Optical recording medium
First Claim
1. An optical recording medium having a substrate defining a corrugated and uneven groove track configuration on one major surface thereof;
- and a first dielectric film, a phase recording film, a second dielectric film and a reflection film which are sequentially stacked on said one major surface of said substrate, characterized in;
said phase recording film being made of a GeInSbTe alloy material, and said reflection film being made of a AgPdCu alloy material;
in said GeInSbTe alloy material forming said phase recording film, content of Ge being in the range from 1 weight % to 8 weight %, content of In being in the range from 2 weight % to 6 weight %, and ratio of Sb relative to Te being in the range of 2.2 times to 3.0 times, and in said AgPdCu alloy material forming said reflection film, content of Pd being in the range of 0.9 weight % to 1.5 weight %, and content of Cu being in the range of 0.9 weight % to 1.1 weight %, depth of each depression in said groove track configuration being in the range from 35 nm to 44 nm, distance between two adjacent boundaries at opposite sides of said depression among boundaries between crests and depressions being in the range of 0.35 μ
m to 0.50 μ
m, thickness of said first dielectric film being in the range of 75 nm to 95 nm, thickness of said phase recording film being in the range of 12 nm to 20 nm, thickness of said second dielectric film being in the range of 16 nm to 28 nm, and thickness of said reflection film being in the range of 80 nm to 160 nm.
1 Assignment
0 Petitions
Accused Products
Abstract
In order to increase the recording capacity while preventing jitter deterioration and a decrease of the modulation factor and thereby ensuring satisfactory recording characteristics, a first dielectric film, phase recording film, second dielectric film, reflection film and protective film are sequentially formed on a disc substrate having formed lands, grooves and wobbling on one major surface. The recording film is made of a GeInSbTe alloy, and the reflection film is made of an AgPdCu alloy or AlCu alloy. Composition of the GeInSbTe alloy is adjusted to contain Ge in the range of 1 to 8 wt %, In in the range of 2 to 6 wt %, and control Sb/Te in the range of 2.2 to 3.0. Composition of the AgPdCu alloy is adjusted to contain Pd in the range of 0.9 to 1.5 wt % and Cu not more than 1.5 wt %. Composition of the AlCu alloy is adjusted to contain Cu in the not more than 1.5 wt %. Groove depth is controlled in the range of 35 to 45 nm, groove width in the range of 0.35 to 0.50 μm, thickness of the first dielectric film in the range of 75 to 95 nm, thickness of the recording film in the range of 12 to 20 nm, thickness of the second dielectric film in the range of 16 to 28 nm, and thickness of the reflection film in the range of 80 to 160 nm.
5 Citations
12 Claims
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1. An optical recording medium having a substrate defining a corrugated and uneven groove track configuration on one major surface thereof;
- and a first dielectric film, a phase recording film, a second dielectric film and a reflection film which are sequentially stacked on said one major surface of said substrate, characterized in;
said phase recording film being made of a GeInSbTe alloy material, and said reflection film being made of a AgPdCu alloy material;
in said GeInSbTe alloy material forming said phase recording film, content of Ge being in the range from 1 weight % to 8 weight %, content of In being in the range from 2 weight % to 6 weight %, and ratio of Sb relative to Te being in the range of 2.2 times to 3.0 times, and in said AgPdCu alloy material forming said reflection film, content of Pd being in the range of 0.9 weight % to 1.5 weight %, and content of Cu being in the range of 0.9 weight % to 1.1 weight %, depth of each depression in said groove track configuration being in the range from 35 nm to 44 nm, distance between two adjacent boundaries at opposite sides of said depression among boundaries between crests and depressions being in the range of 0.35 μ
m to 0.50 μ
m,thickness of said first dielectric film being in the range of 75 nm to 95 nm, thickness of said phase recording film being in the range of 12 nm to 20 nm, thickness of said second dielectric film being in the range of 16 nm to 28 nm, and thickness of said reflection film being in the range of 80 nm to 160 nm. - View Dependent Claims (2, 3, 4, 5, 6)
- and a first dielectric film, a phase recording film, a second dielectric film and a reflection film which are sequentially stacked on said one major surface of said substrate, characterized in;
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7. An optical recording medium having a substrate defining a corrugated and uneven groove track configuration on one major surface thereof;
- and a first dielectric film, a phase recording film, a second dielectric film and a reflection film which are sequentially stacked on said one major surface of said substrate, characterized in;
said phase recording film being made of a GeInSbTe alloy material, and said reflection film being made of a AlCu alloy material;
in said GeInSbTe alloy material forming said phase recording film, content of Ge being in the range from 1 weight % to 8 weight %, content of In being in the range from 2 weight % to 6 weight %, and ratio of Sb relative to Te being in the range of 2.2 times to 3.0 times, and in said AlCu alloy material forming said reflection film, content of Cu being not larger than 1.5 weight %, depth of each depression in said groove track configuration being in the range from 35 nm to 44 nm, distance between two adjacent boundaries at opposite sides of said depression among boundaries between crests and depressions being in the range of 0.35 μ
m to 0.50 μ
m,thickness of said first dielectric film being in the range of 75 nm to 95 nm, thickness of said phase recording film being in the range of 12 nm to 20 nm, thickness of said second dielectric film being in the range of 16 nm to 28 nm, and thickness of said reflection film being in the range of 80 nm to 160 nm. - View Dependent Claims (8, 9, 10, 11, 12)
- and a first dielectric film, a phase recording film, a second dielectric film and a reflection film which are sequentially stacked on said one major surface of said substrate, characterized in;
Specification