Binary optical grating and method for generating a moire pattern for 3D imaging

• US 6,509,559 B1
• Filed: 06/20/2000
• Issued: 01/21/2003
• Est. Priority Date: 06/20/2000
• Status: Expired due to Fees

• Current Assignee: Ismeca Semiconductor Holding S.A (COHU Incorporated)
• Original Assignee: PPT Vision, Inc. (Datalogic S.p.A.)
• Inventors: Ma, John, Hart, Darcy J., Ulrich, Franz W.
• Primary Examiner(s): Kim; Robert H.
• Assistant Examiner(s): THOMAS, COURTNEY D
• Application Number:
  US09/598,069
• Time in Patent Office: 945 Days
• Field of Search: 250/237 G,237 R 356/305,330,334,499,521,365,239.3,237.4,237.5
• US Class Current: 250/237.00G
• CPC Class Codes: G01B 11/25 by projecting a pattern, e.g. one or more lines, moiré fringes on the object G01B11/255 takes precedence ; image analysis for depth or shape recovery G06T7/50

Abstract

In the context of a machine-vision system for inspecting a part, a method and apparatus to provide high-speed high accuracy 3D (three-dimensional) inspection of manufactured parts by reducing vibration. The invention provides a method, a grating, and a 3D imaging system using a binary grating in the projection system to generate patterned light. The grating includes a binary grating having a cycle pattern, wherein each cycle includes a first substantially clear stripe of a first width and a first substantially opaque stripe of substantially the same first width, and between the first substantially clear stripe and the first substantially opaque stripe are a second substantially opaque stripe of a second width narrower than the first width, and a second substantially clear stripe of substantially the second width. In some embodiments, a plurality of alternating relatively narrow clear and opaque stripes are positioned between the relatively wider first substantially clear stripe and first substantially opaque stripe, in order that the optics of the projection optical system and the relative motion between the projection light pattern and the imaging time (trapezoidal integration) smooth the resulting pattern to provide a linear sine-wave-like pattern of projection light.

Claims

1. A machine-vision system for inspecting an object, comprising:

an inspection station that support the object;

a scanning mechanism positioned to scan the inspection station;

an imager head coupled to the scanning mechanism, wherein the scanning mechanism moves the imager head in a linear motion to scan the object at the inspection station, the imager head including;

a grating having a first region including a cyclic pattern of substantially clear stripes and substantially opaque stripes, wherein each cycle includes a first substantially clear stripe of a first width, a first substantially opaque stripe of second width, and between the first substantially clear stripe and the first substantially opaque stripe are a second substantially opaque stripe of a third width narrower than the first width and narrower than the second width, and a second substantially clear stripe of a fourth width narrower than the first width and narrower than the second width.

2. The machine-vision system of claim 1, wherein the first width is substantially the same width as the second width, and the third width is substantially the same width as the fourth width.

3. The machine-vision system of claim 2, wherein each cycle of the grating further includes a third substantially clear stripe of a fifth width, a third substantially opaque stripe of substantially the same width as the fifth width, the fifth width being narrower than the third width.

4. The machine-vision system of claim 3, wherein each cycle of the grating further includes a fourth substantially clear stripe of a sixth width, a fourth substantially opaque stripe of substantially the same width as the sixth width, the sixth width being wider than the third width.

5. The machine-vision system of claim 1, wherein the grating includes a second region including a repeated cycle pattern of substantially clear stripes and substantially opaque stripes, wherein each cycle of the second region is wider than a corresponding cycle of the first region.

6. The machine-vision system of claim 1, wherein the imager head further includes:

a light source having an emission region emitting light; and

a diffuser located in a light path of the light.

7. The machine-vision system of claim 6, wherein the imager head further includes:

a cylindrical lens located in the light path of the light; and

a projection lens mask having an elongated aperture, also located in the light path of the light, wherein the cylindrical lens helps focus the light to fill the aperture substantially evenly.

8. The machine-vision system of claim 1, wherein the imager head further includes:

a cylindrical lens located in the light path of the light; and

a projection lens mask having an elongated aperture, also located in the light path of the light, wherein the cylindrical lens helps focus the light to fill the aperture substantially evenly.

9. The machine-vision system of claim 7, wherein the projection lens is a telecentric lens.

10. The machine-vision system of claim 4, wherein the imager head further includes:

a light source having an emission region emitting light;

a diffuser located in a light path of the light, wherein the diffuser is a low-loss holographic diffuser;

a cylindrical lens located in the light path of the light; and

a projection lens mask having an elongated aperture, also located in the light path of the light, wherein the emission region is elongated, and wherein the cylindrical lens helps focus the light to fill the aperture substantially evenly.

11. A method of making a striped binary grating for use in a 3-dimensional scanning apparatus used to determine a geometry of an object having at least one surface to be measured, the method comprising:

(a) projecting a first repeated cycle pattern of substantially illuminated stripes and substantially dark stripes, wherein each cycle includes a first substantially illuminated stripe of a first width, a first substantially dark stripe of second width, and between the first substantially illuminated stripe and the first substantially dark stripe are a second substantially dark stripe of a third width narrower than the first width and narrower than the second width, and a second substantially illuminated stripe of a fourth width narrower than the first width and narrower than the second width.

12. The method of claim 11, wherein the first width is substantially the same width as the second width, and the third width is substantially the same width as the fourth width.

13. The method of claim 12, wherein each projected cycle further includes a third substantially illuminated stripe of a fifth width, a third substantially dark stripe of substantially the same width as the fifth width, the fifth width being narrower than the third width.

14. The method of claim 13, wherein each projected cycle further includes a fourth substantially illuminated stripe of a sixth width, a fourth substantially dark stripe of substantially the same width as the sixth width, the sixth width being wider than the third width.

15. The method of claim 11, further comprising

projecting a second repeated cycle pattern of substantially illuminated stripes and substantially dark stripes, wherein each cycle of the second pattern includes a repeated cycle pattern of substantially illuminated stripes and substantially dark stripes, wherein each cycle of the second pattern is wider than a corresponding cycle of the first pattern.

16. The method of claim 11, further comprising:

emitting light; and

diffusing the emitted light, wherein the diffused light is used in the projecting.

17. The method of claim 16, further comprising:

cylindrically focussing the diffused light to fill an elongated aperture substantially evenly; and

telecentrically focussing the light of the elongated aperture to the object.

18. The method of claim 11, further comprising:

emitting light;

cylindrically focussing the light to fill an elongated aperture substantially evenly; and

telecentrically focussing the light of the elongated aperture to the object.

19. The method of claim 11, further comprising:

diffusing the emitted light.

20. A projection grating for use in a machine-vision system for inspecting an object, comprising:

a binary grating having a cycle pattern, wherein each cycle includes a first substantially clear stripe of a first width and a first substantially opaque stripe of substantially the first width, and between the first substantially clear stripe and the first substantially opaque stripe are a second substantially opaque stripe of a second width narrower than the first width, and a second substantially clear stripe of substantially the second width.

21. The projection grating of claim 20, wherein the cycle pattern is symmetric.

22. The projection grating of claim 21, wherein a pattern of a plurality of clear stripes and a plurality of opaque stripes are alternated between the first substantially clear stripe and the first substantially opaque stripe and a complementary pattern of a plurality of opaque stripes and a plurality of clear stripes are alternated on an opposite side of the first substantially clear stripe.

23. The projection grating of claim 21, wherein the cycle pattern is defined by three width parameters.

24. The projection grating of claim 21, wherein the cycle pattern is defined by three width parameters with values of about 1.25, 1.30, and 1.464 radians.