Sensor array for rapid materials characterization
First Claim
1. An apparatus for characterizing a first material property of a first array of samples and a second material property of a second array of samples, comprising:
- a) a first array of 5 or more sensors wherein each sensor of said first array of 5 or more sensors is configured to be associated with at least one sample of said first array of samples;
b) a second array of 5 or more sensors interchangeable with said first array of 5 or more sensors wherein each sensor in said second array of 5 or more sensors is configured to be associated with at least one sample of said second array of samples;
c) electronic test circuitry interchangeably in electrical communication with said first array of 5 or more sensors and said second array of 5 or more sensors through at least one electrical interconnection device wherein said electronic test circuitry is configured for sending an output signal to said first array of samples and said second array of samples respectively through said first array of 5 or more sensors and said second array of 5 or more sensors and said electronic test circuitry is further configured for receiving input signals from said first array of samples and said second array of samples, wherein;
i) said first material property of said first array of samples is determined by comparing said output signals sent to said first array of 5 or more sensors with said input signals from said first array of samples; and
ii) said second material property of said second array of samples is determined by comparing said output signals sent to said second array of 5 or more sensors with said input signals from said second array of samples.
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Accused Products
Abstract
A sensor-array based materials characterization apparatus includes a sensor array disposed on a substrate; electronic test circuitry for sending and receiving electrical signals; electronic circuitry for routing signals between selected sensors and the electronic test circuitry; and a computer or processor. Preferably, all or part of the electronic test and signal routing circuitry is contained on the same substrate as the sensor array. Additional circuitry and a processor or computer may be physically separate from the substrate carrying the sensor array, and may be connected to the sensor array substrate. During use, multiple samples are applied to the multiple sensors in the array, and signals are sent to and received from selected sensors. Integration of the electronic test and signal routing circuitry onto the same substrate as the sensor array allows for a high density of sensors on a single substrate, permitting rapid analysis of combinatorial libraries.
137 Citations
17 Claims
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1. An apparatus for characterizing a first material property of a first array of samples and a second material property of a second array of samples, comprising:
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a) a first array of 5 or more sensors wherein each sensor of said first array of 5 or more sensors is configured to be associated with at least one sample of said first array of samples;
b) a second array of 5 or more sensors interchangeable with said first array of 5 or more sensors wherein each sensor in said second array of 5 or more sensors is configured to be associated with at least one sample of said second array of samples;
c) electronic test circuitry interchangeably in electrical communication with said first array of 5 or more sensors and said second array of 5 or more sensors through at least one electrical interconnection device wherein said electronic test circuitry is configured for sending an output signal to said first array of samples and said second array of samples respectively through said first array of 5 or more sensors and said second array of 5 or more sensors and said electronic test circuitry is further configured for receiving input signals from said first array of samples and said second array of samples, wherein;
i) said first material property of said first array of samples is determined by comparing said output signals sent to said first array of 5 or more sensors with said input signals from said first array of samples; and
ii) said second material property of said second array of samples is determined by comparing said output signals sent to said second array of 5 or more sensors with said input signals from said second array of samples. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17)
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Specification