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Circuit and method for varying a period of an internal control signal during a test mode

  • US 6,529,426 B1
  • Filed: 01/28/1997
  • Issued: 03/04/2003
  • Est. Priority Date: 02/14/1994
  • Status: Expired due to Term
First Claim
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1. A memory device for storing data, comprising:

  • an internal control circuit configured to generate an internal control signal having a first period during a normal operating mode and a second period during a test mode; and

    an internal test key circuit in electrical communication with said internal control circuit, said internal test key circuit configured to provide a test key signal, having a first state and a second state, to said internal control circuit, said internal control circuit configured to respond to said first state of said test key signal to generate said second period of said internal control signal, wherein said first and second periods are different.

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