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Method for testing semiconductor memory devices, and apparatus and system for testing semiconductor memory devices

  • US 6,518,073 B2
  • Filed: 12/10/2001
  • Issued: 02/11/2003
  • Est. Priority Date: 01/25/1996
  • Status: Expired due to Fees
First Claim
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1. A method for testing a semiconductor device, comprising:

  • executing a first function test which detects an abnormal portion of a memory cell array of the semiconductor device;

    executing a DC characteristic test which detects a DC characteristic of the semiconductor device, and executing a second function test different from the first function test;

    checking a location of the abnormal portion of the memory cell array, based on abnormal portion with a spare portion, said arithmetic operation being performed in parallel to both the DC characteristic test and the second function test; and

    executing a remedy process to program replacing data based on results of the arithmetic operation in a redundancy circuit of the semiconductor device.

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