Optical recording medium
First Claim
1. An optical recording medium comprising:
- a substrate having ridge-and-furrow groove tracks on one major surface thereof; and
a first dielectric film, phase change versatile recording film, second dielectric film and reflection film that are sequentially stacked on the one major surface of said substrate, said phase change versatile recording film being made of a GeInSbTe alloy material, and said reflection film being made of an AgPdCu alloy material, in said GeInSbTe alloy material forming said phase change versatile recording film, content of Ge being in the range from 1 weight % to 6 weight %, content of In being in the range from 2 weight % to 6 weight %, and ratio of Sb relative to Te being in the range of 2.2 times to 3.0 times, and in said AgPdCu alloy material forming said reflection film, content of Pd being in the range of 0.9 weight % to 1.5 weight %, and content of Cu being in the range of 0.9 weight % to 1.1 weight %, depth of the furrow on said groove tracks being in the range from 40 nm to 50 nm, and distance between two adjacent boundaries at opposite sides of said furrow being in the range of 0.40 μ
m to 0.65 μ
m, thickness of said first dielectric film being in the range of 75 nm to 95 nm, thickness of said phase change versatile recording film being in the range of 12 nm to 18 nm, thickness of said second dielectric film being in the range of 20 nm to 28 nm, and thickness of said reflection film being in-the range of 60 nm to 140 nm.
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Abstract
In order to ensure CAV recording/reproduction while preventing jitter deterioration and modulation decrease and thereby ensuring sufficient recording properties, even at a linear velocity higher than 4.8 m/s, a first dielectric film, phase change versatile recording film, second dielectric film, reflection film and protective film are formed on a disc substrate having formed lands and grooves on one major surface. The recording film is made of a GeInSbTe alloy, and the reflection film is made of an AgPdCu alloy or AlCu alloy. Composition of the GeInSbTe alloy is adjusted to contain Ge in the range of 1 to 6 wt %, In in the range of 2 to 6 wt %, and control Sb/Te in the range of 2.2 to 3.0. Composition of the AgPdCu alloy is adjusted to contain Cu not more than 1.5 wt %. Regarding groove conditions, groove depth is controlled in the range of 40 to 50 nm, groove width in the range of 0.40 to 0.65 μm, thickness of the first dielectric film in the range of 75 to 95 nm, thickness of the recording film in the range of 12 to 18 nm, thickness of the second dielectric film in the range of 20 to 28 nm, and thickness of the reflection film in the range of 60 to 140 nm.
2 Citations
12 Claims
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1. An optical recording medium comprising:
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a substrate having ridge-and-furrow groove tracks on one major surface thereof; and
a first dielectric film, phase change versatile recording film, second dielectric film and reflection film that are sequentially stacked on the one major surface of said substrate, said phase change versatile recording film being made of a GeInSbTe alloy material, and said reflection film being made of an AgPdCu alloy material, in said GeInSbTe alloy material forming said phase change versatile recording film, content of Ge being in the range from 1 weight % to 6 weight %, content of In being in the range from 2 weight % to 6 weight %, and ratio of Sb relative to Te being in the range of 2.2 times to 3.0 times, and in said AgPdCu alloy material forming said reflection film, content of Pd being in the range of 0.9 weight % to 1.5 weight %, and content of Cu being in the range of 0.9 weight % to 1.1 weight %, depth of the furrow on said groove tracks being in the range from 40 nm to 50 nm, and distance between two adjacent boundaries at opposite sides of said furrow being in the range of 0.40 μ
m to 0.65 μ
m,thickness of said first dielectric film being in the range of 75 nm to 95 nm, thickness of said phase change versatile recording film being in the range of 12 nm to 18 nm, thickness of said second dielectric film being in the range of 20 nm to 28 nm, and thickness of said reflection film being in-the range of 60 nm to 140 nm. - View Dependent Claims (2, 3, 4, 5, 6)
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7. An optical recording medium comprising:
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a substrate having ridge-and-furrow groove tracks on one major surface thereof; and
a first dielectric film, phase change versatile recording film, second dielectric film and reflection film that are sequentially stacked on said one major surface of said substrate, said phase change versatile recording film being made of a GeInSbTe alloy material, and said reflection film being made of an AlCu alloy material, in said GeInSbTe alloy material forming said phase change versatile recording film, content of Ge being in the range from 1 weight % to 6 weight %, content of In being in the range from 2 weight % to 6 weight %, and ratio of Sb relative to Te being in the range of 2.2 times to 3.0 times, and in said AlCu alloy material forming said reflection film, content of Cu being not more than 1.5 weight %, depth of the furrow on said groove tracks being in the range from 40 nm to 50 nm, and distance between two adjacent boundaries at opposite sides of said furrow being in the range of 0.40 μ
m to 0.65 μ
m,thickness of said first dielectric film being in the range of 75 nm to 95 nm, thickness of said phase change versatile recording film being in the range of 12 nm to 18 nm, thickness of said second dielectric film being in the range of 20 nm to 28 nm, and thickness of said reflection film being in the range of 60 nm to 140 nm. - View Dependent Claims (8, 9, 10, 11, 12)
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Specification