Fast test application switching method and system

• US 6,512,988 B1
• Filed: 05/25/2000
• Issued: 01/28/2003
• Est. Priority Date: 05/25/2000
• Status: Expired due to Term

• Current Assignee: Keysight Technologies, Inc.
• Original Assignee: Agilent Technologies, Inc.
• Inventors: Kanago, Kerwin D
• Primary Examiner(s): Hoff, Marc S.
• Assistant Examiner(s): Raymond, Edward
• Application Number:
  US09/579,277
• Time in Patent Office: 978 Days
• Field of Search: 702/123, 702/57, 702/61, 702/62, 702/69, 702/81, 702/84, 702/119, 702/120-122, 702/124, 703/4, 703/21, 710/14, 710/15, 710/36
• US Class Current: 702/123
• CPC Class Codes: G06F 11/2733 Test interface between tester and unit under test

Abstract

A method and system of efficiently switching between a first test application that tests a first format and a second test application that tests a second format. First, a fast test application switching module (FTASM) is loaded into a program memory. The FTASM has a format independent portion (FIP) and at least two format dependent portions (FDPs) that are specific to the particular format to be tested. The FIP is configured to be compatible with each of the format dependent portions so that any of the format dependent portions can utilize the FIP to perform testing tasks. When a first format test request is received, the FIP activates the virtual instruments associated with the first format. Then, when a second format test request is received, the FIP de-activates the virtual instruments associated with the first format and activates the virtual instruments associated with the second format. A first mechanism is provided for maintaining a plurality of settings associated with while the format dependent portion is inactive. This mechanism also automatically applies these settings to the format dependent portion when the format dependent portion is activated. A second mechanism is provided for allowing a user to individually access a plurality of settings of a particular format dependent portion when the format dependent portion is not being executed.

Claims

1. A test apparatus configured for switching between at least two test applications comprising:

a) a processor for executing instructions; and

b) a fast test application switching module coupled to the processor for, when executed by the processor, efficiently switching between a first test application and a second application.

2. The apparatus of claim 1 wherein the fast test application switching module comprises:

a format independent portion;

at least two format dependent portions; and

a common interface between the format independent portion and the format dependent portions for communication therebetween.

3. The apparatus of claim 1 further comprising:

(c) a program memory;

wherein the format independent portion and the format dependent portions are loaded at the same time into the program memory,

and wherein no additional code is loaded into the program memory when switching between the first test application and the second application.

4. The apparatus of claim 1 further comprising:

(c) a program memory;

wherein the format independent portion is first loaded into the program memory; and

wherein the format dependent portions are subsequently loaded into the program memory based on the test application specified by a user.

5. The apparatus of claim 1 further comprising:

(c) a program memory;

wherein the format independent portion is first loaded into the program memory;

wherein each test application has associated therewith a format dependent portion; and

wherein when switching between a first test application and a second application, the format dependent portion associated with the second application is loaded into the program memory.

6. The apparatus of claim 1 wherein the fast test application switching module further comprises:

a user interface for receiving user input;

a virtual instrument manager coupled to the user interface for specifying one group of virtual instruments associated with a particular format for execution based on the user input, wherein the virtual instrument manager is programmable by the user input;

a resource manager coupled to the virtual instruments for managing resources on behalf of the virtual instruments;

wherein the resource manager utilizes a common set of hardware resources to perform different measurements across different virtual instruments in the same format and across different formats.

7. The apparatus of claim 1 wherein the fast test application switching module further comprises:

a state layer having at least one state code for managing access to a first hardware resource.

8. The apparatus of claim 7 wherein the state layer further comprises:

a first function for allowing a virtual instrument to control and configure the hardware resource; and

a second function for allowing a virtual instrument to acquire data from the first hardware resource.

9. The apparatus of claim 8

wherein the first function includes a first parameter for specifying a setting for the hardware resource and a second parameter for specifying a value for the setting;

and

wherein the second function includes a first parameter for specifying a desired information, and a second parameter for receiving the desired information;

wherein the information being one of a measurement and a current configuration setting.

