Multiple axis magnetic test for open integrated circuit pins

• US 6,529,019 B1
• Filed: 10/23/2000
• Issued: 03/04/2003
• Est. Priority Date: 10/23/2000
• Status: Expired due to Fees

• Current Assignee: Agilent Technologies Europe BV (Agilent Technologies, Inc.)
• Original Assignee: Agilent Technologies, Inc.
• Inventors: McDermid, John Elliott, Crook, David T, King, Philip N
• Primary Examiner(s): Nguyen, Vinh P.
• Application Number:
  US09/694,600
• Time in Patent Office: 862 Days
• Field of Search: 324/247, 324/263, 324/529, 324/750, 324/751, 324/538, 324/530, 324/512, 324/522, 324/765
• US Class Current: 324/754.29
• CPC Class Codes: G01R 31/2853 Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections G01R31/31717 takes precedence; test of chip-to-PCB or lead-to-PCB connections G01R31/66
• CPC Class Codes: G01R 31/52 Testing for short-circuits, leakage current or ground faults
• CPC Class Codes: G01R 31/54 Testing for continuity

Abstract

The present disclosure relates to a method and apparatus for determining the electrical continuity of an element of an electrical component, for example, a pin of a printed circuit assembly. The method comprises the steps of supplying an electrical stimulus to the element of the electrical component, positioning a sensor adjacent the element of the electrical component, the sensor having multiple axes along which the sensor is responsive to magnetic fields, receiving magnetic field signals created by the element of the electrical component with the sensor, producing electrical signals indicative of the magnetic field strength sensed by the sensor in multiple directions that correspond to the multiple axes, and comparing the electrical signals with predetermined limits associated with the element being tested. In a preferred arrangement, the sensor is provided with three axes which are oriented in orthogonal directions such that the magnetic signals from the element can be detected in three dimensional space.

Claims

1. An apparatus for testing the continuity between an element of an electrical component, the apparatus comprising:

a stimulus signal generator configured to provide an electrical stimulus to the element such that an electrical signal is driven across the element;

a first and second magnetic sensor oriented along a first axis and a second axis, respectively, wherein each are configured to sense a magnetic field produced by the element, wherein the magnetic fields induce an electrical signal on each magnetic sensor; and

a controller coupled to the sensors and configured to compare the induced electrical signals against reference signals to determine the integrity of the continuity of the element.

2. The apparatus of claim 1, wherein said first and second axes are substantially orthogonal to each other.

3. The apparatus of claim 1, wherein said first and second sensors comprise conductor windings.

4. The apparatus of claim 3, wherein said windings comprise traces on a multi-layer printed circuit board.

5. The apparatus of claim 1, wherein said first and second sensors comprise Hall effect sensors.

6. The apparatus of claim 1, wherein said first and second sensors comprise magneto resistive sensors.

7. The apparatus of claim 1, further comprising a third magnetic sensor oriented along a third axis, wherein said controller is coupled to each of said first, second, and third magnetic sensors.

8. The apparatus of claim 7, wherein said third sensor comprises a conductor winding.

9. The apparatus of claim 8, wherein said conductor winding of said third sensor comprises traces on a multi-layer printed circuit board.

10. The apparatus of claim 9, wherein said first and second sensors comprise Hall effect sensors.

11. The apparatus of claim 9, wherein said first and second sensors comprise magneto resistive sensors.

12. An apparatus for testing the continuity between an element of an electrical component, the apparatus comprising:

means for providing an electrical stimulus to the element such that an electrical signal is driven across the element;

first and second magnetic sensing means oriented along a first axis and a second axis, respectively, for sensing components of a magnetic field produced by the element, wherein the components of the magnetic fields induce an electrical signal on each of the magnetic sensing means; and

means for comparing the induced electrical signals against reference signals to determine the integrity of the continuity of the element.