Measuring device using an indirect measurement of permittivity

• US 6,545,603 B1
• Filed: 04/23/2001
• Issued: 04/08/2003
• Est. Priority Date: 10/23/1998
• Status: Expired due to Fees

• Current Assignee: Claude Launay, Daniel Le Reste, Pascal Jordana, William Panciroli
• Original Assignee: Claude Launay, Daniel Le Reste, Pascal Jordana, William Panciroli
• Inventors: Launay, Claude, Jordana, Pascal, Le Reste, Daniel, Panciroli, William
• Primary Examiner(s): Wu, Daniel J.
• Assistant Examiner(s): TANG, SON M
• Application Number:
  US09/830,318
• Time in Patent Office: 715 Days
• Field of Search: 340/540, 340/620, 340/562, 340/603, 340/606, 340/612, 340/618, 737/18, 733/04.C, 733/61, 324/76.6, 324/76.7
• US Class Current: 340/540
• CPC Class Codes: G01D 5/2405 by varying dielectric
• CPC Class Codes: G01F 23/266 measuring circuits therefor

Abstract

Measuring device is presented employing indirect measurement of permittivity and including two electrically conductive bodies respectively constituting a measuring probe and a reference probe, electrical power supply means adapted to deliver a DC electrical voltage of controlled amplitude, an integrator stage including a capacitor switching system and control means adapted to define a cyclic series of two sequences at a controlled frequency.

Claims

1. Measuring device employing indirect measurement of permittivity and including two electrically conductive bodies respectively constituting a measuring probe (100) and a reference probe (200), electrical power supply means (300) adapted to deliver a DC electrical voltage of controlled amplitude, an integrator stage (500) including a capacitor switching system (530) and control means (400) adapted to define a cyclic series of two sequences at a controlled frequency, namely a first sequence (T1) during which the electrical power supply means (300) are connected to the measuring probe (100) to apply an electric field between the measuring probe (100) and the reference probe (200) and accumulate electrical charge on the measuring probe (100) and a second sequence (T2) during which the electrical power supply means (300) are disconnected from the measuring probe (100) which is connected to a summation point of the integrator stage (500) to transfer its charge into the integrator stage (500) and obtain at the output thereof a signal representative of the permittivity between the measuring probe (100) and the reference probe (200), characterized in that the integrator stage (500) includes an operational amplifier (510), a first integrator capacitor (520) constituting a feedback capacitor of said amplifier (510) and a second capacitor (530) switched between the output and the input of the operational amplifier (510) at the timing rate of the sequences (T1, T2) controlled by the control means (400), so that under steady state conditions there is obtained at the output of the operational amplifier (510) an “

equilibrium”

voltage V_S equal to −

E·

Cs/C530 where −

E is the amplitude of the voltage at the terminals of the electrical power supply means (300), Cs is value of the capacitor defined between the measuring probe (100) and the reference probe and C530 is the value of the second switched capacitor (530).

2. Device according to claim 1 characterized in that the switched capacitor (530) has a capacitance of the same order of magnitude as the capacitance between the measuring probe (100) and the reference probe (200).

3. Device according to claim 1 characterized in that the integrator capacitor (520) is connected between the inverting input and the output of the operational amplifier (510).

4. Device according to claim 1 characterized in that the switched capacitor (530) is connected to the output of the operational amplifier (510) during the sequences (T1) of supply of power to the measuring probe (100) and to the input of the operational amplifier (510) during the sequences (T2) of connection of the measuring probe (100) to the input of that amplifier (510).

5. Device according to claim 1 characterized in that the switched capacitor (530) is switched simultaneously with the measuring probe (100).

6. Device according to claim 1 characterized in that it includes means for applying a null average voltage to the measuring probe (100).

7. Device according to claim 6 characterized in that the operational amplifier (510) receives on a second input opposite that adapted to be connected sequentially to the measuring probe (100) a voltage (+E) of opposite sign to the voltage (−

E) applied by the power supply means to the measuring probe.

8. Device according to claim 7 characterized in that the absolute value of voltage (+E2) applied to the second input of the operational amplifier (510) is equal to p times the amplitude of the supply voltage (−

E1) delivered by the power supply means (300) to the measuring probe (100).

9. Device according to claim 1 characterized in that the control means (400) are adapted to define a duty factor of 50%, i.e., two successive sequences (T1, T2) of the same duration.

10. Device according to claim 1 characterized in that the control means (400) are adapted to apply a stepped voltage to the measuring probe (100).

11. Device according to claim 1 characterized in that the control means define sequence cycles (T1 and T2) at a frequency from 5 to 50 kHz.

12. Device according to claim 1 characterized in that the capacitor (520) constituting a feedback capacitor of the operational amplifier (510) has a capacitance at least 1000 times that of the switching capacitor (530).

13. Device according to claim 1 characterized in that the integrator st age is connected to the input of a processing stage (600) including zero adjustment means (610, 612, 614).

14. Device according to claim 1 characterized in that the integrator stage (500) is connected to a processing stage (600) including full scale deflection adjustment means (606).