10. The apparatus of claim 8

wherein the first function is a Make_Setting function;

and

wherein the second function is a Make_Query function.

11. The apparatus of claim 7 wherein the state layer further comprises:

a signal generation module for interfacing with a signal generator;

a measurement receiver module for interfacing with a measurement receiver;

an audio source module for interfacing with an audio source generator; and

a de-modulation receiver module for interfacing with a de-modulation receiver.

12. The apparatus of claim 2 wherein each format dependent portion includes a mechanism for maintaining a plurality of settings associated therewith while the format dependent portion is inactive;

and wherein the settings are automatically applied to the format dependent portion when the format dependent portion is activated.

13. The apparatus of claim 2 wherein the plurality of settings of a particular format dependent portion can be individually accessed by a user when the format dependent portion is not being executed.

14. The apparatus of claim 13 wherein the plurality of settings of a particular format dependent portion can be individually set, modified, and read by a user when the format dependent portion is not being executed.

15. A method of switching between a first test application that tests a first format and a second test application that tests a second format comprising:

(a) loading a fast test application switching module (FTASM) into a program memory, the fast test application switching module (FTASM) having a format independent portion and at least two format dependent portions, the format independent portion compatible with both the format dependent portions;

(b) receiving a first format test request;

(c) automatically activating a non-measurement virtual instrument associated with the first format test request;

(d) receiving a first measurement request;

(e) activating the virtual instrument associated with the first measurement request;

(f) receiving a second format test request;

(g) de-activating the virtual instrument associated with the first measurement request and the non-measurement virtual instrument associated with the first format test request;

(h) automatically activating a non-measurement virtual instrument associated with the second format test request;

(i) receiving a second measurement request; and

(j)activating the virtual instrument associated with the second measurement request.

16. The method of claim 15

wherein step (c) includes automatically applying previously stored settings of the non-measurement virtual instrument associated with the first format test request;

wherein step (e) includes automatically applying previously stored settings of the virtual instrument associated with the first measurement request;

wherein step (g) includes automatically storing the current settings of the virtual instrument associated with the first measurement request and the current settings of the non-measurement virtual instrument associated with the first format test request;

wherein step (h) includes automatically applying previously stored settings of the non-measurement virtual instrument associated with the second format test request;

wherein step (j) includes automatically applying previously stored settings of the virtual instrument associated with the second measurement request.

17. A method of switching between a first test application that tests a first format and a second test application that tests a second format comprising:

(a) loading a format independent portion (FIP) into a program memory, the format independent portion (FIP) being compatible with at least two different format dependent portions;

(b) receiving a first format test request;

(c) loading a format dependent portion associated with the first format;

(d) automatically activating a non-measurement virtual instrument associated with the first format test request;

(e) receiving a first measurement request;

(f) activating the virtual instrument associated with the first measurement request;

(g) receiving a second format test request;

(h) loading a format dependent portion associated with the second format;

(i) de-activating the virtual instrument associated with the first measurement request and the non-measurement virtual instrument associated with the first format test request;

(j) automatically activating a non-measurement virtual instrument associated with the second format test request;

(k) receiving a second measurement request; and

(l) activating the virtual instrument associated with the second measurement request.

18. The method of claim 17

wherein step (d) includes automatically applying previously stored settings of the non-measurement virtual instrument associated with the first format test request;

wherein step (f) includes automatically applying previously stored settings of the virtual instrument associated with the first measurement request;

wherein step (i) includes automatically storing the current settings of the virtual instrument associated with the first measurement request and the current settings of the non-measurement virtual instrument associated with the first format test request;

wherein step (j) includes automatically applying previously stored settings of the non-measurement virtual instrument associated with the second format test request;

wherein step (l) includes automatically applying previously stored settings of the virtual instrument associated with the second measurement request.

19. A method of switching between a first test application that tests a first format and a second test application that tests a second format comprising:

(a) receiving a first format test request;

(b) activating a virtual instrument associated with the first format test request;

(c) receiving a second format test request;

(d) de-activating the virtual instrument associated with the first format test request; and

(e) activating a virtual instrument associated with the second format test request and automatically applying previously determined settings to the virtual instrument associated with the second format test.

