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Parameter variation probing technique

  • US 6,535,013 B2
  • Filed: 12/28/2000
  • Issued: 03/18/2003
  • Est. Priority Date: 12/28/2000
  • Status: Expired due to Fees
First Claim
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1. An apparatus for probing parameter variations in an integrated circuit chip comprising:

  • a plurality of ring oscillators disposed over the integrated circuit chip, each oscillator, when enabled, producing an output representative of an integrated circuit chip parameter or group of parameters;

    a controller connected to the plurality of ring oscillators to selectively enable one of the plurality of ring oscillators;

    at least one daisy-chain output line having a path thereof disposed over the integrated circuit chip; and

    a plurality of gating-devices to connect ones of the plurality of ring oscillators to the at least one daisy-chain output line at differing locations along the path thereof to daisy-chain the outputs from the plurality of ring oscillators, to provide an output thereof on the at least one daisy-chain output line.

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