15. Device according to claim 1 characterized in that it further includes at least one auxiliary measuring probe (150) used to determine the permittivity of the environment of the measuring and reference probes (100, 200) and to apply a correction to the processing of the signal.

16. Device according to claim 15 characterized in that the auxiliary measuring probe (150) is near the bottom of a tank.

17. Device according to claim 15 characterized in that the correction means (150, 480) are adapted to modify the gain of a control stage (660).

18. Device according to claim 1 characterized in that it further include a temperature probe adapted to measure the temperature of the environment of the measuring probe (100) and the reference probe (200).

19. Device according to claim 1 characterized in that the correction means (150, 480) are adapted to apply compensation to the voltage applied by the power supply means (300) to the measuring probe (100).

20. Device according to claim 1 characterized in that the correction means (150, 480) are adapted to generate a correction voltage applied to the input of the integrator stage (500).

21. Device according to claim 1 characterized in that it includes means for compensating an initial offset voltage of the integrator stage (500).

22. Device according to claim 21 characterized in that the offset voltage compensating means include an amplifier downstream of the capacitor switching system (600) adapted to apply a voltage of opposite sign to the field applied to the summation point of the integrator stage (500).

23. Device according to claim 21 characterized in that the offset compensating means include means adapted to apply a voltage of opposite sign to the applied field synchronously to the summation point of the capacitor switching amplifier (600) during counting of charges.

24. Device according to claim 1 characterized in that it further includes means for generating a signal representative of the spectrum of the medium surrounding the measuring probe (100).

25. Device according to claim 24 characterized in that the spectrum analyser means include Fourier transform calculating means and means for comparing the spectra obtained with digital spectra stored in a database.

26. Device according to claim 24 characterized in that the spectrum analyser means include a shaping stage (710), a high-gain high-pass stage (712), a synchronous detector (714), an integrator (716) and a calculation stage (720).

27. Device according to claim 1 characterized in that it includes two electrically conductive bodies (100, 200) respectively forming a measuring probe and a reference probe at distances from 1 to 10 cm, preferably of the order of 5 cm.

28. Device according to claim 1 characterized in that the measuring probe (100) and/or the reference probe (200) has an electrically insulative coating sealed against the medium surrounding the probe.

30. Device according to claim 1 characterized in that it is adapted to implement a function chosen from the group comprising measuring a level, discriminating products or detecting presence or intrusion.

31. Device according to claim 1 characterized in that it includes a plurality of measuring probes (100) connected to respective integrator stages (500).

32. Device according to claim 1 characterized in that it includes a plurality of measuring probes (100) connected to a common integrator .stage (500) via a multiplexer.

33. Device according to claim 1 characterized in that in constitutes a level measuring device.

34. Device according to claim 33 characterized in that the measuring probe (100) is generally vertical in a tank (10) and the integrator stage (500) is connected to processing means (600) adapted to generate a signal representative of the level of fluid in the tank (10).

35. Device according to claim 33 characterized in that the measuring probe (100) is formed by an electrically conductive area in a tank (10) at a height corresponding to a scanning level.

36. Device according to claim 33 characterized in that it includes a plurality of measuring probes (100) at respective discrimination levels in a tank (10).

37. Device according to claim 33 characterized in that the fluid to be detected is electrically conductive and the measuring probe (100) and/or the reference probe (200) has an electrically insulative coating.

38. Device according to claim 1 characterized in that the reference probe (200) is forced by the tank.

39. Device according to claim 1 characterized in that the reference probe (200) is an apertured member around the measuring probe (100).

40. Device according to claim 1 characterized in that it constitutes a device for discriminating a product flowing in a pipe (30) equipped with a measuring probe (100) and a reference probe (200).

41. Device according to claim 1 characterized in that it includes a measuring probe (100) and a reference probe (200) which run along an area under surveillance to form an intruder detector device.

42. Device according to claim 1 characterized in that it includes a plurality of pairs of measuring electrodes (100) and reference electrodes (200) arranged on a seat to detect the presence and/or the position of a user.

43. Device according to claim 1 characterized in that it includes a measuring sensor (100) and a reference sensor (200) running along a wall of a doorway (60) to form a passage detector.

44. Device according to claims 1 characterized in that it includes a measuring probe (100) and a reference probe (200) placed at the side of a conveyor belt to detect the passage of objects.

45. Device according to claim 1 characterized in that it includes a plurality of pairs of measuring probes (100) and reference probes (200) forming a tactile keypad.

46. Device according to claim 1 characterized in that the measuring probe (100) or the reference probe (200) is placed on a deformable member (88) to form a pressure sensor.

47. Device according to claim 1 characterized in that the measuring probe (100) and the reference probe (200) are placed on two areas of a tyre which can move relative to each other as a function of the inflation of said tyre to form a tyre inflation sensor.

29. Device according to clam 1 characterized in that at least some sections of the connecting means (20, 22) connecting the measuring probe (100) are neutralized by an electrically conductive materials sheath at the same potential as the reference probe (200).