Method and apparatus for determining a material of a detected item

• US 6,532,276 B1
• Filed: 01/17/2002
• Issued: 03/11/2003
• Est. Priority Date: 11/13/1999
• Status: Expired due to Term

• Current Assignee: Smiths Heimann GmbH
• Original Assignee: Heimann Systems GmbH
• Inventors: Hartick, Martin, Cordes, Frank
• Primary Examiner(s): Kim, Robert H.
• Assistant Examiner(s): Song, Hoon K.
• Application Number:
  US10/046,777
• Time in Patent Office: 418 Days
• Field of Search: 378/57, 378/53, 378/88, 378/90, 378/149
• US Class Current: 378/88
• CPC Class Codes: G01N 23/20 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
• CPC Class Codes: G01V 5/22 Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
• CPC Class Codes: G01V 5/222 measuring scattered radiation
• CPC Class Codes: G01V 5/224 Multiple energy techniques using one type of radiation, e.g. X-rays of different energies
• CPC Class Codes: G21K 5/04 with beam-forming means

Abstract

A method for determining the material of a detected item in objects, especially explosives in luggage, using X-ray diffraction. In this method, wherein scatter radiation deflected at the crystal-lattice structure of the material is measured and compared to characteristic energy spectra or diffraction spectra of various explosives, the absorption by the material influences the X-ray diffraction spectrum, so that information is missing, and inaccurate conclusions may be drawn regarding the material. To improve this method, the primary beam of an X-ray source is used for measuring the absorption. The beam passes through the material, and, from the absorption, an average atomic number of the material is determined, and this additional information is used for the identification of material known by comparing the recorded spectra with diffraction spectra. For this purpose, a collimation/detector arrangement preferably has only one collimator (8) and one detector (9), with the collimator (8) having a conically-expanding circular slot (1), which defines a predetermined diffraction angle, and a central blind bore (1) opening toward the x-ray source. First and second detectors (13, 14) are disposed in the bore to detect lower and higher x-ray energy, respectively.

Claims

1. A method for determining a material of a detected item in an object comprising:

irradiating the material with a primary X-ray beam;

measuring a diffraction spectrum of the material, with the spectrum comprising X-rays of the primary beam diffracted at the material;

measuring an X-ray absorption of the material and an average atomic number of the material by measuring X-rays of the primary beam transmitted through the material;

determining the average atomic number of the material from the measured absorption;

comparing the measured diffraction spectrum and determined average atomic number of the material to known diffraction spectra and known average atomic numbers of known materials.

2. The method according to claim 1, wherein the average atomic number is determined by a multi-energy method.

3. The method according to claim 1, wherein the comparing step comprises comparing the measured diffraction spectrum only with the known diffraction spectra of known materials having an average atomic number approximately the same as the determined average atomic number.

4. The method according to claim 1, wherein the comparing step comprises comparing the measured diffraction spectrum with known diffraction spectra only within energy ranges not substantially absorbed by the material.

5. The method according to claim 1, wherein the object is luggage.

6. An apparatus for determining a material of a detected item in an object comprising a diffraction apparatus and a computer connected thereto, and wherein

said diffraction apparatus comprises an x-ray source for producing a primary x-ray beam and a collimator/detector arrangement positioned to receive the primary x-ray beam after passing through an object and including a detector and a collimator;

said detector comprises an X-ray detector positioned downstream of the collimator and having an x-ray sensitive surface oriented toward the collimator;

said collimator has a central, blind-bore closed at the end facing the detector and at least one conically expanding circular slot that defines a predetermined angle and is oriented toward said X-ray sensitive surface of the detector; and

first and second spaced detection devices mounted within the blind bore and connected to the computer, with said first and second detection devices detecting relatively lower and relatively higher energy X-rays, respectively, and being spaced in the central opening such that the second detection device located behind the first detection device.

7. The apparatus according to claim 6, wherein the collimator/detector arrangement is oriented toward the primary beam of the X-ray source, and is alignable such that the primary beam passes into the central opening.

8. The apparatus according to claim 6, wherein the X-ray source is laterally adjustable, and the collimator/detector arrangement is adjustable in height relative to the X-ray source and adjustable laterally in synchronization with lateral adjustments of the X-ray source.