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Efficient parallel testing of semiconductor devices using a known good device to generate expected responses

  • US 6,559,671 B2
  • Filed: 07/29/2002
  • Issued: 05/06/2003
  • Est. Priority Date: 03/01/1999
  • Status: Expired due to Fees
First Claim
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1. A method of testing a plurality of semiconductor devices, each corresponding to a reference device, said method comprising:

  • communicating to said reference device via a communication channel test data generated by a tester;

    communicating to said tester via said communication channel response data generated by said reference device in response to said test data;

    monitoring said communication channel;

    upon detecting communication of test data on said channel, writing said test data to each of said plurality of semiconductor devices;

    upon detecting communication of response data on said channel, reading corresponding response data from said plurality of semiconductor devices, and comparing said response data from said reference device with said corresponding response data read from said plurality of semiconductor devices.

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