Device in a process system for determining statistical parameter

• US 6,539,267 B1
• Filed: 05/04/2000
• Issued: 03/25/2003
• Est. Priority Date: 03/28/1996
• Status: Expired due to Term

• Current Assignee: Rosemount Incorporated (Emerson Electric Company)
• Original Assignee: Rosemount Incorporated (Emerson Electric Company)
• Inventors: Warrior, Jogesh, Eryurek, Evren
• Primary Examiner(s): PATEL, RAMESH B
• Application Number:
  US09/565,604
• Time in Patent Office: 1,055 Days
• Field of Search: 700/2-5, 700/11, 700/12, 700/19, 700/17, 700/282, 700/32, 700/48-51, 700/59, 700/129, 700/159, 710/11, 702/59, 702/33, 702/82-84, 702/183, 714/735, 162/198, 162/253, 162/263, 162/DIG.11, 162/DIG.6, 706/900, 706/52
• US Class Current: 700/51
• CPC Class Codes: G05B 13/0275 using fuzzy logic only
• CPC Class Codes: G05B 21/02 electric
• CPC Class Codes: G05B 23/0221 Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods
• CPC Class Codes: G05B 23/0278 Qualitative, e.g. if-then rules; Fuzzy logic; Lookup tables; Symptomatic search; FMEA

Abstract

A process device couples to a process control loop. The process device receives process signals. A memory in the process device contains a nominal parameter value and a rule. Computing circuitry calculates a statistical parameter of the process signal and operates on the statistical parameter and the stored nominal value based upon the stored rule and responsively provides an event output based upon the operation. Output circuitry provides an output in response to the event output. The statistical parameter can be used in statistical process control systems.

Claims

1. A process field device coupled to a process control loop, comprising:

a process variable input to provide a process variable related to a process;

computing circuitry configured to calculate a statistical parameter of the process variable; and

output circuitry configured to output the statistical parameter on the process control loop for use in a statistical process control system.

2. The apparatus of claim 1 wherein the process control loop is selected from the group consisting of two wire process control loops, three wire process control loops and four wire process control loops.

3. The apparatus of claim 1 wherein the process field device is completely powered with power received from the process control loop.

4. The apparatus of claim 1 wherein the statistical parameter is selected from the group consisting of standard deviation, mean, sample variance, root-mean-square (RMS), range, and rate of change.

5. The apparatus of claim 1 wherein the computing circuitry provides an event output based upon the statistical parameter.

6. The apparatus of claim 1 wherein the process variable input includes:

a sensor providing a sensor output related to the process; and

an analog to digital converter which converts the sensor output into a digitized process variable.

7. The apparatus of claim 6 wherein the sensor is selected from the group consisting of pressure, temperature, pH, flow, turbidity, level, position, conductivity, motor current, motor back emf and vibration sensors.

8. The apparatus of claim 1 including an inference engine configured to perform diagnostics on the process control loop.

9. The apparatus of claim 1 wherein the computing circuitry monitors the statistical parameter during normal operation of the process control loop and thereby generates the trained value.

10. The apparatus of claim 1 wherein the process field device comprises a transmitter.

11. A method performed in a process field device for a statistical process control system, comprising:

obtaining a process variable related to a process;

calculating a statistical parameter of the process variable;

outputting the statistical parameter on a process control loop for use in statistical process control.

12. The method of claim 11 including calculating a statistical parameter of the process variable during normal operation and storing the statistical parameter in memory as a trained value.

13. The method of claim 11 wherein the statistical parameter is selected from the group consisting of standard deviation, mean, sample variance, root-mean-square (RMS), range, and rate of change.

14. The method of claim 11 including completely powering the process field device with power received from the process control loop.

15. The method of claim 11 wherein the process control loop is selected from the group consisting of two wire process control loops, three wire process control loops and four wire process control loops.

16. The method of claim 11 wherein the process variable is selected from the group of process variables consisting of pressure, temperature, pH, flow, turbidity, level, position, conductivity, motor current, motor back emf and vibration sensors.