Method and apparatus for testing a temperature sensor

• US 6,508,584 B2
• Filed: 11/16/2001
• Issued: 01/21/2003
• Est. Priority Date: 02/23/1999
• Status: Expired due to Term

• Current Assignee: Intel Corporation
• Original Assignee: Intel Corporation
• Inventors: Blankenagel, John A.
• Primary Examiner(s): Fulton, Christopher W.
• Assistant Examiner(s): PRUCHNIC, STANLEY J
• Application Number:
  US09/994,080
• Publication Number:
  US 20020048309A1
• Time in Patent Office: 431 Days
• Field of Search: 374/1, 374/164, 374/183, 374/141, 374/142, 374/4, 374/5, 320/150, 320/134, 320/136, 320/154, 320/DIG.21, 702/63, 702/130, 702/132, 340/636, 429/62, 429/24, 219/209, 219/520, 219/521
• US Class Current: 374/1
• CPC Class Codes: G01K 15/00 Testing or calibrating of thermometers
• CPC Class Codes: H05K 1/0212 Printed circuits or mounted components having integral heating means

Abstract

In accordance with one embodiment of a method and apparatus for testing a temperature sensor, an apparatus includes at least one component that affects ambient temperature. The at least one component is positioned on a circuit board so that when a current is applied to the at least one component the temperature of a temperature sensor is affected, where the temperature sensor is attached to a battery in contact with the circuit board. The response of the temperature sensor further includes the capability to be measured by external equipment. In accordance with another embodiment of a method and apparatus for testing a temperature sensor, a method of testing a temperature sensor attached to a battery, the battery being in contact with a circuit board, is as follows. The response to a temperature sensor is measured. Current is applied to the at least one heating component with sufficient proximity of the temperature sensor to affect its temperature. The response of a temperature sensor is measured after the temperature of a temperature sensor has been affected.

Claims

1. An apparatus comprising:

a circuit board;

at least one component positioned on the circuit board;

a battery connected to the circuit board; and

a temperature sensor, coupled to the battery, having at least one test point coupled to external test equipment, wherein a temperature response of the temperature sensor is measured by the external test equipment whenever a current is applied to the component.

2. An apparatus comprising:

a circuit board;

at least one heating component positioned on the circuit board;

a battery connected to the circuit board; and

a temperature sensor, coupled to the battery, having at least one test point coupled to external test equipment, wherein a temperature response of the temperature sensor is measured by the external test equipment whenever a current is applied to the heating component.

3. The apparatus of claim 2, wherein said circuit board comprises a printed circuit board.

4. The apparatus of claim 2, wherein said at least one heating component comprises a heater resistor.

5. The apparatus of claim 2, wherein said at least one heating component comprises a component having a non-zero resistance.

6. The apparatus of claim 2, wherein said temperature sensor comprises a thermistor.

7. The apparatus of claim 2, wherein the battery is part of a battery pack.

8. The apparatus of claim 7, wherein the battery pack comprises a rechargeable battery pack.

9. The apparatus of claim 8, wherein said temperature sensor is positioned on a battery in said battery pack so that when the battery pack is in contact with the circuit board said temperature sensor is within sufficiently close proximity of said at least one heating component so that heat radiated by said at least one heating component is incident on said temperature sensor.

10. The apparatus of claim 2, wherein said external test equipment comprises automatic test equipment (ATE), and wherein said temperature sensor includes test points capable of being coupled to said ATE.

11. The apparatus of claim 10, wherein said at least one heating component includes test points capable of being coupled to said ATE.

12. The apparatus of claim 2, wherein the response of said temperature sensor comprises a change in an electrical characteristic of said temperature sensor.

13. The apparatus of claim 12, wherein the electrical characteristic comprises the resistance of the temperature sensor.

14. The apparatus of claim 2, wherein said at least one heating component comprises a plurality of heating components.

15. A method comprising:

measuring the response of a temperature sensor attached to a battery in contact with a circuit board, the temperature sensor having at least one test point;

applying current from external test equipment to at least one heating component within sufficiently close proximity of the temperature sensor to heat the temperature sensor; and

measuring a temperature response of the temperature sensor at the external test equipment after the temperature of the temperature sensor has been affected by the heating component.

16. The method of claim 15, wherein the battery is part of a battery pack.

17. The method of claim 15, wherein the circuit board comprises a printed circuit board.

18. The method of claim 15, wherein the temperature sensor comprises a thermistor.

19. The method of claim 15, wherein the at least one heating component comprises a heater resistor.

20. The method of claim 15, wherein the at least one heating component is attached to the circuit board.

21. The method of claim 20, wherein the at least one heating component has test points;

and wherein the temperature sensor has test points.