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Electrical property enhanced tomography (EPET) apparatus and method

  • US 6,522,910 B1
  • Filed: 03/08/2000
  • Issued: 02/18/2003
  • Est. Priority Date: 09/11/1997
  • Status: Expired due to Term
First Claim
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1. A method for providing enhanced information of the electrical properties of a sample measured with a tomographic device and an electrical property enhanced tomography (EPET) apparatus, comprising the steps of:

  • (a) generating an electromagnetic field in a sample holder by applying frequency dependent voltages of predetermined amplitude to an array of sensors that form a surface to be placed in electrical connection with the sample, such that time dependent net total electric charges are produced on the surface of the sample holder;

    (b) determining the time dependent net total electric charges on the surface of the sample holder, wherein the sample holder is filled with a matching medium and the sample is not in the sample holder, thereby generating empty data values;

    (c) inserting the sample into the sample holder wherein the matching medium is disposed between the sample and the sample holder to provide electrical connection between the sample and the sensors;

    (d) inputting initial image data of the sample from the tomographic device;

    (e) determining the time dependent net total electric charges on the surface of the sample holder when the sample is within the sample holder, thereby generating full data values;

    (f) generating from said empty data values, said initial image data and said full data values enhanced information on the electrical properties of the sample; and

    (g) outputting said enhanced information.

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