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Fast test application switching method and system

  • US 6,512,988 B1
  • Filed: 05/25/2000
  • Issued: 01/28/2003
  • Est. Priority Date: 05/25/2000
  • Status: Expired due to Term
First Claim
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1. A test apparatus configured for switching between at least two test applications comprising:

  • a) a processor for executing instructions; and

    b) a fast test application switching module coupled to the processor for, when executed by the processor, efficiently switching between a first test application and a second application.

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