Method for locating faulty elements in an integrated circuit
First Claim
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1. Process for locating a defective element in an integrated circuit whose theoretical layout is known, of the type comprising a succession of steps consisting in:
- the determination of a measurement point of the integrated circuit; and
the testing of the measurement point determined by implementing;
the application of a sequence of tests to the inputs of the integrated circuit;
the measurement of signals at the determined measurement point of the integrated circuit, during the application of the sequence of tests; and
the assessment of the measurement point by comparison of the measured signals with theoretical signals which ought to be obtained at the determined measurement point so as to assess whether the measurement point is faulty or satisfactory; and
in which the position of the defective element of the integrated circuit is determined from assessments performed at the various determined measurement points,characterized in that it comprises initially;
a step of modelling the theoretical layout of the integrated circuit, in the form of at least one graph comprising a set of nodes and of arcs oriented from the inputs of the circuit to the outputs of the circuit;
considering as a search subgraph, a subgraph whose vertex-forming node corresponds to a faulty measurement point;
and in that, for the search for the defective element, it comprises the steps of;
assigning each node of the search subgraph considered a characteristic variable dependent on the structure of the search subgraph;
considering as measurement point the measurement point corresponding to a node of the subgraph considered, obtained by applying a predetermined criterion pertaining to the characteristic variables of the set of nodes of the search subgraph considered;
performing a test of the measurement point considered;
considering as new search subgraph;
either the search subgraph previously considered, while excluding the node corresponding to the measurement point tested and all its parent nodes, if the measurement point is satisfactory or a subgraph whose node corresponding to the measurement point is the vertex, if the measurement point is faulty; and
searching for the defective element in the new search subgraph considered, until a predetermined stopping criterion is satisfied.
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Abstract
A process for locating defective elements in an integrated circuit. The integrated circuit is modelled in the form of a tree formed of nodes and oriented arcs. Measurements are performed at various nodes of the circuit by applying a sequence of tests at the input of the circuit. The nodes to be tested are determined recursively as a function of the result of the tests previously performed. Each new test node is such that the number of its ancestors is substantially equal to the number of its descendants.
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Citations
9 Claims
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1. Process for locating a defective element in an integrated circuit whose theoretical layout is known, of the type comprising a succession of steps consisting in:
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the determination of a measurement point of the integrated circuit; and
the testing of the measurement point determined by implementing;
the application of a sequence of tests to the inputs of the integrated circuit;
the measurement of signals at the determined measurement point of the integrated circuit, during the application of the sequence of tests; and
the assessment of the measurement point by comparison of the measured signals with theoretical signals which ought to be obtained at the determined measurement point so as to assess whether the measurement point is faulty or satisfactory; and
in which the position of the defective element of the integrated circuit is determined from assessments performed at the various determined measurement points, characterized in that it comprises initially;
a step of modelling the theoretical layout of the integrated circuit, in the form of at least one graph comprising a set of nodes and of arcs oriented from the inputs of the circuit to the outputs of the circuit;
considering as a search subgraph, a subgraph whose vertex-forming node corresponds to a faulty measurement point;
and in that, for the search for the defective element, it comprises the steps of; assigning each node of the search subgraph considered a characteristic variable dependent on the structure of the search subgraph;
considering as measurement point the measurement point corresponding to a node of the subgraph considered, obtained by applying a predetermined criterion pertaining to the characteristic variables of the set of nodes of the search subgraph considered;
performing a test of the measurement point considered;
considering as new search subgraph;
either the search subgraph previously considered, while excluding the node corresponding to the measurement point tested and all its parent nodes, if the measurement point is satisfactory or a subgraph whose node corresponding to the measurement point is the vertex, if the measurement point is faulty; and
searching for the defective element in the new search subgraph considered, until a predetermined stopping criterion is satisfied. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
evaluating in the or each last search subgraph whether, for each virtual node corresponding to a faulty measurement point, the twin node associated with the said virtual node is a node of the same subgraph also corresponding to a faulty measurement point; and
then considering the or each subgroup for which the condition is satisfied as corresponding to a part of the integrated circuit comprising at least one defective element.
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4. Locating process according to claim 2, characterized in that the said characteristic variable peculiar to each node is the number of ancestors of this node in the search subgraph considered.
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5. Locating process according to claim 4, characterized in that the said predetermined criterion is suitable for determining the node whose number of ancestors is substantially equal to the mean number of ancestors per node in the search subtree considered.
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6. Locating process according to claim 1, characterized in that it comprises a step of assigning each node a compliance indicator initially fixed at a faulty state;
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in that, for the determination of the new search subgraph to be considered, it comprises the steps of;
fixing the compliance indicator of the node corresponding to the measurement point tested and of all its parent nodes at a satisfactory state, if the measurement point tested is satisfactory; and
considering as new search subgraph the subgraph included within the previous search subgraph and comprising only those nodes whose compliance indicator is fixed at the faulty state.
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7. Locating process according to claim 1, characterized in that the search subgraph initially considered is formed at the intersection of the subgraphs each having as vertex a node corresponding to a faulty output of the integrated circuit.
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8. Locating process according to claim 1, characterized in that the said characteristic variable peculiar to each node is the number of ancestors of this node in the search subgraph considered.
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9. Device for locating a defective element in an integrated circuit whose theoretical layout is known, of the type comprising means for performing a succession of steps consisting in:
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the determination of a measurement point of the integrated circuit; and
the testing of the measurement point determined by implementing;
the application of a sequence of tests to the inputs of the integrated circuit;
the measurement of signals at the determined measurement point of the integrated circuit, during the application of the sequence of tests; and
the assessment of the measurement point by comparison of the measured signals with theoretical signals which ought to be obtained at the determined measurement point so as to assess whether the measurement point is faulty or satisfactory; and
means for determining the position of the defective element of the integrated circuit from assessments performed at the various determined measurement points, characterized in that it comprises;
means for initial modelling of the theoretical layout of the integrated circuit, in the form of at least one graph comprising a set of nodes and of arcs oriented from the inputs of the circuit to the outputs of the circuit;
means for initially considering as a search subgraph a subgraph whose vertex-forming node corresponds to a faulty measurement point;
and in that, for searching for the defective element, it comprises means for; assigning each node of the search subgraph considered a characteristic variable dependent on the structure of the search subgraph;
considering as measurement point the measurement point corresponding to a node of the subgraph considered, obtained by applying a predetermined criterion pertaining to the characteristic variables of the set of nodes of the search subgraph considered;
performing a test of the measurement point considered;
considering as new search subgraph;
either the search subgraph previously considered, while excluding the node corresponding to the measurement point tested and all its parent nodes, if the measurement point is satisfactory or a subgraph whose node corresponding to the measurement point is the vertex, if the measurement point is faulty; and
searching for the defective element in the new search subgraph considered, until a predetermined stopping criterion is satisfied.
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Specification
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Current AssigneeCentre National D'Etudes Spatiales
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Original AssigneeCentre National D'Etudes Spatiales
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InventorsRolland, Guy, Desplats, Romain
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Primary Examiner(s)Thomas, Tom
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Assistant Examiner(s)Owens, Douglas W.
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Application NumberUS09/831,832Time in Patent Office651 DaysField of Search716/4, 716/5, 716/6US Class Current324/762.06CPC Class CodesG01R 31/318342 by preliminary fault modell...
