Method for localizing and isolating an errant process step
First Claim
1. A method for localizing and isolating an errant process step in multi-step processes, comprising the steps of:
- retrieving from a defect image database a selection of images, each said image having image content similar to image content extracted from a query image depicting a defect, each said image in said selection having corresponding defect characterization data; and
directly deriving from said defect characterization data a conditional probability distribution of said defect having occurred in at least one process step;
wherein a particular process step from said process steps can be identified as a highest probable source of said defect based on said conditional probability distribution.
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Accused Products
Abstract
A method for localizing and isolating an errant process includes the steps of retrieving from a defect image database a selection of images each image having image content similar to image content extracted from a query image depicting a defect, each image in the selection having corresponding defect characterization data. A conditional probability distribution of the defect having occurred in a particular process step is derived from the defect characterization data. A process step as a highest probable source of the defect according to the derived conditional probability distribution is then identified. A method for process step defect identification includes the steps of characterizing anomalies in a product, the anomalies detected by an imaging system. A query image of a product defect is then acquired. A particular characterized anomaly is then correlated with the query image. An errant process step is then associated with the correlated image.
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Citations
10 Claims
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1. A method for localizing and isolating an errant process step in multi-step processes, comprising the steps of:
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retrieving from a defect image database a selection of images, each said image having image content similar to image content extracted from a query image depicting a defect, each said image in said selection having corresponding defect characterization data; and
directly deriving from said defect characterization data a conditional probability distribution of said defect having occurred in at least one process step;
wherein a particular process step from said process steps can be identified as a highest probable source of said defect based on said conditional probability distribution.- View Dependent Claims (2, 3, 4)
providing to a content-based image retrieval engine, a query image depicting a defect;
retrieving from said content-based image retrieval engine, a selection of images, each said image having image content similar to image content extracted from said query image; and
,ranking said selection of images according to a similarity metric.
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3. The method according to claim 1, wherein the deriving step comprises the steps of:
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calculating a process step conditional probability distribution from said defect characterization data;
calculating a defect class conditional probability distribution from said defect characterization data;
selecting a process step included in said process step conditional probability distribution having a highest probability;
selecting a defect class included in said defect class conditional probability distribution having a highest probability; and
,merging said selected process step with said selected defect class to produce a probable source process step of said defect.
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4. The method according to claim 1, wherein the identifying step comprises the steps of:
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ordering a ranked list of probable source process steps of said defect; and
,reporting to a user said ranked list, whereby said ranked list localizes and isolates a probable source process step of said defect.
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5. A method for process step defect identification comprising the steps of:
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characterizing anomalies in a product said anomalies detected by a content-based imaging system, wherein the characterizing step comprises the steps of detecting a product anomaly passing within imaging range of a computer vision system;
forming an image of said product anomaly;
assigning defect characterization data to said formed image; and
, storing said formed image and said assigned image defect characterization in a defect characterization database, whereby each formed image and assigned image defect characterization in said defect characterization database can be retrieved for subsequent comparison to a query image depicting a product anomaly;
acquiring a query image of a product defect;
correlating a particular characterized anomaly with said query image, wherein the correlating step comprises the steps of retrieving from said defect characterization database, a selection of images, each image having image content similar to image content extracted from said query image;
ranking said selection of images according to a similarity metric wherein the ranking step comprises the steps of;
retrieving from said defect characterization database, defect characterization data corresponding to said selection of images;
deriving from said defect characterization data a conditional probability distribution of said defect having occurred in a particular process step; and
, identifying a process step as a highest probable source of said defect according to said derived conditional probability distribution, and,identifying an errant process step associated with said correlated image. - View Dependent Claims (6)
calculating a process step conditional probability distribution from said defect characterization data;
calculating a defect class conditional probability distribution from said defect characterization data;
selecting a process step included in said process step conditional probability distribution having a highest probability;
selecting a defect class included in said defect class conditional probability distribution having a highest probability; and
,merging said selected process step with said selected defect class to produce a probable source process step of said defect.
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7. A computer apparatus programmed with a routine set of instructions stored in a fixed medium comprising:
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means for retrieving from a defect image database a selection of images, each image having image content similar to image content extracted from a query image depicting a defect, each said image in said selection having corresponding defect characterization data;
means for directly deriving from said defect characterization data a conditional probability distribution of said defect having occurred in at least one process step; and
,means for identifying a process step as a highest probable source of said defect based on said derived conditional probability distribution. - View Dependent Claims (8, 9, 10)
means for providing to a content-based image retrieval engine, a query image depicting a defect;
means for retrieving from said content-based image retrieval engine, a selection of images, each image having image content similar to image content extracted from said query image; and
,means for ranking said selection of images according to a similarity metric.
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9. The computer apparatus according to claim 7, wherein the deriving means comprises:
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means for calculating a process step conditional probability distribution from said defect characterization data;
means for calculating a defect class conditional probability distribution from said defect characterization data;
means for selecting a process step included in said process step conditional probability distribution having a highest probability;
means for selecting a defect class included in said defect class conditional probability distribution having a highest probability; and
,means for merging said selected process step with said selected defect class to produce a probable source process step of said defect.
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10. The computer apparatus according to claim 7, wherein the identifying means comprises:
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means for ordering a ranked list of probable source process steps of said defect; and
,means for reporting to a user said ranked list, whereby said ranked list localizes and isolates a probable source process step of said defect.
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Specification