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High speed and high accuracy DUT power supply with active boost circuitry

  • US 6,556,034 B1
  • Filed: 11/22/2000
  • Issued: 04/29/2003
  • Est. Priority Date: 11/22/2000
  • Status: Expired due to Term
First Claim
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1. A power supply for use with a semiconductor tester to power a device-under-test, said device under test disposed on a device board, said power supply including:

  • a high-accuracy DC supply circuit including respective force and sense lines, the DC supply circuit having a predetermined DC response time; and

    a high-speed AC supply circuit including an active boost circuit having respective boost and sense lines coupled to said force and sense lines, said active boost circuit operative to selectively cooperate with the high-accuracy DC supply circuit and, when said device-under-test demands a large dynamic current, provide said dynamic current until the DC supply circuit responds according to the predetermined DC response time.

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