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Near-field scanning optical microscope with a high Q-factor piezoelectric sensing element

  • US 6,515,274 B1
  • Filed: 07/20/2000
  • Issued: 02/04/2003
  • Est. Priority Date: 07/20/1999
  • Status: Expired due to Fees
First Claim
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1. A piezoelectric sensing element for use in a near-field scanning optical microscope, comprising:

  • a micro tuning fork mounted in a holder, the micro tuning fork including first and second tines and the holder having a piezoelectric element for dithering the micro tuning fork; and

    an optical fiber being connectable to a photodetection means and having a thinned end portion having a diameter less than a threshold thickness, the thinned portion of the optical fiber being attached at a first position thereof to the holder and attached at a second position thereof spaced from an end of the optical fiber to said first tine at a position spaced from an end of the first tine, the optical fiber extending transversly across the first and second tines of the micro tuning fork, said first tine being adapted to be adjacent to a surface being scanned.

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