arrangement.

Claims

1. A spectroscopic analyzing arrangement comprising an ATR optical sampling plate having a front sample-contacting face and an opposed rear internally reflecting face, an anvil assembly located rearwardly of the rear reflecting face for allowing the sample-contacting face to be pressed sufficiently hard against the sample to receive spectroscopic information therefrom, and a reflection barrier located between the anvil assembly and the rear internally reflecting face of the sampling plate for preventing internally reflected light within the sampling plate from picking up spectroscopic information from the anvil assembly, characterised in that the anvil assembly comprises an anvil and a prism having an entry facet for receiving incident light which is directed to the sampling plate and an exit facet for allowing light reflected within the sampling plate to exit, the prism having a front face arranged to make contact with the rear reflecting face of the sampling plate via the reflection barrier and an opposed rear face against which the anvil locates.

2. A spectroscopic analyzing arrangement according to claim 1 wherein an outer peripheral support is fixed to the outer periphery of the sampling plate with entry and exit passages being defined in the outer peripheral support for receiving the incident and reflected tight beams.

3. A spectroscopic analyzing arrangement according to claim 2 wherein the outer peripheral support is fixed to the outer periphery of the sampling plate by gluing or brazing.

4. A spectroscopic analyzing arrangement according to any one of claim 1 wherein both the sampling plate and the prism are formed from a diamond material.

5. A spectroscopic analyzing arrangement according to claim 4 wherein the diamond material is a type IIA or a CVD diamond.

6. A spectroscopic analyzing arrangement according to claim 1 wherein the reflection barrier is in the form of a reflective metallic coating having a maximum thickness of 10% of the wavelength of light used.

7. A spectroscopic analyzing arrangement according to claim 6 wherein the coating is applied onto the front face of the prism.

8. A spectroscopic analyzing arrangement according to claim 6 wherein the coating is applied directly to the rear internally reflecting face of the sampling plate.

9. A spectroscopic analyzing arrangement according to claim 1 further comprising a background light absorbing layer applied to the bottom surface of the prism.

10. A spectroscopic analyzing arrangement according to claim 9 wherein the background light absorbing layer is a layer of epoxy, an absorbent coating or a black carbon layer.

11. A spectroscopic analyzing arrangement according to claim 1 wherein the top and bottom surfaces of the prism are corrugated to obtain a diffusely reflecting surface for background light.

12. A spectroscopic analyzing arrangement according to claim 1 wherein the top and bottom surfaces of the prism are grooved to stop incident background light by reflection.

13. A spectroscopic analyzing arrangement according to claim 1 wherein the prism is split into two parts with a background light barrier inserted between the two parts.

14. A spectroscopic analyzing arrangement according to claim 13 wherein the background light barrier is metal foil.