20. The method of claim 19 wherein the previously determined settings are one of previously stored settings and previously configured settings.

21. A system suitable for testing a device under test that includes a first mode of operation in which the device under test communicates in accordance with a first communication format and a second mode of operation in which the device under test communicates in accordance with a second communication format comprising:

a) a processor for executing test applications;

b) a first test application when executing on the processor for testing the first mode of operation of the device under test and for determining whether the device under test complies with the first communication format;

c) a second test application when executing on the processor for testing the second mode of operation of the device under test and for determining whether the device under test complies with the second communication format; and

d) a fast test application switching mechanism for efficiently switching between the first test application and the second test application.

22. The system of claim 21

wherein the first test application includes one of a parametric test that specifies a quantitative measure of performance for the device under test, a functional test that determines whether the device under test can perform a predetermined qualitative function, a signal quality test, spectral purity test, modulation accuracy test, signal power test, broadcast strength test, voice quality test, and audio quality test; and

wherein the second test application includes one of a parametric test that specifies a quantitative measure of performance for the device under test, a functional test that determines whether the device under test can perform a predetermined qualitative function, a signal quality test, spectral purity test, modulation accuracy test, signal power test, broadcast strength test, voice quality test, and audio quality test.

23. (New) The system of claim 21

wherein the first communication format can specify one of a frequency of communication, a modulation scheme to be employed, a communication protocol between a mobile unit and a base station, hand-shaking between the mobile unit and the base-station, hand-over of calls between base-stations, call control, channel assignment, and other communication parameters;

and

wherein the second communication format can specify one of a frequency of communication, a modulation scheme to be employed, a communication protocol between a mobile unit and a base station, hand-shaking between the mobile unit and the base-station, hand-over of calls between base-stations, call control, channel assignment, and other communication parameters.

24. The system of claim 21 wherein the device under test is one of a multi-band cellular telephone without a hand-over feature, multi-band cellular telephones with a hand-over feature, a cellular telephone that can operate with different formats depending on the geographic location of the device, and a cellular telephone that is manufactured with several different operating formats.

25. The system of claim 21 wherein the first communication format can include one of IS-136, Advanced Mobile Phone Service (AMPS), Digital AMPS (D-AMPS), Code Division Multiple Access (CDMA), Personal Communications Service (PCS), IS-54-based TDMA, IS-95-based CDMA, DCS-based TDMA, Composite CDMA/TDMA, Global System for Mobile Communications (GSM), Personal Communications Networks (PCN), Digital European Cordless Telephone (DECT), Time Division Multiple Access (TDMA), Telecommunications Management Network (TMN), Universal Mobile Telecommunication System (UMTS), and Universal Personal Telecommunication (UPT);

and

wherein the second communication format can include one of IS-136, Advanced Mobile Phone Service (AMPS), Digital AMPS (D-AMPS), Code Division Multiple Access (CDMA), Personal Communications Service (PCS), IS-54-based TDMA, IS-95-based CDMA, DCS-based TDMA, Composite CDMA/TDMA, Global System for Mobile Communications (GSM), Personal Communications Networks (PCN), Digital European Cordless Telephone (DECT), Time Division Multiple Access (TDMA), Telecommunications Management Network (TMN), Universal Mobile Telecommunication System (UMTS), and Universal Personal Telecommunication (UPT).

26. The system of claim 21 wherein the fast test application switching mechanism includes a format independent portion that includes a de-activation mechanism for de-activating at least one virtual instruments associated with the first communication format and an activation mechanism for activating at least one virtual instrument associated with the second communication format when a second format test request is received.

27. The system of claim 21 wherein the fast test application switching mechanism includes a first mechanism for automatically storing at least one current setting of a virtual instrument when the virtual instrument is de-activated.

28. The system of claim 27 wherein the fast test application switching mechanism includes a second mechanism for automatically applying at least one previously stored setting to the virtual instrument when the virtual instrument is activated.

29. The system of claim 21 wherein the fast test application switching mechanism includes a user interface mechanism for allowing a user to access at least one setting of a virtual instrument when the virtual instrument is not being executed.